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Volume 47-48
Main
Solid State Phenomena
Volume 47-48
Solid State Phenomena
Volume 47-48
1
Relation between Structural and Carrier Recombination Properties in As-Rich GaAs
Jasutis, V.
,
Lescinskas, D.
,
Marcinkevičius, Stanislovas
,
Bertulis, K.
,
Krotkus, A.
,
Tan, H.H.
,
Jagadish, C.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 473 KB
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english, 1996
2
Needs of Low Thermal Budget Processing in SiGe Technology
König, U.
,
Hersener, J.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 1.12 MB
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english, 1996
3
DX-Like Centers in Dislocated Compound Semiconductors: A New Aspect of the Interaction between Extended Defects and Impurities
Istratov, Andrei A.
,
Vyvenko, O.F.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 573 KB
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1996
4
Fermi-Level Shifts Caused by Reactions of Intrinsic Defects at 450°C - 540°C in FZ- and Cz-Silicon Supersaturated with Platinum- An Electron Paramagnetic Resonance Study
Juda, J.
,
Höhne, M.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 336 KB
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1996
5
Twin Formation during Epitaxial Growth of InP on Si
Wehmann, H.-H.
,
Tang, G.-P.
,
Koch, A.
,
Seibt, Michael
,
Schlachetzki, A.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 612 KB
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1996
6
Point Defect Concentrations, Distributions and Diffusivity in Thin Si MBE-Films: Experiments and Simulations Based on Profiling of Implanted Multiple Delta Doping Structures
Krüger, D.
,
Kurps, R.
,
Zeindl, H.P.
,
Jagdhold, U.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 430 KB
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1996
7
Composition Dependence of Hardness and Elastic Modulus in Si-Ge Measured by Nanoindentation - Possible Consequences for Elasto-Plastic Relaxation and Diffusion
Roos, B.
,
Richter, Hans
,
Wollweber, Jürgen
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 520 KB
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english, 1996
8
Critical Points of Strained Si1-yCy Layers on Si(001)
Kissinger, W.
,
Weidner, Michael
,
Osten, H.J.
,
Eichler, M.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 364 KB
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1996
9
Ion Beam Sputter Deposited Si0.8Ge0.2Epilayers: Lattice Defects and Surface Topology
Demuth, V.
,
Dorsch, W.
,
Strunk, Horst P.
,
Lyakas, M.
,
Eizenberg, M.
,
Mosleh, N.
,
Meyer, F.
,
Schwebel, C.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 645 KB
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1996
10
Dislocation Related Electroluminescence at Room Temperature in Plastically Deformed Silicon
Kveder, Vitaly
,
Steinman, E.A.
,
Grimmeiss, Hermann G.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 454 KB
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1996
11
Gettering of Transition Metals in Multicrystalline Silicon for Photovoltaic Applications
Weber, Eicke R.
,
McHugo, Scott A.
,
Hieslmair, H.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 352 KB
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1996
12
The Relaxation and Diffusion Behaviour of Strained Si1-xGex Layers on Si Substrates at High Temperature under Hydrostatic Pressure
Zaumseil, P.
,
Fischer, G.G.
,
Quick, Ch.
,
Misiuk, Andrzej
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 440 KB
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1996
13
Determination of Interface Structure and Bonding by Z-Contrast STEM
Pennycook, S.J.
,
Browning, Nigel D.
,
McGibbon, M.M.
,
McGibbon, A.J.
,
Chisholm, M.F.
,
Jesson, D.E.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 707 KB
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english, 1996
14
Interface Structure and Dislocation Formation in InGaAs/GaAs SQWs Grown with Different In Content on Vicinal Substrates
Frigeri, C.
,
Di Paola, A.
,
Ritchie, D.M.
,
Longo, F.
,
Brinciotti, A.
,
Riva, M.
,
Vidimari, F.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 789 KB
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1996
15
Elastic and Plastic Stress Relaxation in Stripes and Circular Mesas
Jain, S.C.
,
Pinardi, K.
,
Harker, A.H.
,
Richter, Hans
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 429 KB
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1996
16
Gettering of Low Concentration Copper, Nickel and Iron Contamination in Czochralski Silicon Wafers
Laczik, Z.
,
Bouwhuis, L.
,
Booker, G.R.
