Volume 47-48

Solid State Phenomena

Volume 47-48

1

Relation between Structural and Carrier Recombination Properties in As-Rich GaAs

Jasutis, V., Lescinskas, D., Marcinkevičius, Stanislovas, Bertulis, K., Krotkus, A., Tan, H.H., Jagadish, C.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 473 KB

english, 1996

2

Needs of Low Thermal Budget Processing in SiGe Technology

König, U., Hersener, J.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 1.12 MB

english, 1996

3

DX-Like Centers in Dislocated Compound Semiconductors: A New Aspect of the Interaction between Extended Defects and Impurities

Istratov, Andrei A., Vyvenko, O.F.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 573 KB

1996

4

Fermi-Level Shifts Caused by Reactions of Intrinsic Defects at 450°C - 540°C in FZ- and Cz-Silicon Supersaturated with Platinum- An Electron Paramagnetic Resonance Study

Juda, J., Höhne, M.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 336 KB

1996

5

Twin Formation during Epitaxial Growth of InP on Si

Wehmann, H.-H., Tang, G.-P., Koch, A., Seibt, Michael, Schlachetzki, A.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 612 KB

1996

6

Point Defect Concentrations, Distributions and Diffusivity in Thin Si MBE-Films: Experiments and Simulations Based on Profiling of Implanted Multiple Delta Doping Structures

Krüger, D., Kurps, R., Zeindl, H.P., Jagdhold, U.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 430 KB

1996

7

Composition Dependence of Hardness and Elastic Modulus in Si-Ge Measured by Nanoindentation - Possible Consequences for Elasto-Plastic Relaxation and Diffusion

Roos, B., Richter, Hans, Wollweber, Jürgen

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 520 KB

english, 1996

8

Critical Points of Strained Si1-yCy Layers on Si(001)

Kissinger, W., Weidner, Michael, Osten, H.J., Eichler, M.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 364 KB

1996

9

Ion Beam Sputter Deposited Si0.8Ge0.2Epilayers: Lattice Defects and Surface Topology

Demuth, V., Dorsch, W., Strunk, Horst P., Lyakas, M., Eizenberg, M., Mosleh, N., Meyer, F., Schwebel, C.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 645 KB

1996

10

Dislocation Related Electroluminescence at Room Temperature in Plastically Deformed Silicon

Kveder, Vitaly, Steinman, E.A., Grimmeiss, Hermann G.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 454 KB

1996

11

Gettering of Transition Metals in Multicrystalline Silicon for Photovoltaic Applications

Weber, Eicke R., McHugo, Scott A., Hieslmair, H.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 352 KB

1996

12

The Relaxation and Diffusion Behaviour of Strained Si1-xGex Layers on Si Substrates at High Temperature under Hydrostatic Pressure

Zaumseil, P., Fischer, G.G., Quick, Ch., Misiuk, Andrzej

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 440 KB

1996

13

Determination of Interface Structure and Bonding by Z-Contrast STEM

Pennycook, S.J., Browning, Nigel D., McGibbon, M.M., McGibbon, A.J., Chisholm, M.F., Jesson, D.E.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 707 KB

english, 1996

14

Interface Structure and Dislocation Formation in InGaAs/GaAs SQWs Grown with Different In Content on Vicinal Substrates

Frigeri, C., Di Paola, A., Ritchie, D.M., Longo, F., Brinciotti, A., Riva, M., Vidimari, F.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 789 KB

1996

15

Elastic and Plastic Stress Relaxation in Stripes and Circular Mesas

Jain, S.C., Pinardi, K., Harker, A.H., Richter, Hans

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 429 KB

1996

16

Gettering of Low Concentration Copper, Nickel and Iron Contamination in Czochralski Silicon Wafers

Laczik, Z., Bouwhuis, L., Booker, G.R., Falster, Robert

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 914 KB

1996

17

Multicrystalline Silicon for Solar Cells

Möller, Hans Joachim

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 1.35 MB

english, 1996

18

Interactions between Dopants and End-of-Range Defects in Silicon

Claverie, A., Bonafos, C., Martinez, A., Alquier, Daniel

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 667 KB

english, 1996

19

The Impact of Fe and Cu Contamination in the 1012 at/cm2 Range on the Performance of Junction Diodes

Rotondaro, A.L.P., Vandamme, E., Vanhellemont, Jan, Simoen, Eddy, Heyns, Marc M., Claeys, C.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 445 KB

1996

20

Low-Frequency Noise Sources Related to Processing-Induced Extended Defects in Si Devices

Simoen, Eddy, Vanhellemont, Jan, Claeys, C.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 456 KB

1996

21

Critical Conditions for the Generation of the Misfit Dislocations during the Boron Diffusion in Silicon: Analytical Evaluation

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 359 KB

1996

22

Role of Interstitial Atoms in Microscopic Processes on (113) and (001) Surfaces of Silicon

Dąbrowski, Jaroslaw, Müssig, Hans Joachim, Wolff, G.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 529 KB

1996

23

The Mechanisms and Application of Dislocation Related Radiation for Silicon Based Light Sources

