IEEE Electron Device Letters

1

Y-Doped BaTiO 3 as a Charge-Trapping Layer for Nonvolatile Memory Applications

Shi, R. P., Huang, X. D., Sin, Johnny K. O., Lai, P. T.

Journal:

Year:

2016

Language:

english

File:

PDF, 758 KB

english, 2016

2

Flexible In–Ga–Zn–O-Based Circuits With Two and Three Metal Layers: Simulation and Fabrication Study

Cantarella, G., Ishida, K., Petti, L., Munzenrieder, N., Meister, T., Shabanpour, R., Carta, C., Ellinger, F., Troster, G., Salvatore, G. A.

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 1014 KB

english, 2016

3

The Influence of Tensile Stress on Polyaniline as Strain Sensor

Jiang, Jun-Ke, Liang, Qiu-Hua, Meng, Rui-Shen, Yang, Qun, Sun, Xiang, Yang, Dao-Guo, Zhang, Guo-Qi, Chen, Xian-Ping

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 461 KB

english, 2016

4

2016 Index IEEE Electron Device Letters Vol. 37

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 571 KB

english, 2016

5

Editorial Kudos to Our Golden Reviewers

Liu, Tsu-Jae King

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 69 KB

english, 2016

7

Golden List of Reviewers for 2016

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 185 KB

english, 2016

8

EDS Meetings Calendar

Journal:

IEEE Electron Device Letters

Year:

2016

File:

PDF, 2.60 MB

2016

9

Changes to the Editorial Board

Liu, Tsu-Jae King

Journal:

IEEE Electron Device Letters

Year:

2016

File:

PDF, 68 KB

2016

10

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 141 KB

english, 2016

12

Changes to the Editorial Board

Liu, Tsu-Jae King

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 1.59 MB

english, 2016

13