Volume 32; Issue 6

IEEE Transactions on Nuclear Science

Volume 32; Issue 6

1

Transient Radiation Effects in SOI Memories

Davis, G. E., Hite, L. R., Blake, T. G. W., Chen, C.-E., Lam, H. W., DeMoyer, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 910 KB

english, 1985

2

Techniques of Microprocessor Testing and SEU-Rate Prediction

Koga, R., Kolasinski, W. A., Marra, M. T., Hanna, W. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.36 MB

english, 1985

3

[Front cover]

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

File:

PDF, 66 KB

1985

4

IEEE Transactions on Nuclear Science

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 298 KB

english, 1985

5

Table of contents

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 697 KB

english, 1985

6

Summary of 1985 IEEE Annual Conference on Nuclear and Space Radiation Effects

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 362 KB

english, 1985

7

1985 Conference Committee

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 129 KB

english, 1985

8

Seen in Monterey

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

File:

PDF, 2.65 MB

1985

9

IEEE Nuclear and Space Radiation Effects Conference Short Course

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 220 KB

english, 1985

10

Editorial Comments

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 174 KB

english, 1985

11

IEEE Nuclear and Plasma Sciences Committee Radiation Effects Committee Steering Group

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 174 KB

english, 1985

12

Reviewers for This Issue

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 164 KB

english, 1985

13

Outstanding Conference Paper Award 1985 Ieee Nuclear and Space Radiation Effects Conference

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 2.10 MB

english, 1985

14

Distinguished Poster Paper Award

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1015 KB

english, 1985

15

Nominees for 1985 Best Paper Awards

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1015 KB

english, 1985

16

In Memoriam

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 172 KB

english, 1985

17

The Time Dependence of Interface State Production

Brown, Dennis B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 802 KB

english, 1985

18

Process Dependent Build-Up of Interface States in Irradiated N-Channel MOSFETs

Sabnis, Anant G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.15 MB

english, 1985

19

Bias Annealing of Radiation and Bias Induced Positive Charges in N- and P-Type MOS Capacitors

Suzuki, Kazumichi, Sakagami, Masaharu, Nishimura, Eiichi, Watanabe, Kikuo

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 711 KB

english, 1985

20

Hole Removal in Thin-Gate MOSFETs by Tunneling

Benedetto, J. M., Boesch, H. E., McLean, F. B., Mize, J. P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 936 KB

english, 1985

21

Activation Energies of Oxide Charge Recovery in SOS or SOI Structures after an Ionizing Pulse

Leray, Jean-Luc

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.44 MB

english, 1985

22

Radiation-Induced Hole Trapping and Interface State Characteristics of Al-Gate and Poly-Si Gate MOS Capacitors

Shanfield, Z., Moriwaki, M. M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.03 MB

english, 1985

23

Correlation of Hot-Carrier and Radiation Effects in MOS Transistors

McBrayer, J. D., Fleetwood, D. M., Pastorek, R. A., Jones, R. V.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 932 KB

english, 1985

24

Hole Transport and Trapping in Field Oxides

Boesch, H. Edwin, McLean, F. Barry

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.05 MB

english, 1985

25

Total Dose Indujced Hole Trapping and Interface State Generation in Bipolar Recessed Field Oxides

Pease, R., Emily, D., Boesch, H. E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.34 MB

english, 1985

26

Optimizing and Controlling the Radiation Hardness of a Si-Gate CMOS Process

Winokur, P. S., Errett, E. B., Fleetwood, D. M., Dressendorfer, P. V., Turpin, D. C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.46 MB

english, 1985

27

Neutron Irradiation as a Means of Reducing the Incidence of Radiation Induced Breakdown in a Radiation Hard Power MOSFET

Jobson-Scott, David M., Roper, Graham B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 514 KB

english, 1985

28

A Radiation-Hard Insulator for MOS LSI Device Isolation

Kasama, K., Toyokawa, F., Sakamoto, M., Kobayashi, K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.04 MB

english, 1985

29

Radiation Hardened Silicon Devices Using a Novel Thick Oxide

Watanabe, Kikuo, Kato, Masataka, Okabe, Takahiro, Nagata, Minoru

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 533 KB

english, 1985

30

Correlation of Radiation Effects in Transistors and Integrated Circuits

Sexton, Fred W., Schwank, James R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.09 MB

english, 1985

31

The Effect of Operating Frequency in the Radiation Induced Buildup of Trapped Holes and Interface States in MOS Devices

