Volume 17; Issue 3

Journal of Surface Analysis

Volume 17; Issue 3

1

45 Years in Monte Carlo Simulation for Microbeam Analysis

Shimizu, Ryuichi

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 1.20 MB

english, 2011

2

Results of Inter-laboratory Tests among SASJ on Accurate Mass Scale Calibration of ToF-SIMS

Abe, Yoshimi, Itoh, Hiroto, Otomo, Shinya

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 193 KB

english, 2011

3

Simulation Study of Electron Scattering in Crystalline Solid by Using Bohmian Quantum Trajectory Method

Zeng, R. G., Ding, Z. J.

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 836 KB

english, 2011

4

Band alignment and optical properties of (ZrO2)0.66(HfO2)0.34 gate dielectrics thin films on p-Si (100)

Shin, Hye Chung, Son, Lee Seul, Kim, Kyeom Ryong, Oh, Suhk Kun, Kang, Hee Jae, Tahir, Dahlang, Heo, Sung, Chung, Jae Gwan, Lee, Jae Cheol, Tougaard, Sven

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 376 KB

english, 2011

5

Evaluation of Focused Ion Beam for Shave-off Depth Profiling

Fujii, M., Imamura, T., Nojima, M., Owari, M.

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 726 KB

english, 2011

6

Development of Laser-Assisted Wide Angle 3D Atom Probe

Hanaoka, Yuya, Mayama, Norihito, Terakawa, Tetsuo, Yamamoto, Takuya, Kajiwara, Yasuko, Iwata, Tatsuo, Taniguchi, Masahiro, Owari, Masanori

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 1.07 MB

english, 2011

7

Analysis of the optical second harmonic generation from Pt nanowires on the faceted MgO(110) template

Ogata, Yoichi, Tuan, Nguyen Anh, Takase, Saho, Mizutani, Goro

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 514 KB

english, 2011

8

Quadrupole SIMS Analysis of Si Concentration in GaN Layers by a Molecular Ion Detection with a Minor Isotope

Ootomo, Shinya, Yoshikawa, Hirokazu, Maruya, Hiromichi

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 223 KB

english, 2011

9

Development of Si/SiO2 Multilayer Type AFM Tip Characterizers

Takenaka, Hisataka, Hatayama, Masatoshi, Ito, Hisashi, Ohchi, Tadayuki, Takano, Akio, Kurosawa, Satoru, Itoh, Hiroshi, Ichimura, Shingo

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 369 KB

english, 2011

10

Anode Effects in Electroplated Cu Film

Lee, Yong-Hyuk, Ju, Hyunjin, Rha, Sa-Kyun, Lee, Seung-Hee, Lee, Youn-Seoung

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 840 KB

english, 2011

11

Improvement and evaluation of the nano-beam SIMS control system

Imamura, T., Fujii, M., Nojima, M., Owari, M.

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 272 KB

english, 2011

12

Challenges of 3-D characterization of polymer-based drug delivery devices with cluster Secondary Ion Mass Spectrometry

Mahoney, Christine M., Fahey, Albert J., Belu, Anna M., Gardella Jr., Joseph A

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 422 KB

english, 2011

13

ToF-SIMS Imaging of Intracellular 39K/40Ca Changes induced by ZnO-containing Nanomaterials

Lee, Pei-Ling, Shen, Sin-Yu, Yin, Yu-Sheng, Lei, Shiu-Ling, Jhang, Cian-Ling, Lee, Woan-Ruoh, Ling, Yong-Chien

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 443 KB

english, 2011

14

Influence of CO2 and H2O on Air Oxidation of Mg Nanoparticles Studied by NEXAFS

Ogawa, S., Niwa, H., Nakanishi, K., Ohta, T., Yagi, S.

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 526 KB

english, 2011

15

Characterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass Spectrometry

Lim, Weon Cheol, Lee, Jihye, Lee, Yeonhee

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 259 KB

english, 2011

16

2D Visualization of Mannose Distribution Using AFM Force Sensing with Probe Modified by Concanavalin A

Inoue, Shigeto, Nakahara, Yoshio, Kado, Shinpei, Tanaka, Mutsuo, Kimura, Keiichi

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 290 KB

english, 2011

17

Three-Dimensional Analysis of Biological Samples using Dual FIB ToF-SIMS

Kim, Y., Morita, Y., Owari, M.

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 359 KB

english, 2011

18

Backscattered Electron Contrast Imaging of Scanning Electron Microscopy for Identifying Double Layered Nano-Scale Elements

Kim, Hyonchol, Negishi, Tsutomu, Kudo, Masato, Takei, Hiroyuki, Yasuda, Kenji

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 848 KB

english, 2011

19

Surface Sensitivity of Auger-Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Powell, C. J., Jablonski, A.

