books search
books
articles search
articles
Donate
Log In
Log In
to access more features
personal recommendations
Telegram Bot
download history
send to Email or Kindle
manage booklists
save to favorites
Personal
Book Requests
Explore
Journals
Contribution
Donate
Litera Library
Donate paper books
Add paper books
Open LITERA Point
Volume 42; Issue 6
Main
Solid-State Electronics
Volume 42; Issue 6
Solid-State Electronics
Volume 42; Issue 6
1
A simple approach to the capacitance technique for determination of interface state density of a metal–semiconductor contact
Santosh Pandey
,
S. Kal
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 226 KB
Your tags:
english, 1998
2
Explicit formulation of a series resistance correction procedure for MOSFET parameter extraction and its accuracy analysis
G.F Niu
,
J.D Cressler
,
S.J Mathew
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 107 KB
Your tags:
english, 1998
3
Interconnection capacitance models for VLSI circuits
Shyh-Chyi Wong
,
Patrick S. Liu
,
Jien-Wen Ru
,
Shi-Tron Lin
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 660 KB
Your tags:
english, 1998
4
Manufacture of AlGaInP visible light-emitting diodes by MOCVD & VPE
Zeng Qingke
,
Zeng Xianfu
,
Liao Changjun
,
Liu Songhao
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 145 KB
Your tags:
english, 1998
5
Modeling gate leakage current in nMOS structures due to tunneling through an ultra-thin oxide
Wei-Kai Shih
,
Everett X. Wang
,
Srinivas Jallepalli
,
Francisco Leon
,
Christine M. Maziar
,
Al F. Tasch Jr.
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 536 KB
Your tags:
english, 1998
6
Effects of screening on the two-dimensional electron transport properties in modulation doped heterostructures
O. Sen
,
C. Besikci
,
B. Tanatar
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 376 KB
Your tags:
english, 1998
7
Dielectric relaxation of amorphous and textured MIS-capacitor thin films
Floirán Fernández-Gutiérrez
,
O Sánchez Garrido
,
M Hernández-Vélez
,
R.M Bueno
,
J.M Martı́nez-Duart
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 247 KB
Your tags:
english, 1998
8
Influence of external bias on photoelectric properties of silicon MIS/IL structures
V.Yu. Yerokhov
,
I.I. Melnyk
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 459 KB
Your tags:
english, 1998
9
Electrical characterization of anodically grown native oxide on GaInSb
H.X Yuan
,
D Grubisic
,
T.T.S Wong
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 381 KB
Your tags:
english, 1998
10
Low-frequency 1/f noise model for short-channel LDD MOSFETs
Sheng-Lyang Jang
,
Heng-Kuen Chen
,
Man-Chun Hu
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 443 KB
Your tags:
english, 1998
11
Plasma charging damage during over-etch time of aluminum
Hyungcheol Shin
,
Geunsook Park
,
Chenming Hu
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 209 KB
Your tags:
english, 1998
12
On the anomalous behavior of the relative amplitude of RTS noise
L.K.J. Vandamme
,
D. Sodini
,
Z. Gingl
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 215 KB
Your tags:
english, 1998
13
Impact of energy band-gap grading on responsivity of an AlxGa1−xN ultraviolet p–n detector
M.J. Malachowski
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 196 KB
Your tags:
english, 1998
14
Improved reliability of NO treated NH3-nitrided oxide with regard to O2 annealing
M.K Mazumder
,
A Teramoto
,
M Sekine
,
S Kawazu
,
H Koyama
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 354 KB
Your tags:
english, 1998
15
Single contact electron beam induced currents (SCEBIC) in semiconductor junctions. Part I: Quantitative verification of SCEBIC model
S. Kolachina
,
J.C.H. Phang
,