Stanley, T., Neamen, D., Dressendorfer, P., Schwank, J., Winokur, P., Ackermann, M., Jungling, K., Hawkins, C., Grannemann, W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.11 MB

english, 1985

32

CMOS Scaling Implications for Total Dose Radiation

Schrankler, J. W., Reich, R. K., Holt, M. S., Ju, D. H., Huang, J. S. T., Kirchner, G. D., Hughes, H. L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 532 KB

english, 1985

33

Current Induced Avalanche in Epitaxial Structures

Wrobel, T. F., Coppage, F. N., Hash, G. L., Smith, A. J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 669 KB

english, 1985

34

Therhionic Integrated Circuits: Electronics for Hostile Environments

Lynn, D. K., McCormick, J. B., MacRoberts, M. D. J., Wilde, D. K., Dooley, G. R., Brown, D. R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 3.08 MB

english, 1985

35

Radiation Effects in InP JFETs

Anderson, W. T., Boos, J. B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 2.23 MB

english, 1985

36

Rapid Annealing of Temperature-Compensated, Precision Voltage References Following Fast Neutron Irradiation

Fischer, T. A., Williams, R. J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 686 KB

english, 1985

37

Electron Irradiation of GaAsP LEDs

Dimiduk, Kathryn Conway, Ness, Christian Quarles, Foley, James Kevin

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.05 MB

english, 1985

38

Mechanisms for the Latchup Window Effect in Integrated Circuits

Johnston, A. H., Baze, M. P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.51 MB

english, 1985

39

Analysis of Transient Radiation Upset in a 2K SRAM

Massengill, L. W., Diehl-Nagle, S. E., Wrobel, T. F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 838 KB

english, 1985

40

Radiation-Tolerant High-Performance CMOS VLSI Circuit Design

Hatano, Hiroshi, Doi, Katsuyuki

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 714 KB

english, 1985

41

Hardening of Commercial CMOS PROMS with Polysilicon Fusible Links

Newman, Warren Harding, Rauchfuss, James Edward

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 536 KB

english, 1985

42

GaAs MMIC Technology Radiation Effects

Anderson, W. T., Simons, M., Christou, A., Beall, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 4.20 MB

english, 1985

43

Optoelectronic Data Link Designed for Applications in a Radiation Environment

Wiczer, James J., Barnes, Charles E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 721 KB

english, 1985

44

A Comparison of Conventional Dose Rate and Low Dose Rate Co-60 Testing of Idt Static RAMS and FSC Multiplexers

Schiff, Daniel, Bruun, Jorgen, Montesalvo, Mary, Wong, C.-C. D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 889 KB

english, 1985

45

Nuclear Radiation Response of Intel 64k-Bit and 128k-Bit HMOS Ultraviolet Erasable Programmable Read Only Memories (UVEPROMs)

Rensner, Gary D., Eckhardt, David A., Page, Michael

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 742 KB

english, 1985

46

Radiation Hardness of 256-Bit GaAs C-JFET Ram

Notthoff, J. K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 483 KB

english, 1985

47

Low Flux Laboratory Test of the Internal Discharge Monitor (IDM) Experiment Intended for Crres

Coakley, P. G., Treadaway, M. J., Robinson, P. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.79 MB

english, 1985

48

Thickness Scaling for ARC Discharges on Electron-Beam-Charged Dielectrics

Balmain, K. G., Battagin, A., Dubois, G. R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.07 MB

english, 1985

49

A Surface Discharge Model for Spacecraft Dielectrics

Stettner, R., DeWald, A. B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.45 MB

english, 1985

50

The Role of Unneutralized Surface Ions in Negative Potential Arcing

Jongeward, G. A., Katz, I., Mandell, M. J., Parks, D. E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 638 KB

english, 1985

51

A Model of the Plasma Wake Generated by a Large Object

Katz, I., Parks, D. E., Wright, K. H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 654 KB

english, 1985

52

Plasma Screening of Funnel Fields

Gilbert, R. M., Ovrebo, G. K., Schifano, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.98 MB

english, 1985

53

Characteristics of SEU Current Transients and Collected Charge in GaAs and Si Devices

