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51

Low Frequency Noise in 4H-SiC MOSFETs

Rumyantsev, Sergey L., Shur, Michael S., Levinshtein, Michael E., Ivanov, Pavel A., Palmour, John W., Das, Mrinal K., Hull, Brett A.

Journal:

Materials Science Forum

Year:

2009

Language:

english

File:

PDF, 464 KB

english, 2009

52

Evaluation of 4H–SiC DMOSFETs for High–Power Electronics Applications

Green, Ronald, Ogunniyi, Aderinto, Ibitayo, Dimeji, Koebke, Gail, Morgenstern, Mark, Lelis, Aivars J., Dickens, Corey, Hull, Brett A.

Journal:

Materials Science Forum

Year:

2009

Language:

english

File:

PDF, 568 KB

english, 2009

53

Self-Heating of 4H-SiC PiN Diodes at High Current Densities

Levinshtein, Michael E., Mnatsakanov, Tigran T., Ivanov, Pavel A., Palmour, John W., Das, Mrinal K., Hull, Brett A.

Journal:

Materials Science Forum

Year:

2009

Language:

english

File:

PDF, 335 KB

english, 2009

54

High Current 6 kV 4H-SiC PiN Diodes for Power Module Switching Applications

Hull, Brett A., Das, Mrinal K., Richmond, James, Heath, Bradley, Sumakeris, Joseph J., Geil, Bruce, Scozzie, Charles J.

Journal:

Materials Science Forum

Year:

2006

Language:

english

File:

PDF, 2.58 MB

english, 2006

55

Evolution of Drift-Free, High Power 4H-SiC PiN Diodes

Das, Mrinal K., Sumakeris, Joseph J., Hull, Brett A., Richmond, James

Journal:

Materials Science Forum

Year:

2006

Language:

english

File:

PDF, 407 KB

english, 2006

56

High-Temperature (up to 800 K) Operation of 6-kV 4H-SiC Junction Diodes

Levinshtein, Michael E., Ivanov, Pavel A., Boltovets, Mykola S., Krivutsa, Valentyn A., Palmour, John W., Das, Mrinal K., Hull, Brett A.

Journal:

Materials Science Forum

Year:

2006

Language:

english

File:

PDF, 492 KB

english, 2006

57

4H-SiC Trench Schottky Diodes for Next Generation Products

Zhang, Qing Chun Jon, Duc, Jennifer, Mieczkowski, Van, Hull, Brett, Allen, Scott, Palmour, John

Journal:

Materials Science Forum

Year:

2013

Language:

english

File:

PDF, 627 KB

english, 2013

58

Do You Really Expect To Grow Epilayers On That? A Rationale For Growing Epilayers On Roughened Surfaces

Sumakeris, Joseph John, Hull, Brett A., O'Loughlin, Michael J., Ha, S., Skowronski, Marek, Palmour, John W., Carter, Calvin H.

Journal:

MRS Proceedings

Year:

2006

Language:

english

File:

PDF, 242 KB

english, 2006

59

Progress on the Development of 10 kV 4H-SiC Pin Diodes for High Current/High Voltage Power Handling Applications

Hull, Brett A., Sumakeris, Joseph J., Das, Mrinal K., Richmond, James, Palmour, John W.

Journal:

Materials Science Forum

Year:

2007

Language:

english

File:

PDF, 438 KB

english, 2007

60

On the Luminescence and Driving Force of Stacking Faults in 4H-SiC

Caldwell, Joshua D., Giles, A.J., Stahlbush, Robert E., Ancona, M.G., Glembocki, Orest J., Hobart, Karl D., Hull, Brett A., Liu, Kendrick X.

