Volume 73; Issue 16

Applied Physics Letters

Volume 73; Issue 16
6

Dielectric properties of epitaxial BaTiO[sub 3] thin films

Year:
1998
Language:
english
File:
PDF, 335 KB
english, 1998
7

Photoinduced and thermal stress in silicon microcantilevers

Year:
1998
Language:
english
File:
PDF, 323 KB
english, 1998
9

Dielectric breakdown of ferromagnetic tunnel junctions

Year:
1998
Language:
english
File:
PDF, 359 KB
english, 1998
14

Gettering of Cu and Ni in mega-electron-volt ion-implanted epitaxial silicon

Year:
1998
Language:
english
File:
PDF, 337 KB
english, 1998
20

Analysis of terahertz pulse measurement with a chirped probe beam

Year:
1998
Language:
english
File:
PDF, 454 KB
english, 1998
22

Energy levels of Zn in Si[sub 1−X]Ge[sub X] alloys

Year:
1998
Language:
english
File:
PDF, 377 KB
english, 1998
28

Electrical properties of wafer-bonded GaAs/Si heterojunctions

Year:
1998
Language:
english
File:
PDF, 261 KB
english, 1998
29

Effect of curvature and stress on reaction rates at solid interfaces

Year:
1998
Language:
english
File:
PDF, 263 KB
english, 1998
31

Void-like defects in annealed Czochralski silicon

Year:
1998
Language:
english
File:
PDF, 672 KB
english, 1998
36

Picojoule and submillisecond calorimetry with micromechanical probes

Year:
1998
Language:
english
File:
PDF, 280 KB
english, 1998
37

Solvent-driven chemical motor

Year:
1998
Language:
english
File:
PDF, 664 KB
english, 1998
38

Emission process in bilayer organic light emitting diodes

Year:
1998
Language:
english
File:
PDF, 254 KB
english, 1998
43

Origin of the charge to breakdown distributions in thin silicon dioxide films

Year:
1998
Language:
english
File:
PDF, 319 KB
english, 1998