D.S.H. Chan
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 307 KB
Your tags:
english, 1998
16
Performance of a p-channel heterojunction fet with p+-GaAs selectively grown contact layers for GaAs complementary ICs
Naoki Furuhata
,
Masahiro Fujii
,
Shuji Asai
,
Tadashi Maeda
,
Yasuo Ohno
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 1.01 MB
Your tags:
english, 1998
17
Multiple-cell square-type layout design for output transistors in submicron CMOS technology to save silicon area
Ming-Dou Ker
,
Chung-Yu Wu
,
Chien-Chang Huang
,
Tung-Yang Chen
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 1.28 MB
Your tags:
english, 1998
18
The small signal AC impedance of a short p–n junction diode
G. Garcia-Belmonte
,
J. Bisquert
,
V. Caselles
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 176 KB
Your tags:
english, 1998
19
IMPATT oscillations in fast recovery diodes due to temporarily charged radiation-induced deep levels
J. Lutz
,
W. Südkamp
,
W. Gerlach
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 381 KB
Your tags:
english, 1998
20
Threshold voltage and charge control considerations in double quantum wellSi/Si1−xGex p-type MOSFETs
M.Y.A. Yousif
,
O. Nur
,
O. Chretien
,
Y. Fu
,
M. Willander
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 316 KB
Your tags:
english, 1998
21
Device degradation during low temperature ECR-CVD. Part I: GaAs MESFETs
J.W. Lee
,
K.D. MacKenzie
,
D. Johnson
,
R.J. Shul
,
S.J. Pearton
,
C.R. Abernathy
,
F. Ren
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 485 KB
Your tags:
english, 1998
22
Device degradation during low temperature ECR-CVD. Part II: GaAs/AlGaAs HBTs
J.W. Lee
,
K.D. MacKenzie
,
D. Johnson
,
R.J. Shul
,
S.J. Pearton
,
C.R. Abernathy
,
F. Ren
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 360 KB
Your tags:
english, 1998
23
Low temperature ECR-CVD of SiNX for III-V device passivation
J.W Lee
,
K MacKenzie
,
D Johnson
,
R.J Shul
,
S.J Pearton
,
F Ren
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 220 KB
Your tags:
english, 1998
24
Schottky barrier heights of In0.5(AlxGa1−x)0.5P (0≤x≤1) lattice matched to GaAs
Y.C Wang
,
J.M Kuo
,
F Ren
,
J.R Lothian
,
W.E Mayo
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 337 KB
Your tags:
english, 1998
25
High frequency CV measurements of SiC MOS capacitors
S Berberich
,
P Godignon
,
M.L Locatelli
,
J Millán
,
H.L Hartnagel
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 309 KB
Your tags:
english, 1998
26
Polarization control in vertical-cavity surface emitting laser using uniaxial stress
Achyut Kumar Dutta
,
Kenichi Kasahara
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 281 KB
Your tags:
english, 1998
27
InSb infrared p–i–n photodetectors grown on GaAs coated Si substrates by molecular beam epitaxy
Ahmet Tevke
,
Cengiz Besikci
,
Chris Van Hoof
,
G. Borghs
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 394 KB
Your tags:
english, 1998
28
An optical technique to measure the bulk lifetime and the surface recombination velocity in silicon samples based on a laser diode probe system
A Cutolo
,
S Daliento
,
A Sanseverino
,
G.F Vitale
,
L Zeni
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 183 KB
Your tags:
english, 1998
29
Device degradation during low temperature ECR-CVD. PART III: GaAs/InGaP HEMTs
J.W Lee
,
K.D MacKenzie
,
D Johnson
,
R.J Shul
,
S.J Pearton
,
C.R Abernathy
,
F Ren
Journal:
Solid-State Electronics
Year:
1998
Language:
english
File:
PDF, 285 KB
Your tags:
english, 1998
1
Follow
this link
or find "@BotFather" bot on Telegram
2
Send /newbot command
3
Specify a name for your chatbot
4
Choose a username for the bot
5
Copy an entire last message from BotFather and paste it here
×
×