Volume 50; Issue 2

Solid-State Electronics

Volume 50; Issue 2
6

Hole confinement at Si/SiGe heterojunction of strained-Si N and PMOS devices

Year:
2006
Language:
english
File:
PDF, 137 KB
english, 2006
16

Measurement of generation parameters on Ru/HfO2/Si MOS capacitor

Year:
2006
Language:
english
File:
PDF, 157 KB
english, 2006
17

Benchmark tests on surface potential based charge-sheet models

Year:
2006
Language:
english
File:
PDF, 189 KB
english, 2006
22

Electrical characteristics of GaAs nanocrystalline thin film

Year:
2006
Language:
english
File:
PDF, 365 KB
english, 2006
28

Electrostatic coupling between nanocrystals in a quantum flash memory

Year:
2006
Language:
english
File:
PDF, 138 KB
english, 2006
29

IFC - Editorial Board

Year:
2006
Language:
english
File:
PDF, 81 KB
english, 2006
35

Comments on “Modeling MOSFET surface capacitance behavior under non-equilibrium”

Year:
2006
Language:
english
File:
PDF, 145 KB
english, 2006
36

Dose radiation effects in FinFETs

Year:
2006
Language:
english
File:
PDF, 272 KB
english, 2006