Volume 92; Issue 12

Journal of Applied Physics

Volume 92; Issue 12
4

Structural properties of hydrogenated silicon nanocrystals and nanoclusters

Year:
2002
Language:
english
File:
PDF, 686 KB
english, 2002
13

Micron-scale buckling of SiO[sub 2] on Si

Year:
2002
Language:
english
File:
PDF, 789 KB
english, 2002
16

Viscosity of silica

Year:
2002
Language:
english
File:
PDF, 343 KB
english, 2002
18

Self-affine and mound roughness effects on the double-layer charge capacitance

Year:
2002
Language:
english
File:
PDF, 255 KB
english, 2002
21

Formation of misfit dislocations in thin film heterostructures

Year:
2002
Language:
english
File:
PDF, 504 KB
english, 2002
32

Field emission from an electron-beam irradiated C[sub 60] film

Year:
2002
Language:
english
File:
PDF, 290 KB
english, 2002
53

Annealing behavior of magnesium and aluminum implanted with iron ions

Year:
2002
Language:
english
File:
PDF, 478 KB
english, 2002
54

Sample-detector coupling in atomic resolution magnetic resonance diffraction

Year:
2002
Language:
english
File:
PDF, 639 KB
english, 2002
58

Carbon impurities in MgB[sub 2]

Year:
2002
Language:
english
File:
PDF, 274 KB
english, 2002
64

Analysis of integrated single-electron memory operation

Year:
2002
Language:
english
File:
PDF, 433 KB
english, 2002
72

Fermi-level pinning at the metal/p-type CuGaS[sub 2] interfaces

Year:
2002
Language:
english
File:
PDF, 454 KB
english, 2002
75

Modeling of direct wafer bonding: Effect of wafer bow and etch patterns

Year:
2002
Language:
english
File:
PDF, 610 KB
english, 2002
97

Growth of cubic-TaN thin films by plasma-enhanced atomic layer deposition

Year:
2002
Language:
english
File:
PDF, 321 KB
english, 2002
100

Metal–germanium–metal ultrafast infrared detectors

Year:
2002
Language:
english
File:
PDF, 716 KB
english, 2002
102

Approach to saturation in nanomagnetic systems

Year:
2002
Language:
english
File:
PDF, 294 KB
english, 2002