Steinman, E.A., Kveder, Vitaly, Grimmeiss, Hermann G.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 483 KB

1996

24

Silicon Materials and Metrology: Critical Concepts for Optimal IC Performance in the Gigabit Era

Huff, Howard R., Goodall, R.K.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 1.87 MB

english, 1996

25

New Infrared Bands in Neutron-Irradiated Si

Londos, Charalamos A., Georgiou, G.I., Fytros, L.G., Sarlis, N.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 316 KB

1996

26

History and Future of Semiconductor Wafer Bonding

Gösele, U.M., Stenzel, H., Reiche, M., Martini, T., Steinkirchner, H., Tong, Q.-Y.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 872 KB

english, 1996

27

Behaviour of the Size Distribution Function of End-of-Range Dislocation Loops during Silicon Oxidation

Seibt, Michael, Spiecker, E.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 400 KB

1996

28

TEM Analysis of Structure Modification Induced by Additional Carbon Incorporation in Silicon and Si1-xGex Layers Grown with Molecular Beam Epitaxy

Bugiel, E., Ruvimov, S., Osten, H.J.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 559 KB

1996

29

The Effect of Metallization Induced Defects on Metal-Semiconductor Contacts

Goodman, S.A., Auret, F.D., Myburg, G., Schutte, C.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 394 KB

1996

30

New Donors in Heat-Treated Cz-Si, Their Components and Formation Kinetics

Emtsev, Valentin V., Oganesyan, Gagik A., Schmalz, K.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 436 KB

english, 1996

31

Surface Damage Induced by Reactive Ion Etching in n- Type Silicon

Poggi, Antonella, Susi, E.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 420 KB

english, 1996

32

Infrared Studies of Oxygen Precipitation Related Defects in Silicon after Various Thermal Treatments

Vanhellemont, Jan, Kissinger, G., Clauws, Paul, Kaniava, A., Libezny, M., Gaubas, Eugenijus, Simoen, Eddy, Richter, Hans, Claeys, C.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 443 KB

1996

33

Band Structure Engineering in Si-Ge Structures

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 643 KB

english, 1996

34

Structural and Electrical Properties of NiSi2 Particles in Silicon

Riedel, F., Kronewitz, J., Gnauert, U., Seibt, Michael, Schröter, Wolfgang

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 466 KB

1996

35

Room Temperature UHV Silicon Direct Bonding

Shi, F., Elssner, G., Reiche, M., Gösele, U.M.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 760 KB

english, 1996

36

Phosphorus Diffusion Induced Reconstruction of Defect Structure in Oxygen Precipitated Si

Yakimov, E.B., Périchaud, Isabelle, Martinuzzi, Santo

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 404 KB

1996

37

Investigation of Microdefects in Multicrystalline Silicon for Photovoltaic Applications

Werner, M., Weber, Eicke R., McHugo, Scott A., Hieslmair, H., Chapman, K.L.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 1.04 MB

1996

38

GaAIAs Lattice Parameter Dependence on Free Electron Concentration

Bak-Misiuk, Jadwiga, Leszczyński, M., Domagała, J.Z., Trela, J.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 347 KB

1996

39

Dislocation-Related Photoluminescence in Graded SiGe Buffer Layers Grown by APCVD

Erzgräber, H.B., Kissinger, G., Morgenstern, G., Morgenstern, T.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 507 KB

1996

40

Defect Engineering for Silicon-on-Insulator, MeV Implantation and Low Temperature Processing

Koveshnikov, Sergei V., Agarwal, Anant, Beaman, K.L., Rozgonyi, George A.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 802 KB

english, 1996

41

Oxygen Aggregation Phenomena in Silicon

Newman, R.C., Binns, M.J., Londos, Charalamos A., McQuaid, S.A., Tucker, J.H.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 700 KB

english, 1996

42

External Gettering for Multicrystalline Silicon Wafers

Martinuzzi, Santo, Périchaud, Isabelle

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 907 KB

english, 1996

43

Mechanisms of Dislocation Generation in Heterostructures Based on SiGe Alloys

Vdovin, V.I., Mil'vidskii, M.G., Yugova, T.G.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 509 KB

1996

44

An Analysis of Residual Strain in Dry Etched Semiconductor Nanostructures

Tang, Y.S., Sotomayor Torres, Clivia M.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 541 KB

1996

45

Contrastive Recombination Behaviour of Metal Silicide and Oxygen Precipitates in n-Type Silicon: Attempt at an Explanation

Seifert, Winfried, Kittler, Martin, Seibt, Michael, Buczkowski, A.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 422 KB

1996

46

Determination of Subgap-Asorption in μc-Si:H Films by CPM

Krankenhagen, R., Schmidt, M., Henrion, W., Sieber, Irina, Koynov, S., Grebner, S., Schwarz, R.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 439 KB

1996

47

Tomographic Atom Probe: A New Tool for Nanoscale Characterisation

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 608 KB

english, 1996

48

DRAM Wafer Qualification Issues: Oxide Integrity vs. D-Defects, Oxygen Precipitates and High Temperature Annealing

