Volume 329; Issue 2-3

1

Editorial

Year:
1987
Language:
english
File:
PDF, 336 KB
english, 1987
6

SIMS analysis of poorly conducting surfaces

Year:
1987
Language:
english
File:
PDF, 397 KB
english, 1987
9

An ESCA study on the X-ray induced changes in polymeric materials

Year:
1987
Language:
english
File:
PDF, 342 KB
english, 1987
17

Untersuchungen innerer Grenzflächen mit elektronenspektroskopischen Methoden

Year:
1987
Language:
german
File:
PDF, 3.33 MB
german, 1987
22

Distribution analysis for materials research

Year:
1987
Language:
english
File:
PDF, 37 KB
english, 1987
24

SIMS-Analyse von optischen Fasern

Year:
1987
File:
PDF, 320 KB
1987
26

Application of SIMS in semiconductor research

Year:
1987
Language:
english
File:
PDF, 564 KB
english, 1987
27

Quantitative analysis of impurities in suicide layers with SIMS

Year:
1987
Language:
english
File:
PDF, 550 KB
english, 1987
28

SIMS analysis of isolated graphite probes exposed to a tokamak plasma

Year:
1987
Language:
english
File:
PDF, 646 KB
english, 1987
44

AES-Untersuchungen an erodierten Eisen-Chrom-PVD-Schichten

Year:
1987
Language:
german
File:
PDF, 703 KB
german, 1987
48

Strukturelle Aspekte bei Korngrenzensegregationsuntersuchungen

Year:
1987
Language:
german
File:
PDF, 80 KB
german, 1987
52

Oberflächensegregation auf Eiseneinkristallen

Year:
1987
Language:
german
File:
PDF, 117 KB
german, 1987
61

Oberflächenpräparation für die Si-Molekularstrahlepitaxie (MBE)

Year:
1987
Language:
german
File:
PDF, 104 KB
german, 1987
66

In-situ-Photoemission an PAH-beschichteten Aerosolen

Year:
1987
Language:
german
File:
PDF, 402 KB
german, 1987
67

Metallurgical applications of SIMS

Year:
1987
Language:
english
File:
PDF, 2.57 MB
english, 1987
70

Oberflächenanalytische Untersuchungen an Titanverklebungen

Year:
1987
Language:
german
File:
PDF, 322 KB
german, 1987
71

New equipment and chemicals

Year:
1987
Language:
german
File:
PDF, 801 KB
german, 1987