Reliability considerations of III-nitride microelectronic...

Microelectronics Reliability 1999 Vol. 39; Iss. 12

Reliability considerations of III-nitride microelectronic devices

Joachim Würfl, Vera Abrosimova, Jochen Hilsenbeck, Erich Nebauer, Walter Rieger, Günther Tränkle
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Volume:
39
Year:
1999
Language:
english
Pages:
21
DOI:
10.1016/s0026-2714(99)00181-x
File:
PDF, 308 KB
english, 1999
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