Park, J.G., Rozgonyi, George A.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 1.60 MB

english, 1996

49

Iron Group Impurities in Semiconducting Iron Disilicide

Irmscher, K., Gelhoff, W., Tomm, Y., Lange, H.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 419 KB

1996

50

Building the Electron Superhighway: Back-End Processing and Simulation

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 709 KB

english, 1996

51

Correlation between Dislocations and Electron Transport Properties in Si/SiGe

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 401 KB

english, 1996

52

Trends and Challenges for Advanced Silicon Technologies

Claeys, C., Deferm, L.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 1.16 MB

english, 1996

53

Hydrogen Passivation of Double Donors in Silicon

Martynov, Yu.V., Zevenbergen, I.S., Gregorkiewicz, T., Ammerlaan, C.A.J.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 614 KB

english, 1996

54

Cyclotron Resonance in Heavily Doped Silicon Quantum Wells

Gehlhoff, W., Bagraev, N.T., Klyachkin, L.E.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 486 KB

1996

55

The Effect of Interface Engineering and Wave Function Localisation on Optical Response in Imperfect Type I and Type II Quantum Well Structures

Shaw, M.J., Briddon, Patrick R., Jaros, M.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 411 KB

1996

56

Analysis of Σ=3 and Σ=9 Twin Boundaries in Three-Crystal Silicon Ingots

Castaldini, Antonio, Cavalcoli, Daniela, Cavallini, Anna, Martinelli, G., Palmeri, D., Parisini, A., Sartori, G.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 412 KB

1996

57

Investigation of the Dislocation Motion in the Bulk SiGe Crystals

Iunin, Yu.L., Nikitenko, V.I., Orlov, Valeri I., Abrosimov, N.V., Rossolenko, S.N., Schröder, W.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 370 KB

1996

58

Measurements of Diffusion Length in Si-SiGe Structures

Kononchuk, O.V., Rozgonyi, George A., Yakimov, E.B.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 345 KB

1996

59

PHOTO-EDSR in Plastically Deformed p-Si

Grimmeiss, Hermann G., Omling, P., Shalynin, A.I.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 411 KB

1996

60

Gettering of Au in Heat Treated Si/SiGe/Si Structures

Schmalz, K., Krüger, D., Kurps, R., Morgenstern, T., Zeindl, H.P.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 390 KB

1996

61

Diameter Effects on Grown-In Defects in CZ Crystal Growth

Uberti, F., Hagimoto, K.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 619 KB

english, 1996

62

Diffusion Effects and Luminescence in Thin SiGe/Si Layers

Gail, M, Jung, W., Brunner, J., Schittenhelm, P., Nützel, J.F., Abstreiter, G.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 904 KB

english, 1996

63

Characterisation of High-Energy Proton Irradiation Induced Recombination Centers in Silicon

Kaniava, A., Vanhellemont, Jan, Simoen, Eddy, Claeys, C., Gaubas, Eugenijus

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 388 KB

1996

64

Elastic Relaxation of Pseudomorphic Strain in Quantum Dots

Dietrich, B., Frankenfeldt, H., Tang, Y.S., Sotomayor Torres, Clivia M., Zeindl, H.P., Wolff, A.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 350 KB

1996

65

Silicon Carbide - A Promising Wide-Band-Gap Semiconductor for Electronic Devices

Pensl, Gerhard, Troffer, T.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 749 KB

english, 1996

66

Influence of Point Defects on Defect Formation in Si:Er

Sobolev, N.A., Alexandrov, O.V., Emtsev, Valentin V., Makovijchuk, M.I., Merkulov, A.V., Parshin, E.O., Poloskin, D.S., Shek, E.I.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 500 KB

english, 1996

67

SiC Buried Layer Formation Induced by Ion Implantation

Klyui, N.I., Krüger, D., Romanyuk, B.N., Litovchenko, V.G., Richter, Hans

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 359 KB

1996

68

Point Defects in Semiconductors - Then and Now

Pantelides, Sokrates T.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 667 KB

english, 1996

69

Investigation of the Substrate / Epitaxial Interface of Si/Si1-xGexGrown by LPCVD

Loo, R., Vescan, L., Dieker, C., Freundt, D., Hartmann, A., Mück, A.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 449 KB

1996

70

The Si:Er Crystal: Model and Excitation Mechanism of the Er-O Center

Bagraev, N.T., Onopko, D.E., Ryskin, Alexandr I.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 399 KB

1996

71

Copper Precipitation in Monocrystalline Silicon: Role of Initial Oxygen Concentration and Thermal Oxidation

Correia, A., Boutry-Forveille, A., Ballutaud, D.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 684 KB

1996

72

A Study of Defects Generated by BF2+ Implantation in Silicon Crystals and Their Annealing

Lal, K., Bhagavannarayana, G., Virdi, G.S.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 487 KB

1996

73

Expected Limits for Manufacturing Very Large Silicon Wafers

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 911 KB

english, 1996

74

Electrical Activity of Misfit Dislocations in GaAsSb/GaAs Heterojunctions

Wosiński, T., Makosa, A., Raczynska, J.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 407 KB

1996