Volume 34; Issue 10A

Journal of Physics D Applied Physics

Volume 34; Issue 10A

1

X-ray studies on self-organized wires in SiGe/Si multilayers

Roch, T, Holý, V, Daniel, A, Höflinger, E, Meduna, M, Metzger, T H, Bauer, G, Zhu, J, Brunner, K, Abstreiter, G

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 568 KB

english, 2001

2

Triple-axis x-ray diffraction analyses of hen egg-white lysozyme crystals

Matyi, R J, Volz, H M

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 827 KB

english, 2001

3

Combined x-ray imaging and diffraction study of light-induced distortions in Fe:LiNbO 3

Chrysanthakopoulos, N, Calamiotou, M, Lorut, F, Baruchel, J

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 297 KB

english, 2001

4

Investigation of strain-modulated InGaAs nanostructures by grazing-incidence x-ray diffraction and photoluminescence

Zeimer, U, Grenzer, J, Pietsch, U, Gramlich, S, Bugge, F, Smirnitzki, V, Weyers, M, Tränkle, G

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 521 KB

english, 2001

5

Instrumental origin effects in triple-axis diffraction

Gartstein, E, Mandelbrot, M, Mogilyanski, D

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 155 KB

english, 2001

6

High-resolution x-ray diffraction strain-stress analysis of GaN/sapphire heterostructures

Harutyunyan, V S, Aivazyan, A P, Weber, E R, Kim, Y, Park, Y, Subramanya, S G

Journal:

Journal of Physics D Applied Physics

Year:

2001

File:

PDF, 933 KB

2001

7

High-resolution x-ray reflectivity study of thin layered Pt-electrodes for integrated ferroelectric devices

Aspelmeyer, M, Klemradt, U, Hartner, W, Bachhofer, H, Schindler, G

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 170 KB

english, 2001

8

Extended defects in GaN single crystals

Lefeld-Sosnowska, M, Frymark, I

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 172 KB

english, 2001

9

Characterization of synthetic diamond crystals by spatially resolved rocking curve measurements

Hoszowska, J, Freund, A K, Boller, E, Sellschop, J P F, Level, G, Härtwig, J, Burns, R C, Rebak, M, Baruchel, J

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 957 KB

english, 2001

10

New possibilities of synchrotron radiation diffraction topography for the investigation of `exotic' magnetic domains

Baruchel, J, Camargo, P C de, Klein, H, Mazzaro, I, Nogues, J, Oliveira, A de

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 125 KB

english, 2001

11

Structural transformations in low-temperature grown GaAs:Sb

Vasyukov, D A, Baidakova, M V, Chaldyshev, V V, Suvorova, A A, Preobrazhenskii, V V, Putyato, M A, Semyagin, B R

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 338 KB

english, 2001

12

Structural defects in SiC ingots investigated by synchrotron diffraction imaging

Pernot, E, Pernot-Rejmánková, P, Anikin, M, Pelissier, B, Moulin, C, Madar, R

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 274 KB

english, 2001

13

Calculation of two-dimensional maps of diffuse scattering by a real crystal with microdefects and comparison of results obtained from three-crystal diffractometry

Klad`ko, V P, Datsenko, L I, Bak-Misiuk, J, Olikhovskii, S I, Machulin, V F, Prokopenko, I V, Molodkin, V B, Maksimenko, Z V

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 222 KB

english, 2001

14

Determination of microdistortion components and their application to structural characterization of HVPE GaN epitaxial layers

Ratnikov, V V, Kyutt, R N, Shubina, T V, Paskova, T, Monemar, B

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 165 KB

english, 2001

15

Hierarchy of dynamical theories of x-ray diffraction for deformed and perfect crystals

Härtwig, Jürgen

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 132 KB

english, 2001

16

High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers

Fulthorpe, B D, Ryan, P A, Hase, T P A, Tanner, B K, Hickey, B J

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 190 KB

english, 2001

17

Dynamical diffraction imaging of voids in nearly perfect silicon

Tuomi, T, Rantamäki, R, McNally, P J, Lowney, D, Danilewsky, A N, Becker, P

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 85 KB

english, 2001

18

Structural and magnetic study of Co/Gd multilayers deposited on Si and Si-N substrates

Pelka, J B, Paszkowicz, W, Dlużewski, P, Dynowska, E, Wawro, A, Baczewski, L T, Kozlowski, M, Wisniewski, A, Seeck, O, Messoloras, S, Gamari-Seale, H

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 192 KB

english, 2001

19

The features of anomalous multiple x-ray transmission in Ge crystals with distortions

Fodchuk, I M, Raransky, M D, Borcha, M D, Gultay, L L, Tkach, O O

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 771 KB

english, 2001

20

The variation of quasicrystal defect contrast: how and why

Klein, H, Agliozzo, S, Mancini, L, Gastaldi, J, Härtwig, J, Baruchel, J

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 458 KB

english, 2001

21

Anomalous transmission of x-rays in quasicrystals

Härtwig, J, Agliozzo, S, Baruchel, J, Colella, R, Boissieu, M de, Gastaldi, J, Klein, H, Mancini, L, Wang, J

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 656 KB

english, 2001

22

Observation of dislocation generation in highly strained quantum well lasers during operation

Mazuelas, A, Dotor, M L, Golmayo, D, Zeimer, U, Baumbach, T, Luebbert, D, Grenzer, J, Baruchel, J

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 534 KB

english, 2001

23

Application of Bragg-case section topography for strain profile determination in A III B V implanted semiconductors

Wieteska, K, Wierzchowski, W, Graeff, W, Turos, A

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 271 KB

english, 2001

24

Construction of topography stations at SPring-8 and first observations

Chikaura, Y, Iida, S, Kawado, S, Mizuno, K, Kimura, S, Matsui, J, Umeno, M, Ozaki, T, Shimura, T, Suzuki, Y, Izumi, K, Kawasaki, K, Kajiwara, K, Ishikawa, T

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 143 KB

english, 2001

25

X-ray reflectivity from self-assembled structures in Ge/Si superlattices

Meduna, M, Holý, V, Roch, T, Bauer, G, Schmidt, O G, Eberl, K

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 352 KB

english, 2001

26

GID study of strains in Si due to patterned SiO 2

Daniel, A, Holý, V, Zhuang, Y, Roch, T, Grenzer, J, Bochnícek, Z, Bauer, G

Journal:

Journal of Physics D Applied Physics

Year:

2001

Language:

english

File:

PDF, 410 KB

english, 2001

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