,
Falster, Robert
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 914 KB
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1996
17
Multicrystalline Silicon for Solar Cells
Möller, Hans Joachim
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 1.35 MB
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english, 1996
18
Interactions between Dopants and End-of-Range Defects in Silicon
Claverie, A.
,
Bonafos, C.
,
Martinez, A.
,
Alquier, Daniel
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 667 KB
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english, 1996
19
The Impact of Fe and Cu Contamination in the 1012 at/cm2 Range on the Performance of Junction Diodes
Rotondaro, A.L.P.
,
Vandamme, E.
,
Vanhellemont, Jan
,
Simoen, Eddy
,
Heyns, Marc M.
,
Claeys, C.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 445 KB
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1996
20
Low-Frequency Noise Sources Related to Processing-Induced Extended Defects in Si Devices
Simoen, Eddy
,
Vanhellemont, Jan
,
Claeys, C.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 456 KB
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1996
21
Critical Conditions for the Generation of the Misfit Dislocations during the Boron Diffusion in Silicon: Analytical Evaluation
Gaiseanu, F.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 359 KB
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1996
22
Role of Interstitial Atoms in Microscopic Processes on (113) and (001) Surfaces of Silicon
Dąbrowski, Jaroslaw
,
Müssig, Hans Joachim
,
Wolff, G.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 529 KB
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1996
23
The Mechanisms and Application of Dislocation Related Radiation for Silicon Based Light Sources
Steinman, E.A.
,
Kveder, Vitaly
,
Grimmeiss, Hermann G.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 483 KB
Your tags:
1996
24
Silicon Materials and Metrology: Critical Concepts for Optimal IC Performance in the Gigabit Era
Huff, Howard R.
,
Goodall, R.K.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 1.87 MB
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english, 1996
25
New Infrared Bands in Neutron-Irradiated Si
Londos, Charalamos A.
,
Georgiou, G.I.
,
Fytros, L.G.
,
Sarlis, N.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 316 KB
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1996
26
History and Future of Semiconductor Wafer Bonding
Gösele, U.M.
,
Stenzel, H.
,
Reiche, M.
,
Martini, T.
,
Steinkirchner, H.
,
Tong, Q.-Y.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 872 KB
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english, 1996
27
Behaviour of the Size Distribution Function of End-of-Range Dislocation Loops during Silicon Oxidation
Seibt, Michael
,
Spiecker, E.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 400 KB
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1996
28
TEM Analysis of Structure Modification Induced by Additional Carbon Incorporation in Silicon and Si1-xGex Layers Grown with Molecular Beam Epitaxy
Bugiel, E.
,
Ruvimov, S.
,
Osten, H.J.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 559 KB
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1996
29
The Effect of Metallization Induced Defects on Metal-Semiconductor Contacts
Goodman, S.A.
,
Auret, F.D.
,
Myburg, G.
,
Schutte, C.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 394 KB
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1996
30
New Donors in Heat-Treated Cz-Si, Their Components and Formation Kinetics
Emtsev, Valentin V.
,
Oganesyan, Gagik A.
,
Schmalz, K.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 436 KB
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english, 1996
31
Surface Damage Induced by Reactive Ion Etching in n- Type Silicon
Poggi, Antonella
,
Susi, E.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 420 KB
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english, 1996
32
Infrared Studies of Oxygen Precipitation Related Defects in Silicon after Various Thermal Treatments
Vanhellemont, Jan
,
Kissinger, G.
,
Clauws, Paul
,
Kaniava, A.
,
Libezny, M.
,
Gaubas, Eugenijus
,
Simoen, Eddy
,
Richter, Hans
,
Claeys, C.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 443 KB
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1996
33
Band Structure Engineering in Si-Ge Structures
Jaros, M.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 643 KB
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english, 1996
34
Structural and Electrical Properties of NiSi2 Particles in Silicon
Riedel, F.
,
Kronewitz, J.
,
Gnauert, U.
,
Seibt, Michael
,
Schröter, Wolfgang
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 466 KB
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1996
35
Room Temperature UHV Silicon Direct Bonding
Shi, F.
,
Elssner, G.
,
Reiche, M.
,
Gösele, U.M.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 760 KB
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english, 1996
36
Phosphorus Diffusion Induced Reconstruction of Defect Structure in Oxygen Precipitated Si
Yakimov, E.B.
