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Volume 15; Issue 24

Temperature-dependent characterizations on parasitic capacitance of tapered through silicon via (T-TSV)

The impact of heat loss paths on the electrothermal models of self-heating effects in nanoscale tri-gate SOI MOSFETs

The impact of heat loss paths on the electrothermal models of self-heating effects in nanoscale tri-gate SOI MOSFETs

Design of a 60-GHz receiver front-end with broadband matching techniques in 65-nm CMOS

Design of a 60-GHz receiver front-end with broadband matching techniques in 65-nm CMOS