Journal:

Materials Science Forum

Year:

2010

Language:

english

File:

PDF, 624 KB

english, 2010

61

Taking Liberties: National Barriers to the Free Flow of Ideas

Lockwood, L. Brett, Hull, Elizabeth

Journal:

American Political Science Review

Year:

1991

Language:

english

File:

PDF, 183 KB

english, 1991

62

Development of A 4H-SiC CMOS Inverter

Hull, Brett Adam, Ryu, Sei-Hyung, Fatima, Husna, Richmond, Jim, Palmour, John W., Scofield, James

Journal:

MRS Proceedings

Year:

2006

Language:

english

File:

PDF, 135 KB

english, 2006

63

Electrical Characterization of High Voltage 4H-SiC pin Diodes Fabricated Using a Low Basal-Plane Dislocations Process

Ivanov, Pavel A., Levinshtein, Michael E., Boltovets, Mykola S., Krivutsa, Valentyn A., Palmour, John W., Das, Mrinal K., Hull, Brett A.

Journal:

Materials Science Forum

Year:

2007

Language:

english

File:

PDF, 349 KB

english, 2007

64

CIMOSFET: A New MOSFET on SiC with a Superior Ron·Qgd Figure of Merit

Zhang, Qing Chun Jon, Duc, Jennifer, Hull, Brett, Young, Jonathan, Ryu, Sei Hyung, Allen, Scott, Palmour, John

Journal:

Materials Science Forum

Year:

2015

Language:

english

File:

PDF, 1.16 MB

english, 2015

65

[IEEE 2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Blacksburg, VA, USA (2015.11.2-2015.11.4)] 2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Characterization and prediction of the avalanche performance of 1.2 kV SiC MOSFETs

DiMarino, Christina, Hull, Brett

Year:

2015

Language:

english

File:

PDF, 823 KB

english, 2015

66

Performance and Reliability of SiC Power MOSFETs

Lichtenwalner, Daniel J., Hull, Brett, Pala, Vipindas, Van Brunt, Edward, Ryu, Sei-Hyung, Sumakeris, Joe J., O’Loughlin, Michael J., Burk, Albert A., Allen, Scott T., Palmour, John W.

Journal:

Year:

2016

Language:

english

File:

PDF, 509 KB

english, 2016

67

Contacts to High Aluminum Fraction p-type Aluminum Gallium Nitride

Hull, Brett A., Mohney, Suzanne E., Chowdhury, Uttiya, Dupuis, Russell D., Gotthold, David, Birkhahn, Ronald, Pophristic, Milan

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 332 KB

english, 2002

68

Silicon Carbide MOSFETs for Medium Voltage Megawatt Scale Systems

Pala, Vipindas, van Brunt, Edward, Hull, Brett, Allen, Scott, Palmour, John W.

Journal:

Materials Science Forum

Year:

2016

Language:

english

File:

PDF, 742 KB

english, 2016

69

Avalanche Capabilities of Commercial 1200 V 4H-SiC Power MOSFETs

Di Marino, Christina, Hull, Brett

Journal:

Materials Science Forum

Year:

2016

Language:

english

File:

PDF, 897 KB

english, 2016

70

SPIE Proceedings [SPIE AeroSense 2000 - Orlando, FL (Monday 24 April 2000)] Intense Microwave Pulses VII - Marx generator triggering with photoconductive switches

Lehr, Jane M., Ahern, Sean M., Abdalla, Michael D., Skipper, Mike C., Romero, Samuel P., Gaudet, John A., Burger, Jeffrey W., Hull, Jon P., Gruner, Fred R., Cockerham, Brett D., Buchenauer, C. Jerald,

Year:

2000

Language:

english

File:

PDF, 1.53 MB

english, 2000

71

High-Mobility SiC MOSFETs with Alkaline Earth Interface Passivation

Lichtenwalner, Daniel J., Pala, Vipindas, Hull, Brett, Allen, Scott, Palmour, John W.

Journal:

Materials Science Forum

Year:

2016

Language:

english

File:

PDF, 454 KB

english, 2016

72

Structure and chemistry of passivated SiC/SiO 2 interfaces

Houston Dycus, J., Xu, Weizong, Lichtenwalner, Daniel J., Hull, Brett, Palmour, John W., LeBeau, James M.

