Lateral interface effect on pulsed DC electromigration...

Microelectronics Reliability 1998 Vol. 38; Iss. 6-8

Lateral interface effect on pulsed DC electromigration analysis

P. Waltz, L. Arnaud, G. Lormand, G. Tartavel
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Volume:
38
Year:
1998
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(98)00116-4
File:
PDF, 418 KB
english, 1998
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