Volume 16; Issue 4

IEEE Design & Test of Computers

Volume 16; Issue 4
1

Evaluation of MEMS capacitive accelerometers

Beliveau, A., Spencer, G.T., Thomas, K.A., Roberson, S.L.
Journal:
IEEE Design & Test of Computers
Year:
1999
Language:
english
File:
PDF, 680 KB
english, 1999
3

Deep submicron cmos current ic testing: is there a future

Hawkins, C.F.
Journal:
IEEE Design & Test of Computers
Year:
1999
Language:
english
File:
PDF, 122 KB
english, 1999
4

Sailing on a sea of processors

Davidson, S.
Journal:
IEEE Design & Test of Computers
Year:
1999
Language:
english
File:
PDF, 93 KB
english, 1999
5

A design flow for micromachined electromechanical systems

Swart, N.R.
Journal:
IEEE Design & Test of Computers
Year:
1999
Language:
english
File:
PDF, 697 KB
english, 1999
6

Analog DFT using an undersampling technique

Mason, R., Ma, S.
Journal:
IEEE Design & Test of Computers
Year:
1999
Language:
english
File:
PDF, 337 KB
english, 1999
7

Test and reliability: partners in IC manufacturing. 2

Hawkins, C.F., Segura, J., Soden, J., Dellin, T.
Journal:
IEEE Design & Test of Computers
Year:
1999
Language:
english
File:
PDF, 552 KB
english, 1999
8

Hierarchical design and test of integrated microsystems

Mukherjee, T., Fedder, G.K., Blanton, R.D.
Journal:
IEEE Design & Test of Computers
Year:
1999
Language:
english
File:
PDF, 701 KB
english, 1999
9

Protected shared variables in VHDL: IEEE standard 1076a

Ashenden, P.J., Wilsey, P.A.
Journal:
IEEE Design & Test of Computers
Year:
1999
Language:
english
File:
PDF, 630 KB
english, 1999
10

Technology for IP reuse and portability

Thomas, T.
Journal:
IEEE Design & Test of Computers
Year:
1999
Language:
english
File:
PDF, 535 KB
english, 1999
11

On the integration of design and test for chips embedding MEMS

Mir, S., Charlot, B.
Journal:
IEEE Design & Test of Computers
Year:
1999
Language:
english
File:
PDF, 854 KB
english, 1999