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 228 KB

english, 2011

20

Spectroscopic Study on the Adsorption Reaction of L-Cysteine on Cu nanoparticle/Ag under in vivo condition

Yamada, Y., Kutluk, G., Namatame, H., Taniguchi, M., Yagi, S.

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 475 KB

english, 2011

21

Analyzing TOF-SIMS spectra of biopolymer using multivariate curve resolution

Aoyagi, Satoka, Okamoto, Masayuki, Kato, Nobuhiko, Kudo, Masahiro

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 802 KB

english, 2011

22

Study of the field evaporation mechanism of laser-assisted atom probe

Terakawa, Tetsuo, Mayama, Norihito, Kajiwara, Yasuko, Owari, Masanori

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 677 KB

english, 2011

23

Properties of TaN Films for ULSIs Prepared by Reactive Sputter Deposition

Tajima, H., Shiobara, N., Katsumata, H., Uekusa, S.

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 1.11 MB

english, 2011

24

The Growth Mechanism of Al-doped ZnO using Oxygen Controlled Seed Layer in Si based Thin Film Solar Cells

Joo, Minho, Shin, Huiyoun, Lee, Jangho, Moon, Seungkyu, Moon, Taeho, Park, Kyuho

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 1017 KB

english, 2011

25

Chemical imaging of biomolecules in skin using TOF-SIMS and multivariate analysis

Aoyagi, Satoka, Matsuzaki, Takashi, Kato, Nobuhiko, Kudo, Masahiro

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 341 KB

english, 2011

26

Simulation of Fragmentation of Polyethylene Glycol by Quantum Molecular Dynamics for TOF-SIMS Spectral Analysis

Kato, N., Kudo, M.

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 534 KB

english, 2011

27

Fabrication of Rh Nanoparticle and Adsorption Reaction with DMS Studied by NEXAFS and XPS

Niwa, H., Ogawa, S., Nakanishi, K., Kutluk, G., Ohta, T., Yagi, S.

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 764 KB

english, 2011

28

Specimen preparation for three-dimensional atom probe using the focused ion-beam lift-out technique

Yamamoto, T., Hanaoka, Y., Mayama, N., Kaito, T., Adachi, T., Nojima, M., Owari, M.

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 432 KB

english, 2011

29

Surface Micro-XAFS and Its Application to Real-time Observation of Organic Thin Films

Baba, Yuji, Sekiguchi, Tetsuhiro, Shimoyama, Iwao, Hirao, Norie

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 486 KB

english, 2011

30

A Novel Approach to Protein Analysis in Hard Tissues

Hynek, Radovan, Kuckova, Stepanka, Konik, Peter, Prchlikova, Radka, Kodicek, Milan

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 187 KB

english, 2011

31

Uncertainty in Quantification of Binary Alloy Films and Thickness Measurement of nm Oxide Films

Kim, Kyung Joong

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 910 KB

english, 2011

32

Electrical characterization of thin silicon films produced by metal-induced crystallization on insulating substrates by conductive AFM

Shamiryan, Oxana, Maidanchuk, Ivan, Ahn, Nari, Choi, Ilsang, Ho Kyoon, Chung

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 319 KB

english, 2011

33

Characterization of fluorocarbon thin films deposited by ICP and PP

Lee, Jihye, Kim, Kang-Jin, Lee, Yeonhee

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 1.34 MB

english, 2011

34

Surface Characterization of Nanoparticles

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 348 KB

english, 2011

35

Application of lubricants structure on ophthalmic lens

Tadokoro, Nobuyuki, Pannakarn, Supaporn, Wisuthtatip, Jutathap, Kunchoo, Sureerat, Parnich, Veeraphat, Takashiba, Kenji, Shimizu, Koji, Higuchi, Hisashi

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 1.13 MB

english, 2011

36

Quick Observation of Photoelectron Emission Microscopy with Focused Soft X-rays using Poly-capillary Lens

Hirao, Norie, Baba, Yuji, Sekiguchi, Tetsuhiro, Shimoyama, Iwao

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 383 KB

english, 2011

37

Quantitative AES at Interfaces

Lejcek, Pavel, Hofmann, Siegfried

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 471 KB

english, 2011

38

Surface Pretreatments for Remove of Native Cu Oxide Layer

Ju, Hyunjin, Lee, Yong-Hyuk, Lee, Youn-Seoung, Rha, Sa-Kyun

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 790 KB

english, 2011

39

Investigation of Microphase Separation of PS-PPrMA Diblock Copolymer Films by Time-of-Flight Secondary Ion Mass Spectrometry

Lee, Yeonhee, Lee, Jihye, Lim, Weon Cheol, Shin, Kwanwoo

Journal:

Journal of Surface Analysis

Year:

2011

Language:

english

File:

PDF, 479 KB

english, 2011