Volume 36; Issue 1

Surface and Interface Analysis

Volume 36; Issue 1

1

Surface segregation of silicon impurities in organic materials

M. A. Reijme, A. W. Denier van der Gon, M. Draxler, A. Gildenpfennig, F. J. J. Janssen, H. H. Brongersma

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 254 KB

english, 2004

2

XPS depth profile study of porous zirconia films deposited on stainless steel by spray pyrolysis: the problem of substrate corrosion

F. Martin, M. C. Lopez, P. Carrera, J. R. Ramos-Barrado, D. Leinen

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 641 KB

english, 2004

3

XPS depth profile analysis of non-stoichiometric NiO films

S. Oswald, W. Brückner

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 148 KB

english, 2004

4

Comparative thickness measurements of SiO2/Si films for thicknesses less than 10 nm

T. Jach, J. A. Dura, N. V. Nguyen, J. Swider, G. Cappello, C. Richter

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 246 KB

english, 2004

5

Characterization of chromate conversion coating on AA7075-T6 aluminum alloy

Qingjiang Meng, G. S. Frankel

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 758 KB

english, 2004

6

Structure of 4-biphenylthiolate on Au nanoparticle surfaces studied by UV-Vis absorption spectroscopy, transmission electron microscopy and surface-enhanced Raman scattering

Soonmin Jang, Sung II Kim, Seokmin Shin, Sang-Woo Joo

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 218 KB

english, 2004

7

Introduction to wavelet applications in surface spectroscopies

Catherine Charles, Gervais Leclerc, Jean-Jacques Pireaux, Jean-Paul Rasson

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 400 KB

english, 2004

8

HREELS signal processing via wavelets

Catherine Charles, Gervais Leclerc, Jean-Paul Rasson, Jean-Jacques Pireaux

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 359 KB

english, 2004

9

Noise filtering and deconvolution of XPS data by wavelets and Fourier transform

Catherine Charles, Gervais Leclerc, Pierre Louette, Jean-Paul Rasson, Jean-Jacques Pireaux

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 326 KB

english, 2004

10

Correlation between hydroxyl fraction and O/Al atomic ratio as determined from XPS spectra of aluminium oxide layers

J. van den Brand, W. G. Sloof, H. Terryn, J. H. W. de Wit

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 177 KB

english, 2004

11

Quantitative surface chemical-state microscopy by x-ray photoelectron spectroscopy

J. Walton, N. Fairley

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 189 KB

english, 2004

12

Analysis of highly resolved x-ray photoelectron Cr 2p spectra obtained with a Cr2O3 powder sample prepared with adhesive tape

E. Ünveren, E. Kemnitz, S. Hutton, A. Lippitz, W. E. S. Unger

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 104 KB

english, 2004

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