books search
books
articles search
articles
Donate
Log In
Log In
to access more features
personal recommendations
Telegram Bot
download history
send to Email or Kindle
manage booklists
save to favorites
Explore
Journals
Contribution
Donate
Litera Library
Donate paper books
Add paper books
Open LITERA Point
Volume 42; Issue 3
Main
Microelectronics Reliability
Volume 42; Issue 3
Microelectronics Reliability
Volume 42; Issue 3
1
A novel, zone based process monitoring method for low cost MCM-D substrates manufactured on large area panels
Didier Cottet
,
Michael Scheffler
,
Gerhard Tröster
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 416 KB
Your tags:
english, 2002
2
Impact of component placement in solder joint reliability
T Alander
,
S Nurmi
,
P Heino
,
E Ristolainen
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 269 KB
Your tags:
english, 2002
3
MOS characteristics of NO-grown oxynitrides on n-type 6H-SiC
S Chakraborty
,
P.T Lai
,
P.C.K Kwok
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 125 KB
Your tags:
english, 2002
4
Board level reliability of a stacked CSP subjected to cyclic bending
J.D Wu
,
S.H Ho
,
C.Y Huang
,
C.C Liao
,
P.J Zheng
,
S.C Hung
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 779 KB
Your tags:
english, 2002
5
1/f noise as a reliability indicator for subsurface Zener diodes
Yiqi Zhuang
,
Lei Du
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 100 KB
Your tags:
english, 2002
6
Development of gold to gold interconnection flip chip bonding for chip on suspension assemblies
C.F Luk
,
Y.C Chan
,
K.C Hung
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 783 KB
Your tags:
english, 2002
7
Investigation and modeling of stressed thermal oxides
Domenico Caputo
,
Fernanda Irrera
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 156 KB
Your tags:
english, 2002
8
Multichannel mixed-mode IC for digital readout of silicon strip detectors
P. Gryboś
,
W. Dąbrowski
,
P. Hottowy
,
R. Szczygieł
,
K. Świentek
,
P. Wiącek
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 222 KB
Your tags:
english, 2002
9
A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride–oxide dielectrics
Fen Chen
,
Rolf-Peter Vollertsen
,
Baozhen Li
,
Dave Harmon
,
Wing L. Lai
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 150 KB
Your tags:
english, 2002
10
Temperature-dependent noise characterization and modeling of on-wafer microwave transistors
A. Caddemi
,
N. Donato
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 322 KB
Your tags:
english, 2002
11
Bump formation for flip chip and CSP by solder paste printing
Joachim Kloeser
,
Paradiso Coskina
,
Rolf Aschenbrenner
,
Herbert Reichl
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 574 KB
Your tags:
english, 2002
12
The abnormality in gate oxide failure induced by stress-enhanced diffusion of polycrystalline silicon
Yongseok Ahn
,
Sanghyun Lee
,
Gwanhyeob Koh
,
Taeyoung Chung
,
Kinam Kim
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 293 KB
Your tags:
english, 2002
13
Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements
F. Saigné
,
O. Quittard
,
L. Dusseau
,
F. Joffre
,
C. Oudéa
,
J. Fesquet
,
J. Gasiot
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 192 KB
Your tags:
english, 2002
14
A thermo-mechanical study on the electrical resistance of aluminum wire conductors
De-Shin Liu
,
Chin-Yu Ni
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 368 KB
Your tags:
english, 2002
15
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs
Juin J. Liou
,
R. Shireen
,
A. Ortiz-Conde
,
F.J. Garcı́a Sánchez
,
A. Cerdeira
,
X. Gao
,
Xuecheng Zou
,
C.S. Ho
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 397 KB
Your tags:
english, 2002
16
On-line testable data path synthesis for minimizing testing time
A.A. Ismaeel
,
R. Bhatnagar
,
R. Mathew
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 294 KB
Your tags:
english, 2002
17
A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification
Guenther Benstetter
,
Michael W Ruprecht
,
Douglas B Hunt
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 662 KB
Your tags:
english, 2002
18
The impact of copper contamination on the quality of the second wire bonding process using X-ray photoelectron spectroscopy method
T.Y. Lin
,
W.S. Leong
,
K.H. Chua
,
R. Oh
,
Y. Miao
,
J.S. Pan
,
J.W. Chai
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 165 KB
Your tags:
english, 2002
19
Recent developments in silicon optoelectronic devices
Hei Wong
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 343 KB
Your tags:
english, 2002
20
Calendar of forthcoming events
Journal:
Microelectronics Reliability
Year:
2002
Language:
english
File:
PDF, 38 KB
Your tags:
english, 2002
1
Follow
this link
or find "@BotFather" bot on Telegram
2
Send /newbot command
3
Specify a name for your chatbot
4
Choose a username for the bot
5
Copy an entire last message from BotFather and paste it here
×
×