IEEE Electron Device Letters

1

A Sub-Critical Barrier Thickness Normally-Off AlGaN/GaN MOS-HEMT

Brown, Raphael, Macfarlane, Douglas, Al-Khalidi, Abdullah, Xu Li,, Ternent, Gary, Haiping Zhou,, Thayne, Iain, Wasige, Edward

Journal:

Year:

2014

Language:

english

File:

PDF, 610 KB

english, 2014

2

A Near-Infrared Range Photodetector Based on Indium Nitride Nanocrystals Obtained Through Laser Ablation

Tekcan, Burak, Alkis, Sabri, Alevli, Mustafa, Dietz, Nikolaus, Ortac, Bulend, Biyikli, Necmi, Okyay, Ali Kemal

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 643 KB

english, 2014

3

On Transport in Vertical Graphene Heterostructures

Zhang, Qin, Fiori, Gianluca, Iannaccone, Giuseppe

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 542 KB

english, 2014

4

Analysis of Stability Degradation of SRAMs Using a Physics-Based PBTI Model

Ho, Chih-Hsiang, Hassan, Mohammad Khaled, Kim, Soo Youn, Roy, Kaushik

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 715 KB

english, 2014

5

The Role of Ti Capping Layer in HfOx-Based RRAM Devices

Fang, Zheng, Wang, Xin Peng, Sohn, Joon, Weng, Bao Bin, Zhang, Zhi Ping, Chen, Zhi Xian, Tang, Yan Zhe, Lo, Guo-Qiang, Provine, J., Wong, Simon S., Wong, H.-S. Philip, Kwong, Dim-Lee

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 780 KB

english, 2014

6

Al2O3-Passivated AlGaN/GaN HEMTs by Using Nonvacuum Ultrasonic Spray Pyrolysis Deposition Technique

Chou, Bo-Yi, Liu, Han-Yin, Hsu, Wei-Chou, Lee, Ching-Sung, Wu, Yu-Sheng, Sun, Wen-Ching, Wei, Sung-Yen, Yu, Sheng-Min

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 642 KB

english, 2014

7

Impact of Electrode Composition and Processing on the Low-Frequency Noise in SrTio3 MIM Capacitors

Giusi, Gino, Aoulaiche, Marc, Swerts, Johan, Popovici, Mihaela, Redolfi, Augusto, Simoen, Eddy, Jurczak, Malgorzata

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 747 KB

english, 2014

8

Investigation on the Impact of Program/Erase Cycling Frequency on Data Retention of Nanoscale Charge Trap Nonvolatile Memory

Meng Chuan Lee,, Hin Yong Wong,

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 676 KB

english, 2014

9

Complementary Resistive Switching in Flexible RRAM Devices

Dai, Ya-Wei, Chen, Lin, Yang, Wen, Sun, Qing-Qing, Zhou, Peng, Wang, Peng-Fei, Ding, Shi-Jin, Zhang, David Wei, Xiao, Fei

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 540 KB

english, 2014

10

Impact of Aluminum Ion Implantation on the Low Frequency Noise Characteristics of Hf-Based High- \(k\) /Metal Gate pMOSFETs

Kao, Tsung-Hsien, Wu, San-Lein, Wu, Chung-Yi, Fang, Yean-Kuen, Wang, Bo-Chin, Huang, Po Chin, Lai, Chien-Ming, Hsu, Chia-Wei, Chen, Yi-Wen, Cheng, Osbert, Chang, Shoou-Jinn

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 747 KB

english, 2014

11

Linear Mode Avalanche Photodiode With High Responsivity Integrated in High-Voltage CMOS

Steindl, Bernhard, Enne, Reinhard, Schidl, Stefan, Zimmermann, Horst

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 1.45 MB

english, 2014

12

Correction for call for papers: IEEE Transactions for Electron Devices “ Variation aware technology and circuit co design”

Journal:

IEEE Electron Device Letters

Year:

2014

File:

