Volume 81; Issue 3

Radiation Physics and Chemistry

Volume 81; Issue 3
11

The 160.44 day 177mLu as a new gamma calibration standard

Year:
2012
Language:
english
File:
PDF, 350 KB
english, 2012
15

Low dose measurement with thick gate oxide MOSFETs

Year:
2012
Language:
english
File:
PDF, 487 KB
english, 2012
20

Effect of external pressure on the Kβ/Kα X-ray intensity ratios of 3d metals

Year:
2012
Language:
english
File:
PDF, 146 KB
english, 2012
22

A smoothing method for X-ray spectrum based on best beamforming

Year:
2012
Language:
english
File:
PDF, 296 KB
english, 2012
25

Editorial Board/Publication information

Year:
2012
Language:
english
File:
PDF, 35 KB
english, 2012