,
Périchaud, Isabelle
,
Martinuzzi, Santo
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 404 KB
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1996
37
Investigation of Microdefects in Multicrystalline Silicon for Photovoltaic Applications
Werner, M.
,
Weber, Eicke R.
,
McHugo, Scott A.
,
Hieslmair, H.
,
Chapman, K.L.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 1.04 MB
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1996
38
GaAIAs Lattice Parameter Dependence on Free Electron Concentration
Bak-Misiuk, Jadwiga
,
Leszczyński, M.
,
Domagała, J.Z.
,
Trela, J.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 347 KB
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1996
39
Dislocation-Related Photoluminescence in Graded SiGe Buffer Layers Grown by APCVD
Erzgräber, H.B.
,
Kissinger, G.
,
Morgenstern, G.
,
Morgenstern, T.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 507 KB
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1996
40
Defect Engineering for Silicon-on-Insulator, MeV Implantation and Low Temperature Processing
Koveshnikov, Sergei V.
,
Agarwal, Anant
,
Beaman, K.L.
,
Rozgonyi, George A.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 802 KB
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english, 1996
41
Oxygen Aggregation Phenomena in Silicon
Newman, R.C.
,
Binns, M.J.
,
Londos, Charalamos A.
,
McQuaid, S.A.
,
Tucker, J.H.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 700 KB
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english, 1996
42
External Gettering for Multicrystalline Silicon Wafers
Martinuzzi, Santo
,
Périchaud, Isabelle
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 907 KB
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english, 1996
43
Mechanisms of Dislocation Generation in Heterostructures Based on SiGe Alloys
Vdovin, V.I.
,
Mil'vidskii, M.G.
,
Yugova, T.G.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 509 KB
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1996
44
An Analysis of Residual Strain in Dry Etched Semiconductor Nanostructures
Tang, Y.S.
,
Sotomayor Torres, Clivia M.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 541 KB
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1996
45
Contrastive Recombination Behaviour of Metal Silicide and Oxygen Precipitates in n-Type Silicon: Attempt at an Explanation
Seifert, Winfried
,
Kittler, Martin
,
Seibt, Michael
,
Buczkowski, A.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 422 KB
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1996
46
Determination of Subgap-Asorption in μc-Si:H Films by CPM
Krankenhagen, R.
,
Schmidt, M.
,
Henrion, W.
,
Sieber, Irina
,
Koynov, S.
,
Grebner, S.
,
Schwarz, R.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 439 KB
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1996
47
Tomographic Atom Probe: A New Tool for Nanoscale Characterisation
Leisch, M.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 608 KB
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english, 1996
48
DRAM Wafer Qualification Issues: Oxide Integrity vs. D-Defects, Oxygen Precipitates and High Temperature Annealing
Park, J.G.
,
Rozgonyi, George A.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 1.60 MB
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english, 1996
49
Iron Group Impurities in Semiconducting Iron Disilicide
Irmscher, K.
,
Gelhoff, W.
,
Tomm, Y.
,
Lange, H.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 419 KB
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1996
50
Building the Electron Superhighway: Back-End Processing and Simulation
Baumann, F.H.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 709 KB
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english, 1996
51
Correlation between Dislocations and Electron Transport Properties in Si/SiGe
Ismail, K.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 401 KB
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english, 1996
52
Trends and Challenges for Advanced Silicon Technologies
Claeys, C.
,
Deferm, L.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 1.16 MB
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english, 1996
53
Hydrogen Passivation of Double Donors in Silicon
Martynov, Yu.V.
,
Zevenbergen, I.S.
,
Gregorkiewicz, T.
,
Ammerlaan, C.A.J.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 614 KB
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english, 1996
54
Cyclotron Resonance in Heavily Doped Silicon Quantum Wells
Gehlhoff, W.
,
Bagraev, N.T.
,
Klyachkin, L.E.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 486 KB
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1996
55
The Effect of Interface Engineering and Wave Function Localisation on Optical Response in Imperfect Type I and Type II Quantum Well Structures
Shaw, M.J.
,
Briddon, Patrick R.
,
Jaros, M.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 411 KB
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1996
56
Analysis of Σ=3 and Σ=9 Twin Boundaries in Three-Crystal Silicon Ingots
Castaldini, Antonio
,
Cavalcoli, Daniela
,
Cavallini, Anna
,
Martinelli, G.