Journal:

Applied Physics Letters

Year:

2016

Language:

english

File:

PDF, 2.69 MB

english, 2016

73

[IEEE 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Fayetteville, AR, USA (2016.11.7-2016.11.9)] 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - The next generation of high voltage (10 kV) silicon carbide power modules

Passmore, Brandon, Cole, Zach, McGee, Brad, Wells, Matthew, Stabach, Jennifer, Bradshaw, Josh, Shaw, Robert, Martin, Dan, McNutt, Ty, VanBrunt, Edward, Hull, Brett, Grider, Dave

Year:

2016

Language:

english

File:

PDF, 573 KB

english, 2016

74

A rehabilitation intervention to promote physical recovery following intensive care: a detailed description of construct development, rationale and content together with proposed taxonomy to capture processes in a randomised controlled trial

Ramsay, Pam, Salisbury, Lisa G, Merriweather, Judith L, Huby, Guro, Rattray, Janice E, Hull, Alastair M, Brett, Stephen J, Mackenzie, Simon J, Murray, Gordon D, Forbes, John F, Walsh, Timothy

Journal:

Year:

2014

Language:

english

File:

PDF, 555 KB

english, 2014

75

Short-Circuit Degradation of 10 kV 10 A SiC MOSFET

Eni, Emanuel-Petre, Beczkowski, Szymon, Munk-Nielsen, Stig, Kerekes, Tamas, Teodorescu, Remus, Juluri, Raghavendra Rao, Julsgaard, Brian, VanBrunt, Edward, Hull, Brett, Sabri, Shadi, Grider, David, Uh

Journal:

IEEE Transactions on Power Electronics

Year:

2017

Language:

english

File:

PDF, 2.34 MB

english, 2017

76

Resolving Atomic Scale Chemistry and Structure at NO and Ba Passivated SiC/SiO 2 Interfaces

Dycus, J. Houston, Xu, Weizong, Lichtenwalner, Daniel J., Hull, Brett, Palmour, John W., LeBeau, James M.

Journal:

Microscopy and Microanalysis

Year:

2016

Language:

english

File:

PDF, 734 KB

english, 2016

77

Impact of Carrier Lifetime Enhancement Using High Temperature Oxidation on 15 kV 4H-SiC P-GTO Thyristor

Ryu, Sei Hyung, Lichtenwalner, Daniel J., van Brunt, Edward, Capell, Craig, O’Loughlin, Michael J., Jonas, Charlotte, Lemma, Yemane, Zhang, J., Richmond, Jim, Burk, Albert A., Hull, Brett, O’Brien, He

Journal:

Materials Science Forum

Year:

2017

Language:

english

File:

PDF, 557 KB

english, 2017

78

Electrical Properties and Interface Structure of SiC MOSFETs with Barium Interface Passivation

Lichtenwalner, Daniel J., Dycus, J. Houston, Xu, Wei Zong, Lebeau, James M., Hull, Brett, Allen, Scott, Palmour, John W.

Journal:

Materials Science Forum

Year:

2017

Language:

english

File:

PDF, 5.80 MB

english, 2017

79

[IEEE 2016 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2016.10.9-2016.10.13)] 2016 IEEE International Integrated Reliability Workshop (IIRW) - SiC power device reliability

Gajewski, Donald A., Hull, Brett, Lichtenwalner, Daniel J., Ryu, Sei-Hyung, Bonelli, Eric, Mustain, Habib, Wang, Gangyao, Allen, Scott T., Palmour, John W.

