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Volume 39; Issue 1
Main
Russian Microelectronics
Volume 39; Issue 1
Russian Microelectronics
Volume 39; Issue 1
1
Effect of surface roughness on the temperature of a silicon wafer heated by incoherent radiation
V. I. Rudakov
,
V. V. Ovcharov
,
V. P. Prigara
Journal:
Russian Microelectronics
Year:
2010
Language:
english
File:
PDF, 383 KB
Your tags:
english, 2010
2
A new technology for manufacturing the dielectric isolation of elements of microelectronic devices by oxidizing grooves in single-crystal silicon
Yu. P. Snitovskii
,
M. G. Krasikov
Journal:
Russian Microelectronics
Year:
2010
Language:
english
File:
PDF, 305 KB
Your tags:
english, 2010
3
Diagnosing reliability of integrated circuits using noises and the ESD effect
M. I. Gorlov
,
D. Yu. Smirnov
,
R. M. Tikhonov
Journal:
Russian Microelectronics
Year:
2010
Language:
english
File:
PDF, 137 KB
Your tags:
english, 2010
4
Low-temperature pulsed CVD of ruthenium thin films for micro- and nanoelectronic applications, Part 1: Equipment and methodology
V. Yu. Vasilyev
Journal:
Russian Microelectronics
Year:
2010
Language:
english
File:
PDF, 171 KB
Your tags:
english, 2010
5
Determination of the diffusion length of charge minority carriers using digital oscillography of surface photovoltage
V. N. Podshivalov
Journal:
Russian Microelectronics
Year:
2010
Language:
english
File:
PDF, 229 KB
Your tags:
english, 2010
6
Offset voltage of an integrated magnetotransistor sensor
R. D. Tikhonov
Journal:
Russian Microelectronics
Year:
2010
Language:
english
File:
PDF, 230 KB
Your tags:
english, 2010
7
Low-voltage arithmetic units based on fully depleted SOI CMOS nanotransistors
N. V. Masal’skii
Journal:
Russian Microelectronics
Year:
2010
Language:
english
File:
PDF, 207 KB
Your tags:
english, 2010
8
Intersubband optical transitions in InAs/GaSb quantum wells
I. A. Semenikhina
,
A. A. Zakharova
,
K. A. Chao
Journal:
Russian Microelectronics
Year:
2010
Language:
english
File:
PDF, 237 KB
Your tags:
english, 2010
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