Volume 48; Issue 5

Microelectronics Reliability

Volume 48; Issue 5
3

Stress intensities at the triple junction of a multilevel thin film package

Insu Jeon, Ki-Ju Kang, Seyoung Im
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 1.21 MB
english, 2008
8

Reliability of ultra thin ZrO2 films on strained-Si

M.K. Bera, C.K. Maiti
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 1.23 MB
english, 2008
10

Analysis and test procedures for NOR flash memory defects

Mohammad Gh. Mohammad, Kewal K. Saluja
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 345 KB
english, 2008
15

A fringing-capacitance model for deep-submicron MOSFET with high-k gate dielectric

F. Ji, J.P. Xu, P.T. Lai, J.G. Guan
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 189 KB
english, 2008
16

Dependency of thermal spreading resistance on convective heat transfer coefficient

B. Vermeersch, G. De Mey
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 332 KB
english, 2008
17

Call for Papers - ROCS 2008 Workshop

Journal:
Microelectronics Reliability
Year:
2008
File:
PDF, 1.70 MB
2008
18

Calendar

Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 1.44 MB
english, 2008
20

No-fault-found and intermittent failures in electronic products

Haiyu Qi, Sanka Ganesan, Michael Pecht
Journal:
Microelectronics Reliability
Year:
2008
Language:
english
File:
PDF, 1.45 MB
english, 2008