PDF, 288 KB

2014

13

Influence of Oxygen Concentration on Self-Compliance RRAM in Indium Oxide Film

Yang, Jyun-Bao, Chang, Ting-Chang, Huang, Jheng-Jie, Chen, Yu-Ting, Tseng, Hsueh-Chih, Chu, Ann-Kuo, Sze, Simon M., Tsai, Ming-Jinn, Zheng, Jin-Cheng, Bao, Ding-Hua

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 1.20 MB

english, 2014

14

A Simplified Method for (Circular) Transmission Line Model Simulation and Ultralow Contact Resistivity Extraction

Hao Yu,, Schaekers, Marc, Schram, Tom, Collaert, Nadine, De Meyer, Kristin, Horiguchi, Naoto, Thean, Aaron, Barla, Kathy

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 1023 KB

english, 2014

15

High Channel Mobility 4H-SiC MOSFETs by Antimony Counter-Doping

Modic, Aaron, Liu, Gang, Ahyi, Ayayi C., Zhou, Yuming, Xu, Pingye, Hamilton, Michael C., Williams, John R., Feldman, Leonard C., Dhar, Sarit

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 481 KB

english, 2014

16

Implications of Rough Dielectric Surfaces on Charging-Adjusted Actuation of RF-MEMS

Palit, Sambit, Xu, Xin, Raman, Arvind, Alam, Muhammad Ashraful

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 940 KB

english, 2014

17

Self-Aligned Bottom-Gate In—Ga—Zn—O Thin-Film Transistor With Source/Drain Regions Formed by Direct Deposition of Fluorinated Silicon Nitride

Jiang, Jingxin, Furuta, Mamoru, Wang, Dapeng

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 631 KB

english, 2014

18

Performance Limits Projection of Black Phosphorous Field-Effect Transistors

Lam, Kai-Tak, Dong, Zhipeng, Guo, Jing

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 661 KB

english, 2014

19

Working Principles of a DRAM Cell Based on Gated-Thyristor Bistability

Mulaosmanovic, Halid, Paolucci, Giovanni M., Compagnoni, Christian Monzio, Castellani, Niccol, Carnevale, Gianpietro, Fantini, Paolo, Ventrice, Domenico, Lacaita, Andrea L., Spinelli, Alessandro S., B

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 673 KB

english, 2014

20

Solid-State Image Sensors

Journal:

IEEE Electron Device Letters

Year:

2014

File:

PDF, 291 KB

2014

21

High-Mobility MOSFETs Fabricated on Continuous, Wafer-Scale Ge Films Epitaxially Grown on Si

Ghosh, Swapnadip, Han, Sang M.

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 824 KB

english, 2014

22

1.5-kV and 2.2-m \(\Omega \) -cm \(^{2}\) Vertical GaN Transistors on Bulk-GaN Substrates

Nie, Hui, Diduck, Quentin, Alvarez, Brian, Edwards, Andrew P., Kayes, Brendan M., Zhang, Ming, Ye, Gangfeng, Prunty, Thomas, Bour, Dave, Kizilyalli, Isik C.

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 782 KB

english, 2014

23

ZnO Nanorod-Based Humidity Sensors With Fast Response

Jung, Soyoun, Ji, Taeksoo

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 764 KB

english, 2014

24

Effects of Sn and Zn Seed Layers on the Electrical Characteristics of Pd/ZnO Thin-Film Schottky Diodes Grown on n-Si Substrates

Somvanshi, Divya, Jit, Satyabrata

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 1.55 MB

english, 2014

25

Interrelation of Sweep and Pulse Analysis of the SET Process in SrTiO3 Resistive Switching Memories

Fleck, Karsten, Bottger, Ulrich, Waser, Rainer, Menzel, Stephan

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 1.13 MB

english, 2014

26

Implementation of Fully Self-Aligned Homojunction Double-Gate a-IGZO TFTs

He, Xin, Wang, Longyan, Xiao, Xiang, Deng, Wei, Zhang, Letao, Chan, Mansun, Zhang, Shengdong

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 880 KB

english, 2014

27

EDS Meetings Calendar

Journal:

IEEE Electron Device Letters

Year:

2014

File:

PDF, 1.20 MB

2014

28

[Blank page - back cover]

Journal:

IEEE Electron Device Letters

Year:

2014

File:

PDF, 5 KB

2014

29