Volume 40; Issue 13

Surface and Interface Analysis

Volume 40; Issue 13

1

Field enhancement in arrays of copper nanowires investigated by the finite-difference time-domain method

Kitsakorn Locharoenrat, Haruyuki Sano, Goro Mizutani

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 141 KB

english, 2008

2

XPS-depth analysis using C60 ion sputtering of buried interface in plasma-treated ethylene-tetrafluoroethylene-copolymer (ETFE) film

Yuichi Yamamoto, Seiji Higashi, Kiyoshi Yamamoto

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 114 KB

english, 2008

3

Surface and interface structural analysis of VOX/TiO2 (110) by X-ray photoelectron diffraction

Shinya Miyasaka, Kentaro Amano, Masashi Nojima, Masanori Owari, Yoshimasa Nihei

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 242 KB

english, 2008

4

Orientation-dependent surface composition of in situ annealed strontium titanate

Luiz F. Zagonel, Nicholas Barrett, Olivier Renault, Aude Bailly, Michael Bäurer, Michael Hoffmann, Shao-Ju Shih, David Cockayne

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 194 KB

english, 2008

5

Gray-body approximation to continuous X-ray spectra from scanning electron microscope

Takeshi Tanigaki, Jun Kawai

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 105 KB

english, 2008

6

Metrological evaluation of signal formation in CD-SEM—a quantitative computer simulation

Takeshi Iyasu, Yoshihide Kimura, Norimichi Anazawa, Ryuichi Shimizu

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 135 KB

english, 2008

7

Thermal evolution of Co islands on Ag/Si(111)-√3 × √3 and Ag/Ge(111)-√3 × √3 surfaces

Sung-Lin Tsay, Chang-Yu Kuo, Chun-Liang Lin, Wen-Chen Chen, Tsu-Yi Fu

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 449 KB

english, 2008

8

Disordered state of adsorbed hydrogens on Ni(111) surface studied by slow-positron beam

S. Komagata, K. Hirota, S. Arii, I. Kanazawa, K. Fukutani, K. Nozawa, F. Komori

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 127 KB

english, 2008

9

X-ray photoelectron spectroscopic analysis of HfSiON thin films

Lulu Zhang, Shin-ya Terauchi, Yasushi Azuma, Toshiyuki Fujimoto

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 143 KB

english, 2008

10

Atomic-level characterization of materials with core- and valence-level photoemission: basic phenomena and future directions

Charles S. Fadley

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 2.38 MB

english, 2008

11

Stress of needle specimen on the three-dimensional atom probe (3DAP)

N. Mayama, C. Yamashita, T. Kaito, M. Nojima, M. Owari

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 100 KB

english, 2008

12

Study on imidazolium-based ionic liquids with scanning atom probe and Knudsen effusion mass spectrometry

A. Tolstogouzov, U. Bardi, O. Nishikawa, M. Taniguchi

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 143 KB

english, 2008

13

Magnetization-induced optical second harmonic generation from the surface of Co-doped rutile TiO2(110)

R. Watanabe, M. Yuasa, Y. Yahata, G. Mizutani, T. Suzuki, Y. Segawa, Y. Matsumoto, Y. Yamamoto, H. Koinuma

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 106 KB

english, 2008

14

Newly developed high spatial resolution X-ray microscope equipped with carbon nanotube field emission cathode

Ryosuke Yabushita, Koichi Hata

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 309 KB

english, 2008

15

Behaviors of single CO2molecule on pentagon at carbon nanotube tip observed by field emission microscopy

Yoshiki Kishimoto, Koichi Hata

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 231 KB

english, 2008

16

Spin polarization of field-emitted electrons from ferromagnetic half-metallic Heusler alloy Co2MnSi

Shigekazu Nagai, Yuji Fujiwara, Koichi Hata

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 154 KB

english, 2008

17

Wavelength dispersive X-ray spectroscopy of thick and thin samples for electron microscopes

Miyoko Tanaka, Masaki Takeguchi, Kazuo Furuya

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 242 KB

english, 2008

18

Holographic imaging of TiO2 (110) surface structure by differential photoelectron holography

A. Suzuki, A. Hashimoto, M. Nojima, M. Owari, Y. Nihei

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 155 KB

english, 2008

19

Development of preset-type sample stage in three-dimensional atom probe

S. Ito, T. Kaneko, C. Yamashita, T. Kaito, T. Adachi, T. Iwata, N. Mayama, M. Nojima, M. Taniguchi, M. Owari

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 262 KB

english, 2008

20

Dynamics of spin exchange in alkali atom-surface scattering

Eiji Hirose, Eiko Torikai

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 104 KB

english, 2008

21

Molecular-level etching by electrospray droplet impact

Yuji Sakai, Yoshitoki Iijima, Kunihiko Mori, Kenzo Hiraoka

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 202 KB

english, 2008

22

First observation of dynamic shape changes of a gold nanoparticle catalyst under reaction gas environment by transmission electron microscopy

Kouta Ueda, Tadahiro Kawasaki, Hitoshi Hasegawa, Takayoshi Tanji, Mikio Ichihashi

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 130 KB

english, 2008

23

Simple method of surface characterization by X-ray scattering at small glancing angle of incidence using a compact UHV X-ray diffractometer

