Bunday, B.D.: search on Z-Library

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51

The busy Period for the M/M/1 machine interference model

Bunday, D.D., El-Badri, W.K.

Journal:

Stochastic Analysis and Applications

Year:

1985

Language:

english

File:

PDF, 303 KB

english, 1985

52

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 27 February 2011)] Metrology, Inspection, and Process Control for Microlithography XXV - TSOM method for semiconductor metrology

Attota, Ravikiran, Dixson, Ronald G., Kramar, John A., Potzick, James E., Vladár, András E., Bunday, Benjamin, Novak, Erik, Rudack, Andrew, Raymond, Christopher J.

Year:

2011

Language:

english

File:

PDF, 3.17 MB

english, 2011

53

Likelihood and Bayesian Estimation Methods for Poisson Process Models in Software Reliability

Bunday, B.D., Al‐Ayoubi, I.D.

Journal:

International Journal of Quality & Reliability Management

Year:

1990

Language:

english

File:

PDF, 291 KB

english, 1990

54

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Metrology, Inspection, and Process Control for Microlithography XXX - Probe microscopy for metrology of next-generation devices

Sanchez, Martha I., Ukraintsev, Vladimir A., Humphris, Andrew D. L., Zhao, Bin, Bastard, David, Bunday, Benjamin

Year:

2016

Language:

english

File:

PDF, 1.18 MB

english, 2016

55

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Metrology, Inspection, and Process Control for Microlithography XVII - Electron beam metrology of 193-nm resists at ultralow voltage

Sullivan, Neal T., Dixson, Ron, Bunday, Benjamin D., Mastovich, Martin E., Knutrud, Paul C., Fabre, Pascal, Brandom, Robert, Herr, Daniel J.

Year:

2003

Language:

english

File:

PDF, 317 KB

english, 2003

56

The efficiency of M groups of N machines served by a travelling robot: comparison of two models

BUNDAY, B. D., EL-BADRI, W. K.

Journal:

International Journal of Production Research

Year:

1988

Language:

english

File:

PDF, 347 KB

english, 1988

57

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, CA (Sunday 22 February 2009)] Metrology, Inspection, and Process Control for Microlithography XXIII - Developing an uncertainty analysis for optical scatterometry

Germer, Thomas A., Patrick, Heather J., Silver, Richard M., Bunday, Benjamin, Allgair, John A., Raymond, Christopher J.

Year:

2009

Language:

english

File:

PDF, 223 KB

english, 2009

58

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Metrology, Inspection, and Process Control for Microlithography XXVIII - Novel three dimensional (3D) CD-SEM profile measurements

Cain, Jason P., Sanchez, Martha I., Ito, Wataru, Bunday, Benjamin, Harada, Sumito, Cordes, Aaron, Murakawa, Tsutomu, Arceo, Abraham, Yoshikawa, Makoto, Hara, Toshihiko, Arai, Takehito, Shida, Soichi,

Year:

2014

Language:

english

File:

PDF, 764 KB

english, 2014

59

The Reliability of Artificial Heart Valves ‐ A Case Study for the Proportional Hazards Model

Bunday, Brian D., Kiri, Victor A., Stoodley, Keith D.C.

Journal:

International Journal of Quality & Reliability Management

Year:

1992

Language:

english

File:

PDF, 535 KB

english, 1992

60

Analysis of Censored Recidivism Data Using a Proportional Hazards-Type Model

Brian D. Bunday and Victor A. Kiri

Journal:

Journal of the Royal Statistical Society: Series D (The Statistician)

Year:

1992

Language:

english

File:

PDF, 971 KB

english, 1992

61

Potentiating paired corticospinal-motoneuronal plasticity after spinal cord injury

Bunday, Karen L., Urbin, M.A., Perez, Monica A.

Journal:

Brain Stimulation

Year:

2018

Language:

english

File:

PDF, 1.07 MB

english, 2018

62

Visuo-vestibular Influences on the Moving Platform Locomotor Aftereffect

Bunday, Karen L., Bronstein, Adolfo M.

