Electrical parameters degradation law of MOSFET during...

Microelectronics Reliability 1998 Vol. 38; Iss. 6-8

Electrical parameters degradation law of MOSFET during ageing

Ch. Mourrain, Ch. Tourniol, M.J. Bouzid
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Volume:
38
Year:
1998
Language:
english
Pages:
5
DOI:
10.1016/s0026-2714(98)00139-5
File:
PDF, 346 KB
english, 1998
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