Volume 54; Issue 3

Microelectronics Reliability

Volume 54; Issue 3

1

Investigation on thermo-mechanical responses in high power multi-finger AlGaN/GaN HEMTs

Zhang, R., Zhao, W.S., Yin, W.Y.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.44 MB

english, 2014

2

Recovery behavior in negative bias temperature instability

Yonamoto, Yoshiki

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 919 KB

english, 2014

3

A journey towards reliability improvement of TiO2 based Resistive Random Access Memory: A review

Acharyya, D., Hazra, A., Bhattacharyya, P.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 3.27 MB

english, 2014

4

A reversible first-order dispersive model of parametric instability

Alagi, Filippo, Rossetti, Mattia, Stella, Roberto, Viganò, Emanuele

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.20 MB

english, 2014

5

A finite state machine based fault tolerance technique for sequential circuits

El-Maleh, Aiman H., Al-Qahtani, Ayed S.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 707 KB

english, 2014

6

Fatigue and dwell-fatigue behavior of nano-silver sintered lap-shear joint at elevated temperature

Tan, Yansong, Li, Xin, Chen, Xu

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.77 MB

english, 2014

7

Effect of geometric complexities and nonlinear material properties on interfacial crack behavior in electronic devices

Sinha, Koustav, Varghese, Joe, Dasgupta, Abhijit

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 3.40 MB

english, 2014

8

Monitoring extent of curing and thermal–mechanical property study of printed circuit board substrates

Zhang, Jie, Li, Tian, Wang, Huiping, Liu, Yi, Yu, Yingfeng

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.66 MB

english, 2014

9

Effects of solder balls and arrays on the failure behavior in Package-on-Package structure

Wang, Xi-Shu, Jia, Su, Ren, Huai-Hui, Pan, Pan

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 3.30 MB

english, 2014

10

A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs

Goel, N., Joshi, K., Mukhopadhyay, S., Nanaware, N., Mahapatra, S.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.74 MB

english, 2014

11

Evaluation of the drop response of handheld electronic products

Mattila, T.T., Vajavaara, L., Hokka, J., Hussa, E., Mäkelä, M., Halkola, V.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 4.06 MB

english, 2014

12

Electron fluence driven, Cu catalyzed, interface breakdown mechanism for BEOL low-k time dependent dielectric breakdown

Chen, Fen, Shinosky, Michael A.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.84 MB

english, 2014

13

Effect of polyimide baking on bump resistance in flip-chip solder joints

Cheng, Hsi-Kuei, Feng, Shien-Ping, Lai, Yi-Jen, Liu, Kuo-Chio, Wang, Ying-Lang, Liu, Tzeng-Feng, Chen, Chih-Ming

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 847 KB

english, 2014

14

Interfacial microstructures and glass strengthening in anodic-bonded Al sheet/glass and sputtered Al film/glass

Park, Jong-Keun, Oh, Yong-Jun

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 3.15 MB

english, 2014

15

Capacitance behavior of composites for supercapacitor applications prepared with different durations of graphene/nanoneedle MnO2 reduction

Kim, Myeongjin, Yoo, Myeongyeol, Yoo, Youngjae, Kim, Jooheon

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.96 MB

english, 2014

16

A novel partial-SOI LDMOSFET (>800V) with n-type floating buried layer in substrate

Xia, Chao, Cheng, Xinhong, Wang, Zhongjian, Cao, Duo, Jia, Tingting, Zheng, Li, Yu, Yuehui, Shen, Dashen

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.61 MB

english, 2014

17

Novel digitally programmable multiphase voltage controlled oscillator and its stability discussion

Jin, Jie, Wang, Chunhua, Sun, Jingru, Tu, Yuxiang, Zhao, Lv, Xia, Zanming

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.55 MB

english, 2014

18

Inside front cover - Editorial board

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 38 KB

english, 2014

19

Corrigendum to “An analytical approach to calculate effective channel length in graphene nanoribbon field effect transistors” [Microelectron. Reliab. 53 (4) (2013) 540–543]

Ghadiry, M., Nadi, M., Bahadoran, M., Manaf, Asrulnizam ABD, Karimi, H., Sadeghi, Hatef

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 178 KB

english, 2014

20

Comparison between trap and self-heating induced mobility degradation in AlGaN/GaN HEMTs

Kalavagunta, Aditya, Mukherjee, Shubhajit, Reed, Robert, Schrimpf, R.D.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.56 MB

english, 2014