Journal:

Journal of Neurophysiology

Year:

2008

File:

PDF, 1.27 MB

2008

63

The water content of seeds. I.—The moisture relations of seed peas etc

O. F. Lubatti, Greta Bunday

Journal:

Journal of the Science of Food and Agriculture

Year:

1960

Language:

english

File:

PDF, 480 KB

english, 1960

64

Impairment of spatial cognitive function with preservation of verbal performance during spatial disorientation

M.A. Gresty, Sarah Waters, A. Bray, Karen Bunday, J.F. Golding

Journal:

Current Biology

Year:

2003

Language:

english

File:

PDF, 141 KB

english, 2003

65

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Metrology, Inspection, and Process Control for Microlithography XVIII - Results of benchmarking of advanced CD-SEMs at the 90-nm CMOS technology node

Bunday, Benjamin D., Bishop, Michael, Allgair, John A., Silver, Richard M.

Year:

2004

Language:

english

File:

PDF, 287 KB

english, 2004

66

Model Building in Mathematical Programming.by H. P. Williams

Review by: B. D. Bunday

Journal:

Journal of the Royal Statistical Society Series A (General)

Year:

1985

Language:

english

File:

PDF, 91 KB

english, 1985

67

Games, Theory and Applications.by L. C. Thomas

Review by: Brian D. Bunday

Journal:

Journal of the Royal Statistical Society Series A (General)

Year:

1984

Language:

english

File:

PDF, 88 KB

english, 1984

68

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Realizing "value-added" metrology

Bunday, Benjamin, Archie, Chas N., Lipscomb, Pete, Allgair, John, Patel, Dilip, Caldwell, Mark, Solecky, Eric, Archie, Chas, Morningstar, Jennifer, Rice, Bryan J., Singh, Bhanwar, Cain, Jason, Emami,

Year:

2007

Language:

english

File:

PDF, 741 KB

english, 2007

69

A closed form solution for the G/M/r machine interference model

BUNDAY, BRIAN D., KHORRAM, ESMAILE

Journal:

International Journal of Production Research

Year:

1988

Language:

english

File:

PDF, 260 KB

english, 1988

70

Locomotor adaptation is modulated by observing the actions of others

M. Patel, R. E. Roberts, M. U. Riyaz, M. Ahmed, D. Buckwell, K. Bunday, H. Ahmad, D. Kaski, Q. Arshad, A. M. Bronstein

Year:

2015

Language:

english

File:

PDF, 907 KB

english, 2015

71

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - Critical dimension small angle X-ray scattering measurements of FinFET and 3D memory structures

Settens, Charles, Bunday, Benjamin, Thiel, Brad, Kline, R. Joseph, Sunday, Daniel, Wang, Chengqing, Wu, Wen-li, Matyi, Richard, Starikov, Alexander, Cain, Jason P.

Year:

2013

Language:

english

File:

PDF, 528 KB

english, 2013

72

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Metrology, Inspection, and Process Control for Microlithography XXII - CD-SAXS measurements using laboratory-based and synchrotron-based instruments

Wang, Chengqing, Allgair, John A., Raymond, Christopher J., Choi, Kwang-Woo, Fu, Wei-En, Ho, Derek L., Jones, Ronald L., Soles, Christopher, Lin, Eric K., Wu, Wen-Li, Clarke, James S., Bunday, Benjami

Year:

2008

Language:

english

File:

PDF, 774 KB

english, 2008

73

Aberrant Crossed Corticospinal Facilitation in Muscles Distant from a Spinal Cord Injury

Bunday, Karen L., Oudega, Martin, Perez, Monica A., Sabaawy, Hatem E

Journal:

Year:

2013

Language:

english

File:

PDF, 1.64 MB

english, 2013

74

The efficiency of uni-directionally patrolled machines with two robot repairmen

Brian D. Bunday, Esmaile Khorram

Journal:

European Journal of Operational Research

Year:

1989

Language:

english

File:

PDF, 410 KB

english, 1989

75

Sampling Inspection and Quality Controlby G. Barrie Wetherill

Review by: B. D. Bunday

Journal:

The Mathematical Gazette

Year:

1978

Language:

english

File:

PDF, 223 KB

english, 1978

76

Fumigation of agricultural products. XVI. —Some aspects of the fumigation of imported potatoes in boxes with methyl bromide for the control of tuber moth Gnorimoschema operculella (Zell.)

