Volume 116; Issue 23

Journal of Applied Physics

Volume 116; Issue 23
1

Formation kinetics of copper-related light-induced degradation in crystalline silicon

Year:
2014
Language:
english
File:
PDF, 873 KB
english, 2014
4

A modification to the Sigmund model of ion sputtering

Year:
2014
Language:
english
File:
PDF, 472 KB
english, 2014
29

Interference-induced angle-independent acoustical transparency

Year:
2014
Language:
english
File:
PDF, 1.19 MB
english, 2014