,
Palmeri, D.
,
Parisini, A.
,
Sartori, G.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 412 KB
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1996
57
Investigation of the Dislocation Motion in the Bulk SiGe Crystals
Iunin, Yu.L.
,
Nikitenko, V.I.
,
Orlov, Valeri I.
,
Abrosimov, N.V.
,
Rossolenko, S.N.
,
Schröder, W.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 370 KB
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1996
58
Measurements of Diffusion Length in Si-SiGe Structures
Kononchuk, O.V.
,
Rozgonyi, George A.
,
Yakimov, E.B.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 345 KB
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1996
59
PHOTO-EDSR in Plastically Deformed p-Si
Grimmeiss, Hermann G.
,
Omling, P.
,
Shalynin, A.I.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 411 KB
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1996
60
Gettering of Au in Heat Treated Si/SiGe/Si Structures
Schmalz, K.
,
Krüger, D.
,
Kurps, R.
,
Morgenstern, T.
,
Zeindl, H.P.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 390 KB
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1996
61
Diameter Effects on Grown-In Defects in CZ Crystal Growth
Uberti, F.
,
Hagimoto, K.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 619 KB
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english, 1996
62
Diffusion Effects and Luminescence in Thin SiGe/Si Layers
Gail, M
,
Jung, W.
,
Brunner, J.
,
Schittenhelm, P.
,
Nützel, J.F.
,
Abstreiter, G.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 904 KB
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english, 1996
63
Characterisation of High-Energy Proton Irradiation Induced Recombination Centers in Silicon
Kaniava, A.
,
Vanhellemont, Jan
,
Simoen, Eddy
,
Claeys, C.
,
Gaubas, Eugenijus
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 388 KB
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1996
64
Elastic Relaxation of Pseudomorphic Strain in Quantum Dots
Dietrich, B.
,
Frankenfeldt, H.
,
Tang, Y.S.
,
Sotomayor Torres, Clivia M.
,
Zeindl, H.P.
,
Wolff, A.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 350 KB
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1996
65
Silicon Carbide - A Promising Wide-Band-Gap Semiconductor for Electronic Devices
Pensl, Gerhard
,
Troffer, T.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 749 KB
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english, 1996
66
Influence of Point Defects on Defect Formation in Si:Er
Sobolev, N.A.
,
Alexandrov, O.V.
,
Emtsev, Valentin V.
,
Makovijchuk, M.I.
,
Merkulov, A.V.
,
Parshin, E.O.
,
Poloskin, D.S.
,
Shek, E.I.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 500 KB
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english, 1996
67
SiC Buried Layer Formation Induced by Ion Implantation
Klyui, N.I.
,
Krüger, D.
,
Romanyuk, B.N.
,
Litovchenko, V.G.
,
Richter, Hans
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 359 KB
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1996
68
Point Defects in Semiconductors - Then and Now
Pantelides, Sokrates T.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 667 KB
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english, 1996
69
Investigation of the Substrate / Epitaxial Interface of Si/Si1-xGexGrown by LPCVD
Loo, R.
,
Vescan, L.
,
Dieker, C.
,
Freundt, D.
,
Hartmann, A.
,
Mück, A.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 449 KB
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1996
70
The Si:Er Crystal: Model and Excitation Mechanism of the Er-O Center
Bagraev, N.T.
,
Onopko, D.E.
,
Ryskin, Alexandr I.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 399 KB
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1996
71
Copper Precipitation in Monocrystalline Silicon: Role of Initial Oxygen Concentration and Thermal Oxidation
Correia, A.
,
Boutry-Forveille, A.
,
Ballutaud, D.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 684 KB
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1996
72
A Study of Defects Generated by BF2+ Implantation in Silicon Crystals and Their Annealing
Lal, K.
,
Bhagavannarayana, G.
,
Virdi, G.S.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 487 KB
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1996
73
Expected Limits for Manufacturing Very Large Silicon Wafers
v. Ammon, W.
Journal:
Solid State Phenomena
Year:
1996
Language:
english
File:
PDF, 911 KB
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english, 1996
74
Electrical Activity of Misfit Dislocations in GaAsSb/GaAs Heterojunctions
Wosiński, T.
,
Makosa, A.
,
Raczynska, J.
Journal:
Solid State Phenomena
Year:
1996
File:
PDF, 407 KB
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1996
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