O. F. Lubatti, Greta Bunday

Journal:

Journal of the Science of Food and Agriculture

Year:

1958

Language:

english

File:

PDF, 486 KB

english, 1958

77

The effect of trial number on the emergence of the ‘broken escalator’ locomotor aftereffect

K. L. Bunday, R. F. Reynolds, D. Kaski, M. Rao, S. Salman, A. M. Bronstein

Journal:

Experimental Brain Research

Year:

2006

Language:

english

File:

PDF, 490 KB

english, 2006

78

Machine interference—a comparison of two patrolling methods

BUNDAY, BRIAN D., EL-BADRI, WALID K.

Journal:

International Journal of Production Research

Year:

1985

Language:

english

File:

PDF, 259 KB

english, 1985

79

The âbroken escalatorâ phenomenon: Vestibular dizziness interferes with locomotor adaptation

Patel, Mitesh, Roberts, Ed, Arshad, Qadeer, Bunday, Karen, Golding, John F., Kaski, Diego, Bronstein, Adolfo M.

Journal:

Journal of Vestibular Research

Year:

2020

File:

PDF, 595 KB

2020

80

The efficiency of unidirectionally patrolled machines

Brian D. Bunday, Esmaile Khorram

Journal:

Applied Mathematical Modelling

Year:

1987

Language:

english

File:

PDF, 381 KB

english, 1987

81

The maintenance of unidirectionally patrolled stations

Brian D. Bunday, Ruzela Tapsir

Journal:

Applied Mathematical Modelling

Year:

1994

Language:

english

File:

PDF, 740 KB

english, 1994

82

[IEEE 2006 International Symposium on Semiconductor Manufacturing (ISSM) - Tokyo, Japan (2006.09.25-2006.09.27)] 2006 IEEE International Symposium on Semiconductor Manufacturing - The Future of CD Metrology

Allgair, John, Bunday, Benjamin

Year:

2006

Language:

english

File:

PDF, 3.28 MB

english, 2006

83

Some Thoughts on a Coin-Tossing Problem

Journal:

The Mathematical Gazette

Year:

1976

Language:

english

File:

PDF, 623 KB

english, 1976

84

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, CA (Sunday 22 February 2009)] Metrology, Inspection, and Process Control for Microlithography XXIII - Improving optical measurement accuracy using multi-technique nested uncertainties

Silver, R. M., Zhang, N. F., Barnes, B. M., Zhou, H., Heckert, A., Dixson, R., Germer, T. A., Bunday, B., Allgair, John A., Raymond, Christopher J.

Year:

2009

Language:

english

File:

PDF, 1.32 MB

english, 2009

85

[IEEE 2015 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2015.3.15-2015.3.16)] 2015 China Semiconductor Technology International Conference - Novel three dimensional (3D) CD-SEM profile measurements

Yoshikawa, Makoto, Bunday, Benjamin, Longhai Liu,, Ito, Wataru, Shida, Soichi, Matsumoto, Jun, Nakamura, Takayuki

Year:

2015

Language:

english

File:

PDF, 920 KB

english, 2015

86

The Efficiency of a Textile Winding Process

B. D. Bunday and R. A. Lee

Journal:

Journal of the Royal Statistical Society: Series C (Applied Statistics)

Year:

1978

Language:

english

File:

PDF, 449 KB

english, 1978

87

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Bias reduction in roughness measurement through SEM noise removal

Katz, R., Archie, Chas N., Chase, C. D., Kris, R., Peltinov, R., Villarrubia, J., Bunday, B.

Year:

2006

Language:

english

File:

PDF, 514 KB

english, 2006

88

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Metrology, Inspection, and Process Control for Microlithography XIX - Specifications, methodologies, and results of evaluation of optical critical dimension scatterometer tools at the 90nm CMOS technology node and beyond

Bunday, Benjamin D., Silver, Richard M., Peterson, Amy, Allgair, John A.

Year:

2005

Language:

english

File:

PDF, 554 KB

english, 2005

89

Locomotor Adaptation and Aftereffects in Patients With Reduced Somatosensory Input Due to Peripheral Neuropathy

Bunday, Karen L., Bronstein, Adolfo M.

