Hot-carrier injections in SiO2

Microelectronics Reliability 1998 Vol. 38; Iss. 1

Hot-carrier injections in SiO2

D Vuillaume, A Bravaix, D Goguenheim
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Volume:
38
Year:
1998
Language:
english
Pages:
16
DOI:
10.1016/s0026-2714(97)00179-0
File:
PDF, 473 KB
english, 1998
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