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Volume 64
Main
Microelectronics Reliability
Volume 64
Microelectronics Reliability
Volume 64
1
Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory
Choi, Jin Hyung
,
Yu, Chong Gun
,
Park, Jong Tae
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 1.96 MB
Your tags:
english, 2016
2
Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness
Koutsoureli, M.
,
Zevgolatis, A.
,
Saada, S.
,
Mer-Calfati, C.
,
Michalas, L.
,
Papaioannou, G.
,
Bergonzo, P.
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 713 KB
Your tags:
english, 2016
3
Editorial: ESREF 2016
Petzold, Matthias
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 121 KB
Your tags:
english, 2016
4
Editorial Board
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 37 KB
Your tags:
english, 2016
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