Correlation of the decay of tunneling currents with trap generation inside thin oxides : N. A. Dumin, K. J. Dickerson, D. J. Dumin and B. T. Moore. Solid-State Electronics, 39 (5), 655 (1996)
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Volume:
37
Year:
1997
Language:
english
DOI:
10.1016/s0026-2714(97)87751-7
File:
PDF, 143 KB
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english, 1997
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