Volume 115; Issue none

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Ultramicroscopy
Volume 115; Issue none

Ultramicroscopy

Volume 115; Issue none

1

Measurement of shear strength for HOPG with scanning tunneling microscopy by thermal excitation method

X.D. Ding, Y.Z. Wang, X.M. Xiong, X.S. Du, J.X. Zhang

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 861 KB

english, 2012

2

Erratum to “Carbon nanotubes: A promising standard for quantitative evaluation of AFM tip apex geometry”

You Wang, Xinyong Chen

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 87 KB

english, 2012

3

A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM

S.M. Schramm, A.B. Pang, M.S. Altman, R.M. Tromp

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 2.23 MB

english, 2012

4

Effect of the tip-sample contact force on the nanostructure size fabricated by local oxidation nanolithography

Kexiang Hu, Sen Wu, Maomao Huang, Xiaodong Hu, Qingkang Wang

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 1.39 MB

english, 2012

5

Sub-nanometer free electrons with topological charge

P. Schattschneider, M. Stöger-Pollach, S. Löffler, A. Steiger-Thirsfeld, J. Hell, J. Verbeeck

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 396 KB

english, 2012

6

A new linear transfer theory and characterization method for image detectors. Part II: Experiment

Axel Lubk, Falk Röder, Tore Niermann, Christophe Gatel, Sebastien Joulie, Florent Houdellier, César Magén, Martin J. Hÿtch

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 896 KB

english, 2012

7

A new linear transfer theory and characterization method for image detectors. Part I: Theory

Tore Niermann, Axel Lubk, Falk Röder

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 594 KB

english, 2012

8

Structure projection reconstruction from through-focus series of high-resolution transmission electron microscopy images

Wei Wan, Sven Hovmöller, Xiaodong Zou

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 2.07 MB

english, 2012

9

Optimization of Q-factor of AFM cantilevers using genetic algorithms

Angel Perez-Cruz, Aurelio Dominguez-Gonzalez, Ion Stiharu, Roque A. Osornio-Rios

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 645 KB

english, 2012

10

Discrete tomography of demanding samples based on a modified SIRT algorithm

Andreas Zürner, Markus Döblinger, Valentina Cauda, Ruoshan Wei, Thomas Bein

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 1.92 MB

english, 2012

11

Limitations on accurate shape determination using amplitude modulation atomic force microscopy

B.J. Eves, R.G. Green

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 733 KB

english, 2012

12

Estimation of the electron beam-induced specimen heating and the emitted X-rays spatial resolution by Kossel microdiffraction in a scanning electron microscope

Denis Bouscaud, Raphaël Pesci, Sophie Berveiller, Etienne Patoor

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 1.31 MB

english, 2012

13

Simultaneous and independent adaptive correction of spherical and chromatic aberration using an electron mirror and lens combination

J.P.S. Fitzgerald, R.C. Word, R. Könenkamp

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 782 KB

english, 2012

14

Micromagnetic study of flux-closure states in Fe dots using quantitative Lorentz microscopy

Aurélien Masseboeuf, Olivier Fruchart, Fabien Cheynis, Nicolas Rougemaille, Jean-Christophe Toussaint, Alain Marty, Pascale Bayle-Guillemaud

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 1.64 MB

english, 2012

15

Hybrid computing: CPU+GPU co-processing and its application to tomographic reconstruction

J.I. Agulleiro, F. Vázquez, E.M. Garzón, J.J. Fernández

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 503 KB

english, 2012

16

IFC (Editorial Board)

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 78 KB

english, 2012