Dielectric characterization of ferroelectric thin films deposited on silicon
C. Legrand, T. Haccart, G. Velu, D. Chambonnet, D. Remiens, L. Burgnies, F. Mehri, J.C. CarruVolume:
39
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(98)00238-8
File:
PDF, 423 KB
english, 1999