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Volume 33; Issue 4
Main
Microelectronics Reliability
Volume 33; Issue 4
Microelectronics Reliability
Volume 33; Issue 4
1
An application of an artificial neural network to reliability screen classification from noise measurement
Yisong Dai
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 223 KB
Your tags:
english, 1993
2
A class of ratio, product and difference (R.P.D.) estimators in systematic sampling
Banarasi
,
S.N.S. Kushwaha
,
K.S. Kushwaha
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 160 KB
Your tags:
english, 1993
3
Reliability analysis of a complex redundant system
M.C. Rander
,
Ashok Kumar
,
R.K. Tuteja
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 226 KB
Your tags:
english, 1993
4
Bayesian sequential reliability test plans for a series system
K.K. Sharma
,
R.S. Rana
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 184 KB
Your tags:
english, 1993
5
Robustness of sequential Weibull life-test plans
K.K. Sharma
,
R.S. Rana
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 284 KB
Your tags:
english, 1993
6
Preliminary test interval estimation in life testing in the presence of outliers
S.K. Johri
,
V.P. Gupta
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 384 KB
Your tags:
english, 1993
7
Reliability comparison of an n cascade system with the addition of an n strength system
T.S. Uma Maheswari
,
A. Rekha
,
A.C.N. Raghava Char
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 146 KB
Your tags:
english, 1993
8
Enumeration of pathsets of reliability graphs by repeated indexing
M.A. Aziz
,
M.A. Sobhan
,
M.A. Samad
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 451 KB
Your tags:
english, 1993
9
On geometric processes and repair replacement problems
A.D. Jerome Stanley
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 178 KB
Your tags:
english, 1993
10
Markovian analysis of the MX/Ek/1 machine repair problem with spares
S.K. Singh
,
G.C. Sharma
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 221 KB
Your tags:
english, 1993
11
Characterizations of the Markov-Bernoulli geometric distribution
A.Y. Yehia
,
M. Gharib
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 153 KB
Your tags:
english, 1993
12
Comparison of two stochastic alternative phase models
S.E. Moafi B.
,
L.R. Goel
,
Rakesh Gupta
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 418 KB
Your tags:
english, 1993
13
A two-unit cold standby system with imperfect repair and excessive availability period
K. Shankar Bhat
,
M. Gururajan
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 200 KB
Your tags:
english, 1993
14
Tandem queue with three multiserver units and bulk service in unit III
G.V. Krishna Reddy
,
R. Nadarajan
,
P.R. Kandasamy
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 266 KB
Your tags:
english, 1993
15
Bayesian estimators of exponential parameters utilizing a guessed estimate of location
Rajesh Singh
,
S.K. Upadhyay
,
Umesh Singh
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 428 KB
Your tags:
english, 1993
16
Reliability and performance analysis of a modular multistage interconnection network
P.K. Bansal
,
Kuldip Singh
,
R.C. Joshi
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 383 KB
Your tags:
english, 1993
17
A dislocation model of shear fatigue damage and life prediction of SMT solder joints under thermal cycles
J.H. Huang
,
Y.Y. Qian
,
Y.H. Jiang
,
Q.L. Wang
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 414 KB
Your tags:
english, 1993
18
Minimal size of the system with two dual modes of failure having prescribed reliability
Antonín Lešanovský
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 653 KB
Your tags:
english, 1993
19
Impact of anomalous short-channel MOS transistors on VLSI circuit reliability
George L. Schnable
,
Kenneth M. Schlesier
,
George A. Swartz
,
Chung P. Wu
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 856 KB
Your tags:
english, 1993
20
Fuzzy fault-tree analysis using failure possibility
Gin-Shuh Liang
,
Mao-Jiun J. Wang
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 544 KB
Your tags:
english, 1993
21
An improved minimizing algorithm for the summation of disjoint products by Shannon's expansion
H.H. Liu
,
W.T. Yang
,
C.C. Liu
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 515 KB
Your tags:
english, 1993
22
Society of reliability engineers bulletin
Hans Reiche
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 65 KB
Your tags:
english, 1993
23
Reliability, availability, and safety assessment Volume 1 Methods and techniques Volume 2 Assessment, hardware, software and human factors: Author: Alain Villemeur Publisher: John Wiley & Sons Ltd. Baffins Lane, Chichester West Sussex P019 1UD, England, December 1991 Vol 1: ISBN 0-471-93048-2, 396pp Price: 34.95/$74.40 Vol 2: ISBN 0-471-93049-0, 416pp Price: 34.95/$74.40
Fl. Popentiu
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 56 KB
Your tags:
english, 1993
24
Reliability engineering handbook Volume 1: Author: Dimitri Kececioglu Publisher: Prentice Hall, Inc. A division of Simon & Schuster Englewood Cliffs, New Jersey 07632 XXXi+688 pages, Includes biografical references and index, January 1991 Price: $88.30 (ISBN 0-13-772294-x)
Fl. Popentiu
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 72 KB
Your tags:
english, 1993
25
Publications, notices, calls for papers, etc.
Journal:
Microelectronics Reliability
Year:
1993
Language:
english
File:
PDF, 40 KB
Your tags:
english, 1993
1
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