Shanfield, Z., Moriwaki, M. M., Digby, W. M., Srour, J. R., Campbell, D. E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.14 MB

english, 1985

54

Gate Charge Collection and Induced Drain Current in GaAs FETs

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.47 MB

english, 1985

55

Ion Track Shunt Effects in Multi-Junction Structures

Hauser, J. R., Diehl-Nagle, S. E., Knudson, A. R., Campbell, A. B., Stapor, W. J., Shapiro, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.33 MB

english, 1985

56

Simulation Approach for Modeling Single Event Upsets on Advanced CMOS SRAMS

Johnson, Richard L., Diehl-Nagle, Sherra E., Hauser, John R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.11 MB

english, 1985

57

Charge Collection in CMOS/SOS Structures

Campbell, A. B., Knudson, A. R., Stapor, W. J., Shapiro, P., Diehl-Nagle, S. E., Hauser, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 583 KB

english, 1985

58

Single Event Upset Rate Estimates for a 16-K CMOS SRAM

Browning, John S., Koga, R., Kolasinski, W. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.55 MB

english, 1985

59

Simulation of Charge Collection in a Multilayer Device

Kreskovsky, J. P., Grubin, H. L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 572 KB

english, 1985

60

Comparison of 2D Memory SEU Transport Simulation with Experiments

Fu, J. S., Weaver, H. T., Koga, R., Kolasinski, W. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.44 MB

english, 1985

61

Correlated Proton and Heavy Ion Upset Measurements on IDT Static RAMs

Campbell, A. B., Stapor, W. J., Koga, R., Kolasinski, W. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 307 KB

english, 1985

62

CMOS/SOS High Soft-Error Threshold Memory Cell

Hsueh, Fu-Lung, Napoli, Louis S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 615 KB

english, 1985

63

Single Event Upset Immune Integrated Circuits for Project Galileo

Giddings, Alfred E., Hewlett, Frank W., Treece, R. Keith, Nichols, Donald K., Smith, Lawrence S., Zoutendyk, John A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 898 KB

english, 1985

64

Single-Event Upset (SEU) Model Verification and Threshold Determination Using Heavy Ions in a Bipolar Static RAM

Zoutendyk, J. A., Smith, L. S., Soli, G. A., Thieberger, P., Wegner, H. E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 866 KB

english, 1985

65

A Study of Single Events in GaAs SRAMs

Weatherford, T. R., Hauser, J. R., Diehl-Nagle, S. E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 817 KB

english, 1985

66

Heavy Ion Induced Permanent Damage in MNOS Gate Insulators

Pickel, James C., Blandford, James T., Waskiewicz, A. E., Strahan, V. H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 794 KB

english, 1985

67

Methods for Calculating SEU Rates for Bipolar and NMOS Circuits

McNulty, P. J., Abdel-Kader, W. G., Bisgrove, J. M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 832 KB

english, 1985

68

Amplitude Distribution of Cosmic Ray Events in Extrinsic IR Detectors

Aukerman, L. W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 603 KB

english, 1985

69

Trends in Parts Susceptibility to Single Event Upset from Heavy Ions

Nichols, Donald K., Price, William E., Kolasinski, W. A., Koga, R., Pickel, James C., Blandford, James T., Waskiewicz, A. E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 676 KB

english, 1985

70

Effects of Single Neutron Interactions in Silicon Integrated Circuits

Srour, J. R., Hartmann, R. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.09 MB

english, 1985

71

Meson Interactions in NMOS and CMOS Static RAMs

Dicello, J. F., Schillaci, M. E., McCabe, C. W., Doss, J. D., Paciotti, M., Berardo, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 768 KB

english, 1985

72

SEU Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors

Cusick, J., Koga, R., Kolasinski, W. A., King, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.82 MB

english, 1985

73

Geometric Considerations in Single Event Upset Estimation

Letaw, John R., Silberberg, Rein, Tsao, C. H., Adams, James H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 611 KB

english, 1985

74

Single Event Upset in Combinatorial and Sequential Current Mode Logic

Friedman, Arthur L., Lawton, Bruce, Hotelling, Kenneth R., Pickel, James C., Strahan, Virgil H., Loree, Keith

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 460 KB

english, 1985

75

Software Techniques for Detecting Single-Event Upsets in Satellite Computers

Tront, Joseph G., Armstrong, James R., Oak, Jayawant V.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 698 KB

english, 1985

76

Radiation Hardness Assurance for Electronic Parts: Accomplishments and Plans

Wolicki, E. A., Arimura, I., Carlan, A. J., Eisen, H. A., Halpin, J. J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.41 MB

english, 1985

77

Parameter Extraction from Spaceborne MOSFETs

Buehler, M. G., Moore, B. T., Nixon, R. H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.07 MB

english, 1985

78

Estimating Electronic Parameter End Points for Devices Which Suffer Abrupt Functional Failure during Radiation Testing

