Volume 31; Issue 6

Microelectronics Reliability

Volume 31; Issue 6
1

Reliability analysis and design of a fault-tolerant random access memory system

J.M. Kontoleon, A. Stergiou
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 373 KB
english, 1991
2

Improved bounds for the reliability of a system

K.K. Sharma
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 189 KB
english, 1991
4

Corrected bounds for reliability when strength and stress distributions are known

K.K. Sharma
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 158 KB
english, 1991
7

Reliability of local area networks with bus and ring topologies

Dušan Trstenský, Ladislav Schwartz
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 99 KB
english, 1991
9

Redundancy optimization problems for systems with dependent failure rates

A. Bhattacharya, A.K. Bhattacharji
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 251 KB
english, 1991
10

On estimation procedures of variance subsequent to preliminary test of significance

B.V.S. Sisodia, S.N. Rai
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 217 KB
english, 1991
13

Paradigms of quality for microelectronics and SMT

Ronald P. Anjard Sr
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 320 KB
english, 1991
14

Microelectronics' and reliability's new tool: UNIX today

Ronald P. Anjard Sr
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 481 KB
english, 1991
15

Some aspects of IC reliability estimation through accelerated life tests

N. Boychinova, V. Filev, O. Mirchev
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 217 KB
english, 1991
16

A modification of Bayesian approach in nuclear plant data analysis

Qun Wang
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 356 KB
english, 1991
17

Incandescent sign lamps and a very rough bath-tub curve

Andrew H. Rawicz
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 336 KB
english, 1991
18

Output probability from a general combinational network

Byung-Ho Jo, Hee-Yeung Hwang
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 331 KB
english, 1991
19

Stochastic analysis of a two unit warm standby system with two switching devices

S.W. Labib
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 310 KB
english, 1991
20

Testing that a distribution is new better than used of age to

Jack R. Green, Aisha S. Ragab
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 192 KB
english, 1991
21

The Burr Type II distribution: Properties, order statistics

Aisha Ragab, Jack R. Green, M.C.K. Tweedie
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 376 KB
english, 1991
22

Mean integrated square error of a recursive estimator of a distribution function

A.K. Hosni
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 280 KB
english, 1991
23

The truncated queue M/M/2/k with both balking and an additional server for longer queues

R.O. Al-Seedy
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 208 KB
english, 1991
24

Rules and criteria for when to stop testing a piece of software

E. Petrova, N. Malevris
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 665 KB
english, 1991
25

Bayesian estimation under exponential failure distribution

Lloyd R. Jaisingh
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 216 KB
english, 1991
27

Reliability evaluation of a human operator under various levels of stress

Who Kee Chung
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 169 KB
english, 1991
28

Safety-modelling on neural networks

Mamoun Suliman
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 332 KB
english, 1991
29

Neural realization of TMR with coverage

Mamoun Suliman, Charles A. Goben
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 331 KB
english, 1991
31

Society of reliability engineers bulletin

Hans Reiche
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 37 KB
english, 1991
33

Calendar of international conferences, symposia, lectures and meetings of interest

Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 135 KB
english, 1991
34

Publications, notices, calls for papers, etc.

Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 55 KB
english, 1991
35

4965515 Apparatus and method of testing a semiconductor wafer

Watar Karasawa
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 79 KB
english, 1991
38

4965865 Probe card for integrated circuit chip

DaleT Trenary
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 172 KB
english, 1991
41

4967262 Gull-wing zig-zag inline lead package having end-of-package anchoring pins

WarrenM Farnsworth
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 172 KB
english, 1991
43

4970724 Redundancy and testing techniques for IC wafers

MichaelW Yung
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 78 KB
english, 1991
44

4970780 Method for the assemblage of a semiconductor device

Takumi Suda, Katsuhisa Aizawa, Akio Nakamura
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 78 KB
english, 1991
45

4972413 Method and apparatus for high speed integrated circuit testing

HughW Littlebury, Mavin Swapp
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 86 KB
english, 1991
46

Title section, volume contents and author index, volume 31, 1991

Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 489 KB
english, 1991
47

Cpk applications—Uses and abuses

R.P. Anjard Sr, D. Hagerty, G.K. Griffith, Shin-Ta Liu, E.M. Mustonen, D.A. Pasfield
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 198 KB
english, 1991