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Volume 15; Issue 11
Main
IEEE Electron Device Letters
Volume 15; Issue 11
IEEE Electron Device Letters
Volume 15; Issue 11
1
The MGBT: a new MOS-gated power bipolar transistor
Ajit, J.S.
,
Kinzer, D.M.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 236 KB
Your tags:
english, 1994
2
550 V, N-channel emitter switched thyristors with an atomic-lattice-layout (ALL) geometry
Bhalla, A.
,
Chow, T.P.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 250 KB
Your tags:
english, 1994
3
Scaling-parameter-dependent model for subthreshold swing S in double-gate SOI MOSFET's
Tosaka, Y.
,
Suzuki, K.
,
Sugii, T.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 180 KB
Your tags:
english, 1994
4
0.10 /spl mu/m graded InGaAs channel InP HEMT with 305 GHz f/sub T/ and 340 GHz f/sub max/
M. Wojtowicz
,
R. Lai
,
D. Streit
,
G. Ng
,
T. Block
,
K. Tan
,
P. Liu
,
A. Freudenthal
,
R. Dia
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 255 KB
Your tags:
english, 1994
5
An epitaxial emitter-cap SiGe-base bipolar technology optimized for liquid-nitrogen temperature operation
J. Cressler
,
E. Crabbe
,
J. Comfort
,
J. Sun
,
J. Stork
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 295 KB
Your tags:
english, 1994
6
Effect of low and high temperature anneal on process-induced damage of gate oxide
King, J.C.
,
Chenming Hu,
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 217 KB
Your tags:
english, 1994
7
Effects of surface preparation on the electrical and reliability properties of ultrathin thermal oxide
Kafai Lai,
,
Ming-yin Hao,
,
Wei-ming Chen,
,
Lee, J.C.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 285 KB
Your tags:
english, 1994
8
Breakdown characteristics of RTO 10 nm SiO/sub 2/ films grown at different temperatures
Fonseca, L.
,
Campabadal, F.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 280 KB
Your tags:
english, 1994
9
Superthin O/N/O stacked dielectrics formed by oxidizing thin nitrides in low pressure oxygen for high-density memory devices
Su, H.P.
,
Liu, H.W.
,
Hong, G.
,
Cheng, H.C.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 236 KB
Your tags:
english, 1994
10
Monolithic NMOS digital integrated circuits in 6H-SiC
Xie, W.
,
Cooper, J.A.
,
Melloch, M.R.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 265 KB
Your tags:
english, 1994
11
Hot-carrier-induced off-state current leakage in submicrometer PMOSFET devices
Hao Fang,
,
Peng Fang,
,
Yue, J.T.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 245 KB
Your tags:
english, 1994
12
An efficient method for plasma-charging damage measurement
Cheung, K.P.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 245 KB
Your tags:
english, 1994
13
Anomalous reverse short-channel effect in p/sup +/ polysilicon gated P-channel MOSFET
Chun-Yen Chang,
,
Chih-Yung Lin,
,
Jih Wen Chou,
,
Hsu, C.C.-H.
,
Hong-Tsz Pan,
,
Ko, J.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 259 KB
Your tags:
english, 1994
14
A CMOS compatible lateral emitter switched thyristor with enhanced turn-on capability
Chen, W.
,
Amaratunga, G.A.J.
,
Narayanan, E.M.S.
,
Humphrey, J.
,
Evans, A.G.R.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 278 KB
Your tags:
english, 1994
15
Dramatic increases in latchup holding voltage for sub-0.5 /spl mu/m CMOS using shallow S/D junctions
Lutze, J.
,
Venkatesan, S.
,
Poon, S.
Journal:
IEEE Electron Device Letters
Year:
1994
Language:
english
File:
PDF, 249 KB
Your tags:
english, 1994
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