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Volume 38; Issue 6
Main
Russian Microelectronics
Volume 38; Issue 6
Russian Microelectronics
Volume 38; Issue 6
1
Happy 85th Anniversary!
Journal:
Russian Microelectronics
Year:
2009
Language:
english
File:
PDF, 79 KB
Your tags:
english, 2009
2
Nano- and micrometer-scale thin-film-interconnection failure theory and simulation and metallization lifetime prediction, Part 1: A general theory of vacancy transport, mechanical-stress generation, and void nucleation under electromigration in relation to multilevel-metallization degeneration and failure
K. A. Valiev
,
R. V. Goldstein
,
Yu. V. Zhitnikov
,
T. M. Makhviladze
,
M. E. Sarychev
Journal:
Russian Microelectronics
Year:
2009
Language:
english
File:
PDF, 376 KB
Your tags:
english, 2009
3
Simulation of the effects of deep grooving in silicon in the plasmochemical cyclic process
A. S. Shumilov
,
I. I. Amirov
,
V. F. Lukichev
Journal:
Russian Microelectronics
Year:
2009
Language:
english
File:
PDF, 454 KB
Your tags:
english, 2009
4
A semianalytical model of a thin-channel field-effect transistor
A. N. Khomyakov
,
V. V. V’yurkov
Journal:
Russian Microelectronics
Year:
2009
Language:
english
File:
PDF, 232 KB
Your tags:
english, 2009
5
Nonequivalence of biparticle and multiparticle quantum entanglements
A. Yu. Chernyavskii
Journal:
Russian Microelectronics
Year:
2009
Language:
english
File:
PDF, 127 KB
Your tags:
english, 2009
6
Constructivist treatment of Bell’s inequality violations and the no-hidden-variable theorems
Y. I. Ozhigov
Journal:
Russian Microelectronics
Year:
2009
Language:
english
File:
PDF, 216 KB
Your tags:
english, 2009
7
Positronics and nanotechnologies: Possibilities of studying nanoobjects in critical engineering materials using positron annihilation spectrometry
V. I. Grafutin
,
E. P. Prokop’ev
,
S. P. Timoshenkov
,
S. S. Evstaf’ev
,
Yu. V. Funtikov
Journal:
Russian Microelectronics
Year:
2009
Language:
english
File:
PDF, 236 KB
Your tags:
english, 2009
8
Quantum state depressions in thin metal films with an indented surface
A. N. Tavkhelidze
,
A. P. Bibilashvili
,
L. B. Jangidze
,
B. B. Olsen
,
H. Walitzki
,
A. Feinerman
Journal:
Russian Microelectronics
Year:
2009
Language:
english
File:
PDF, 182 KB
Your tags:
english, 2009
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