Volume 46; Issue 5

Solid-State Electronics

Volume 46; Issue 5
1

Analysis of the diode characteristics using the thermodynamic theories

Year:
2002
Language:
english
File:
PDF, 126 KB
english, 2002
4

Current–voltage characteristics of an integrated Schottky diode

Year:
2002
Language:
english
File:
PDF, 167 KB
english, 2002
5

DC and microwave performance of recessed-gate GaN MESFETs using ICP-RIE

Year:
2002
Language:
english
File:
PDF, 115 KB
english, 2002
10

Substrate-triggered ESD clamp devices for use in power-rail ESD clamp circuits

Year:
2002
Language:
english
File:
PDF, 890 KB
english, 2002
11

The effects of scaling on the performance of small-signal MOS amplifiers

Year:
2002
Language:
english
File:
PDF, 264 KB
english, 2002
13

Bulk-limited conduction of Ge-implanted thermally grown SiO2 layers

Year:
2002
Language:
english
File:
PDF, 142 KB
english, 2002
15

Morphological study of the Al–Ti ohmic contact to p-type SiC

Year:
2002
Language:
english
File:
PDF, 295 KB
english, 2002
23

De-embedding length-dependent edge-leakage current in shallow trench isolation submicron MOSFETs

Year:
2002
Language:
english
File:
PDF, 115 KB
english, 2002
24

A model for exciton formation in organic electroluminescent devices

Year:
2002
Language:
english
File:
PDF, 121 KB
english, 2002