Yoshikazu Fujii, Takenori Nakayama

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 91 KB

english, 2008

24

The growth of thin NiO films on Ag(001) studied by scanning tunneling microscopy and spectroscopy

Stephan Großer, Christian Hagendorf, Henning Neddermeyer, Wolf Widdra

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 325 KB

english, 2008

25

Aberration analysis of Cs-corrector system with twin hexapoles and transfer lens doublet in scanning transmission electron microscope by simple ray tracing based on geometrical optics

Tadahiro Kawasaki, Mikio Ichihashi, Takaomi Matsutani, Yoshihide Kimura, Takashi Ikuta

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 155 KB

english, 2008

26

Differential photoelectron holography of Cu(100) surface using laboratory-level X-ray sources

A. Hashimoto, A. Suzuki, Y. Kisaka, S. Miyasaka, M. Nojima, M. Owari, Y. Nihei

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 196 KB

english, 2008

27

Study on dynamics of surface structure by rapid and time-resolved X-ray photoelectron diffraction

Y. Kisaka, A. Hashimoto, A. Suzuki, S. Miyasaka, M. Nojima, M. Owari, Y. Nihei

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 226 KB

english, 2008

28

Local characterizations of quaternary AlInGaN/GaN heterostructures using TEM and HAADF-STEM

Hanako Okuno, Masaki Takeguchi, Kazutaka Mitsuishi, Yoshihiro Irokawa, Yoshiki Sakuma, Kazuo Furuya

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 189 KB

english, 2008

29

Forbidden reflection based dark field transmission electron microscopy for the evaluation of local lattice distortion in epitaxial thin films

S. Takeno, M. Koike, H. Tanaka, T. Kinno, M. Tomita, F. Uesugi

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 260 KB

english, 2008

30

Evaluation of the instrument for three-dimensional atom probe (3DAP)

T. Kaneko, S. Ito, C. Yamashita, N. Mayama, T. Iwata, M. Nojima, M. Taniguchi, M. Owari

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 155 KB

english, 2008

31

Measurement of precision for developing automatic transmission electron microscope

Misa Hayashida, Yoshihide Kimura, Yoshizo Takai

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 219 KB

english, 2008

32

Analysis of x-ray irradiation effect in high-k gate dielectrics by time-dependent photoemission spectroscopy using synchrotron radiation

T. Tanimura, S. Toyoda, H. Kumigashira, M. Oshima, K. Ikeda, G. L. Liu, Z. Liu, K. Usuda

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 181 KB

english, 2008

33

Surface plasmon sensor for NO2 gas

A. B. El-Basaty, T. A. El-Brolossy, S. Abdalla, S. Negm, R. A. Abdella, H. Talaat

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 211 KB

english, 2008

34

Oxide-mediated formation of α-FeSi2 on Si(001) studied by X-ray adsorption near edge structure analysis using SPELEEM

Fumihiko Maeda, Hiroki Hibino, Satoru Suzuki, Fang Zhun Guo

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 268 KB

english, 2008

35

Improvement of porous structure of sintered highly porous aluminum materials by surface modification of aluminum particles with tin

T. Sonoda, K. Katou, T. Asahina, T. Banno, Y. Yamada

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 447 KB

english, 2008

36

Application of experimentally determined inelastic mean free path and surface excitation parameter in Ni to Monte Carlo simulation of reflection electron energy loss spectrum

T. Nagatomi, K. Goto

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 159 KB

english, 2008

37

Optically monitored wet-chemical preparation of SEIRA active Au nanostructures

Dominik Enders, Tadaaki Nagao, Tomonobu Nakayama, Masakazu Aono

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 210 KB

english, 2008

38

Mapping of chemical bonding states of Ag/Si(111) with synchrotron radiation photo emission electron microscopy

M. Hashimoto, F.-Z. Guo, M. Suzuki, M. Ueda, Y. Matsuoka, T. Kinoshita, K. Kobayashi, S. Shin, M. Oura, T. Takeuchi, Y. Saito, T. Matsushita, T. Yasue, T. Koshikawa

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 200 KB

english, 2008

39

Auger spectral shape analysis of Sc-O/W(100) system during phase transition at high temperature

Y. Nakanishi, T. Nagatomi, Y. Takai

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 151 KB

english, 2008

40

Chemical-state-resolved in-depth profiles of gate-stack structures on Si studied by angular-dependent photoemission spectroscopy

S. Toyoda, J. Okabayashi, M. Oshima, G. L. Liu, Z. Liu, K. Ikeda, K. Usuda

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 206 KB

english, 2008

41

HAADF-STEM observation of Au nanoparticles on TiO2

T. Akita, K. Tanaka, M. Kohyama, M. Haruta

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 237 KB

english, 2008

42

Preface

Takanori Koshikawa

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 189 KB

english, 2008

43

Wavefunctional analysis of electron transfers in 2D nanostructures under external fields

Mitsuyoshi Tomiya, Shoichi Sakamoto, Hanako Kusumoto, Masaki Nishikawa

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 225 KB

english, 2008

44

Characterization of atomic-level plasmonic structures by low-energy EELS

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 335 KB

english, 2008

45

Real-time XAFS analysis of Rh/alumina catalyst

Kazuhiko Dohmae, Yasutaka Nagai, Toshitaka Tanabe, Akane Suzuki, Yasuhiro Inada, Masaharu Nomura

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 434 KB

english, 2008

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