High-accuracy roundness measurement by a new error...

High-accuracy roundness measurement by a new error separation method

Wei Gao, Satoshi Kiyono, Takamitu Sugawara
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Volume:
21
Year:
1997
Language:
english
Pages:
11
DOI:
10.1016/s0141-6359(97)00081-0
File:
PDF, 795 KB
english, 1997
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