On positive charge annihilation and stress-induced leakage...

Microelectronics Reliability 1999 Vol. 39; Iss. 2

On positive charge annihilation and stress-induced leakage current decrease

A Meinertzhagen, C Petit, M Jourdain, F Mondon, D Gogenheim
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Volume:
39
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(98)00224-8
File:
PDF, 291 KB
english, 1999
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