Namenson, Arthur I., Arimura, Itsu

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 762 KB

english, 1985

79

Radiation Thresholds for Synthetic Elastomers

Bouquet, Frank L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 688 KB

english, 1985

80

Experimental Methods for Determining Latchup Paths in Integrated Circuits

Johnston, A. H., Baze, M. P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 2.78 MB

english, 1985

81

Radiation Field Results from the Speed Triax Diode, a Large Area, High Dose Rate, Short Pulse 1 MV Bremsstrahlung Source

Hedemann, Mark A., Pregenzer, Arian L., Posey, Larry D., Evans, Donald C., Spence, Phillip W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.43 MB

english, 1985

82

The Chopped X-Ray Source Concept: An Efficient Method for Tree Analysis and Control

Pigneret, Jacques

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.37 MB

english, 1985

83

An Experimental Study of the Effect of Absorbers on the Let of the Fission Particles Emitted by CF-252

Mapper, D., Sanderson, T. K., Stephen, J. H., Farren, J., Adams, L., Harboe-Sorensen, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 828 KB

english, 1985

84

Use of CF-252 to Determine Parameters for SEU Rate Calculation

Blandford, J. T., Pickel, J. C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.62 MB

english, 1985

85

Air Effects on Body Currents and Charging Voltage of an Irradiated Isolated Body

Morrison, Philip J., Miller, Richard, Arion, Douglas

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 736 KB

english, 1985

86

Elementary External SGEMP Model for System Engineering Design

Schmidt, Michael J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 2.07 MB

english, 1985

87

Macroscopic Conductivity Measurements of Ionized Air

Bushell, M., Kenyon, C., Litz, M., Merkel, G., Roberts, H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.04 MB

english, 1985

88

Electron-Ion Recombination in Air at EMP Fields

Chervenak, J. G., van Lint, V. A. J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 552 KB

english, 1985

89

Measurement of the Dielectric Constant of Soil

Snowden, D. P., Morris, G. C., van Lint, V. A. J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 593 KB

english, 1985

90

Aerial and Buried Wires above Stratified Dispersive Media

Williams, John W., Rensner, Gary D., Yu, Jiunn S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.47 MB

english, 1985

91

Excitation of a Canonical RF Shelter with Relativistic Electrons and with Enhanced Risetime Bremsstrahlung

Bushell, M., Graybill, S., Litz, M., Merkel, G., Roberts, H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.78 MB

english, 1985

92

Pulsed Power Burnout Testing of Microwave Diodes

Rudie, N. J., Wilkenfeld, J., Goforth, T., Rutherford, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.38 MB

english, 1985

93

An Infrared Measurement Technique for the Assessment of Electromagnetic Coupling

Sega, Ronald M., Norgard, John D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.30 MB

english, 1985

94

Short-Pulse Microwave Coupling to Apertures in a Conducting Plane

Levy, P. H., Faulkner, J. E., Shaeffer, D. L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.13 MB

english, 1985

95

A Comparison of Theoretical Expressions and Experimental Data for EM Penetration through Small Apertures

Higgins, Daniel F., Wheeler, Ralph, Wenaas, Eric

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 867 KB

english, 1985

96

EMP Isolation Transformer

Wenaas, E. P., Wheeler, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 333 KB

english, 1985

97

Theory and Application of the Voltage Divider Shielded Door Seal for Use in EMP Hardened Communication Facilities

Merewether, David E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 469 KB

english, 1985

98

Frequency Tuneable Ring Wave Pulser

Hewison, Charles M., Mancuso, Vincent

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 278 KB

english, 1985

99

Experimental Determination of the Low-Energy Spectral Component of Cobalt-60 Sources

Kerris, Klaus G., Gorbics, S. G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.27 MB

english, 1985

100

Defect Production in SiO2 by X-Ray and Co-60 Radiations

Dozier, C. M., Brown, D. B., Throckmorton, J. L., Ma, D. I.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.05 MB

english, 1985

101

Accounting for Dose-Enhancement Effects with CMOS Transistors

Fleetwood, D. M., Winokur, P. S., Beegle, R. W., Dressendorfer, P. V., Draper, B. L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.19 MB

english, 1985

102

Time Dependent Dose Enhancement Effects on Integrated Circuit Transient Response Mechanisms

