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Characterization of SILO in thin-oxides by using MOSFET substrate current
B. De Salvo, G. Ghibaudo, G. Pananakakis, F. MondonVolume:
38
Year:
1998
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(98)00085-7
File:
PDF, 303 KB
english, 1998