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Dynamic analysis of qualitative circuits for failure mode and effects analysis : David R. Pugh and Neal Snooke. 1996 Proceedings of the Annual Reliability and Maintainability Symposium, 37 (1996)
Volume:
37
Year:
1997
Language:
english
Pages:
2
DOI:
10.1016/s0026-2714(97)87703-7
File:
PDF, 272 KB
english, 1997