Year:

2016

Language:

english

File:

PDF, 1.29 MB

english, 2016

80

[IEEE 2017 IEEE 5th Workshop on Wide-Bandgap Power Devices and Applications (WiPDA) - Albuquerque, NM (2017.10.30-2017.11.1)] 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - A 200 kVA electric vehicle traction drive inverter having enhanced performance over its entire operating region

Olejniczak, Kraig, McNutt, Ty, Simco, David, Wijenayake, Ajith, Flint, Tom, Passmore, Brandon, Shaw, Robert, Martin, Daniel, Curbow, Austin, Casady, Jeff, Hull, Brett

Year:

2017

Language:

english

File:

PDF, 1.94 MB

english, 2017

81

[IEEE 2017 IEEE 5th Workshop on Wide-Bandgap Power Devices and Applications (WiPDA) - Albuquerque, NM (2017.10.30-2017.11.1)] 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - SiC MOSFETs designed and evaluated for linear mode operation

O'Brien, Heather, Ogunniyi, Aderinto, Urciuoli, Damian, Zhang, Qingchun Jon, Hull, Brett

Year:

2017

Language:

english

File:

PDF, 342 KB

english, 2017

82

[IEEE 2017 IEEE 5th Workshop on Wide-Bandgap Power Devices and Applications (WiPDA) - Albuquerque, NM (2017.10.30-2017.11.1)] 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Effect of capacitive current on reverse recovery of body diode of 10kV SiC MOSFETs and external 10kV SiC JBS diodes

Kumar, Ashish, Vechalapu, Kasunaidu, Bhattacharya, Subhashish, Veliadis, Victor, Van Brunt, Edward, Grider, David, Sabri, Shadi, Hull, Brett

Year:

2017

Language:

english

File:

PDF, 418 KB

english, 2017

83

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - The effects of radiation on the terrestrial operation of SiC MOSFETs

Akturk, Akin, McGarrity, James, Goldsman, Neil, Lichtenwalner, Daniel J., Hull, Brett, Grider, Dave, Wilkins, Richard

Year:

2018

Language:

english

File:

PDF, 339 KB

english, 2018

84

Reliability of SiC Power Devices against Cosmic Ray Neutron Single-Event Burnout

Lichtenwalner, Daniel J., Akturk, Akin, McGarrity, James, Richmond, Jim, Barbieri, Thomas, Hull, Brett, Grider, Dave, Allen, Scott, Palmour, John W.

Journal:

Materials Science Forum

Year:

2018

Language:

english

File:

PDF, 420 KB

english, 2018

85

Static and Dynamic Characterization of a 3.3 Kv, 45 A 4H-Sic MOSFET

Anurag, Anup, Gohil, Ghanshyamsinh, Acharya, Sayan, Han, Ki Jeong, Vechalapu, Kasunaidu, Baliga, B. Jayant, Bhattacharya, Subhashish, van Brunt, Edward, Sabri, Shadi, Hull, Brett, Grider, Dave

Journal:

Materials Science Forum

Year:

2018

Language:

english

File:

PDF, 1014 KB

english, 2018

86

First Isolation of West Nile virus from a Patient with Encephalitis in the United States

Huang, Cinnia, Slater, Brett, Rudd, Robert, Parchuri, Nandakishore, Hull, Rene, Dupuis, Michelle, Hindenburg, Alexander

Journal:

Emerging Infectious Diseases

Year:

2002

Language:

english

File:

PDF, 490 KB

english, 2002

87

Industrial and Body Diode Qualification of Gen-III Medium Voltage SiC MOSFETs: Challenges and Solutions

van Brunt, Edward, O’Loughlin, Michael, Burk, Al, Hull, Brett, Ryu, Sei Hyung, Richmond, Jim, Khlebnikov, Yuri, Balkas, Elif, Gajewski, Donald A., Allen, Scott, Palmour, John W.

Journal:

Materials Science Forum

Year:

2019

Language:

english

File:

PDF, 2.17 MB

english, 2019

88

The Effect of Complexity of the Surgical Field on Perioperative Outcomes of Robot-Assisted Radical Cystectomy

Elsayed, Ahmed S., Aldhaam, Naif A., Jing, Zhe, Osei, Jennifer A., Hull, Brett, Nagra, Avneet, Siam, Alat, Li, Qiang, Hussein, Ahmed A., Guru, Khurshid A.

Journal:

Year:

2020

File:

PDF, 247 KB

2020