Volume 61; Issue 18

Applied Physics Letters

Volume 61; Issue 18
5

Fatal electromigration voids in narrow aluminum-copper interconnect

Year:
1992
Language:
english
File:
PDF, 652 KB
english, 1992
8

Compensation processes in nitrogen doped ZnSe

Year:
1992
Language:
english
File:
PDF, 559 KB
english, 1992
11

Differential gain in InP-based strained layer multiple quantum well lasers

Year:
1992
Language:
english
File:
PDF, 513 KB
english, 1992
13

Microfabricating bacteriorhodopsin films for imaging and computing

Year:
1992
Language:
english
File:
PDF, 622 KB
english, 1992
15

Electrical conductivity of a pure C60 single crystal

Year:
1992
Language:
english
File:
PDF, 496 KB
english, 1992
21

Electron mobility measured in undoped InGaAs epitaxial layer grown on n-InP substrate

Year:
1992
Language:
english
File:
PDF, 524 KB
english, 1992
22

Laser performance of Cr4+:Y2SiO5

Year:
1992
Language:
english
File:
PDF, 447 KB
english, 1992
24

NF3 plasma generation by commercial 50 Hz alternating current discharge for dry etching

Year:
1992
Language:
english
File:
PDF, 500 KB
english, 1992
25

Complete strain relief of heteroepitaxial GaAs on silicon

Year:
1992
Language:
english
File:
PDF, 597 KB
english, 1992
28

Alloying behavior of gold atoms into nm-sized copper clusters

Year:
1992
Language:
english
File:
PDF, 450 KB
english, 1992
34

Atomic force microscope study of boundary layer lubrication

Year:
1992
Language:
english
File:
PDF, 610 KB
english, 1992
36

Ge profile from the growth of SiGe buried layers by molecular beam epitaxy

Year:
1992
Language:
english
File:
PDF, 616 KB
english, 1992