Millward, D. G., Merker, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.06 MB

english, 1985

103

Displacement Damage and Dose Enhancement in Gallium Arsenide and Silicon

Garth, J. C., Burke, E. A., Woolf, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 890 KB

english, 1985

104

Radiation Damage Effects of Electrons and H, He, O, Cl and Cu Ions on GaAs JFETs

Knudson, A. R., Campbell, A. B., Stapor, W. J., Shapiro, P., Mueller, G. P., Zuleeg, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 709 KB

english, 1985

105

A Comparison of Ionizing Radiation Damage in MOSFETs from Cobalt-60 Gamma Rays, 0.5 TO 22 MeV Protons and 1 to 7 MeV Electrons

Tallon, R. W., Ackermann, M. R., Kemp, W. T., Owen, M. H., Saunders, D. P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1009 KB

english, 1985

106

Proton and Heavy-Ion Radiation Damage Studies in MOS Transistors

Stapor, W. J., August, L. S., Wilson, D. H., Oldham, T. R., Murray, K. M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 998 KB

english, 1985

107

Accuracy of Coupled Monte-Carlo/Next-Event-Estimator for Bremsstrahlung Dose Predictions

Pregenzer, Arian L., Halbleib, John A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 975 KB

english, 1985

108

Experimental Check of Bremsstrahlung Dosimetry Predictions for 0.75 MeV Electrons

Sanford, T. W. L., Halbleib, J. A., Beezhold, W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.06 MB

english, 1985

109

Coupled Electron-Photon Transport Calculations Using the Method of Discrete Ordinates

Lorence, Leonard J., Nelson, W. E., Morel, J. E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 833 KB

english, 1985

110

Neutron Capture Induced Radioactive Background in Spaceborne, Large Volume, NaI Gamma-Ray Spectrometers

Dyer, C. S., Hammond, N. D. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 452 KB

english, 1985

111

Calibration and Flight Testing of a Low-Field pMOS Dosimeter

Holmes-Siedle, Andrew, Adams, Leonard, Marsden, S., Pauly, B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 838 KB

english, 1985

112

Spacecraft Fiberglass Strut Charging/Discharging and EMI

Balmain, K. G., Gossland, M., Karia, K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.16 MB

english, 1985

113

Computation of Vacuum and 3-Torr IEMP Responses and Comparison with Benchmark Experiments

Chan, P. C., Woods, A. J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 594 KB

english, 1985

114

MOS-Transistor Radiation Detectors and X-Ray Dose-Enhancement Effects

Posey, L. D., Wrobel, T. F., Evans, D. C., Beezhold, W., Kelly, J. G., MacCallum, C. J., Coppage, F. N., Luera, T. F., Lorence, L. J., Smith, A. J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.22 MB

english, 1985

115

Gamma-Ray Irradiation Effects in Light-Emitting Diodes and Photodiodes for Fiber Optics

Takagi, Toru, Joda, Juichi

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.83 MB

english, 1985

116

Charge-Sheet Model Fitting to Extract Radiation-Induced Oxide and Interface Charge

Galloway, K. F., Wilson, C. L., Witte, L. C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1009 KB

english, 1985

117

Community Response to Low-Level Radioactive Waste: A Case Study of an Attempt to Establish a Waste Reduction and Incineration Facility

Bord, Richard J., Ponzurick, Philip J., Witzig, Warren F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.92 MB

english, 1985

118

Recovery of the Electrical Insulation of a Van de Graaff Accelerator's Charging Belt by Vacuum Drying

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 181 KB

english, 1985

119

Correction to: "Random Errors in the Magnetic Field Coefficients of Superconducting Magnets"

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 181 KB

english, 1985

120

1985 Index IEEE Transactions on Nuclear Science Vol. NS-32

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 15.46 MB

english, 1985

121

Starting a New Project? New Job? In a New Field?

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 153 KB

english, 1985

122

Information for authors

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 226 KB

english, 1985

123

Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 100 KB

english, 1985

124

Study to Establish Data Sheets for CMOS Devices in Space and Nuclear Applications

Brucker, G., Bowman, C., Seehra, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 847 KB

english, 1985