Journal:

Journal of Neurophysiology

Year:

2009

Language:

english

File:

PDF, 1.14 MB

english, 2009

90

Subcortical Control of Precision Grip after Human Spinal Cord Injury

Bunday, K. L., Tazoe, T., Rothwell, J. C., Perez, M. A.

Journal:

Journal of Neuroscience

Year:

2014

Language:

english

File:

PDF, 1.88 MB

english, 2014

91

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Metrology, Inspection, and Process Control for Microlithography XVII - CD-SEM measurement line-edge roughness test patterns for 193-nm lithography

Bunday, Benjamin D., Bishop, Michael, Villarrubia, John S., Vladar, Andras E., Herr, Daniel J.

Year:

2003

Language:

english

File:

PDF, 733 KB

english, 2003

92

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 22 February 2009)] Metrology, Inspection, and Process Control for Microlithography XXIII - Nonplanar high-k dielectric thickness measurements using CD-SAXS

Wang, Chengqing, Allgair, John A., Raymond, Christopher J., Choi, Kwang-Woo, Chen, Yi-Ching, Price, Jimmy, Ho, Derek L., Jones, Ronald L., Soles, Christopher, Lin, Erik K., Wu, Wen-Li, Bunday, Benjami

Year:

2009

Language:

english

File:

PDF, 1.21 MB

english, 2009

93

Maximum Likelihood Estimation-Practical Merits of Variable Metric Optimisation Methods

Brian D. Bunday and Victor A. Kiri

Journal:

Journal of the Royal Statistical Society: Series D (The Statistician)

Year:

1987

Language:

english

File:

PDF, 620 KB

english, 1987

94

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Metrology, Inspection, and Process Control for Microlithography XXII - Characterization of sub-50-nm line array structures with angle-resolved multiple wavelength scatterometry

Kotelyanskii, Michael, Allgair, John A., Raymond, Christopher J., Shen, Fei, Jiang, Gary, Bunday, Benjamin

Year:

2008

Language:

english

File:

PDF, 441 KB

english, 2008

95

SPIE Proceedings [SPIE Advanced Microelectronic Manufacturing - Santa Clara, CA (Sunday 23 February 2003)] Process and Materials Characterization and Diagnostics in IC Manufacturing - CD-SEM measurement line edge roughness test patterns for 193 nm lithography

Bunday, Benjamin D., Bishop, Michael, Villarrubia, John S., Vladar, Andras E., Tobin, Jr., Kenneth W., Emami, Iraj

Year:

2003

Language:

english

File:

PDF, 734 KB

english, 2003

96

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Metrology, Inspection, and Process Control for Microlithography XXII - Linewidth roughness and cross-sectional measurements of sub-50 nm structures with CD-SAXS and CD-SEM

Wang, Chengqing, Allgair, John A., Raymond, Christopher J., Choi, Kwang-Woo, Jones, Ronald L., Soles, Christopher, Lin, Eric K., Wu, Wen-li, Clarke, James S., Villarrubia, John S., Bunday, Benjamin

Year:

2008

Language:

english

File:

PDF, 572 KB

english, 2008

97

The efficiency of bi-directionally patrolled machines when repairs are not always successful

B.D. Bunday, W.K. El-Badri, S.D. Supanekar

Journal:

European Journal of Operational Research

Year:

1985

Language:

english

File:

PDF, 643 KB

english, 1985

98

Motor Recovery after Spinal Cord Injury Enhanced by Strengthening Corticospinal Synaptic Transmission

Karen L. Bunday, Monica A. Perez

Journal:

Current Biology

Year:

2012

Language:

english

File:

PDF, 816 KB

english, 2012

99

Digital Communications: Satellite/Earth Station Engineering

Journal:

Electronics and Power

Year:

1983

Language:

english

File:

PDF, 200 KB

english, 1983

100

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 24 February 2008)] Metrology, Inspection, and Process Control for Microlithography XXII - Measurement of high-k and metal film thickness on FinFET sidewalls using scatterometry

Dziura, Thaddeus G., Bunday, Benjamin, Smith, Casey, Hussain, Muhammad M., Harris, Rusty, Zhang, Xiafang, Price, Jimmy M., Allgair, John A., Raymond, Christopher J.

Year:

2008

Language:

english

File:

PDF, 425 KB

english, 2008

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