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1

Quasi - 3D and Full - 3D Approaches for Numerical Simulation in Axial Flow Hydraulic Turbine

Prasad, Vishnu, Sayann, K. S., Krishnamachar, P

Journal:

Hydro Nepal Journal of Water Energy and Environment

Year:

2009

Language:

english

File:

PDF, 932 KB

english, 2009

2

Exploiting IoT technologies for enhancing Health Smart Homes through patient identification and emotion recognition

Mano, Leandro Y., Faiçal, Bruno S., Nakamura, Luis H.V., Gomes, Pedro H., Libralon, Giampaolo L., Meneguete, Rodolfo I., Filho, Geraldo P.R., Giancristofaro, Gabriel T., Pessin, Gustavo, Krishnamachar

Journal:

Computer Communications

Year:

2016

Language:

english

File:

PDF, 2.61 MB

english, 2016

3

[IEEE TENCON 2018 - 2018 IEEE Region 10 Conference - Jeju, Korea (South) (2018.10.28-2018.10.31)] TENCON 2018 - 2018 IEEE Region 10 Conference - A System Health Indicator for the Distributed Minority and Majority Voting Based Redundancy Scheme

Balasubramanian, P., Maskell, Douglas, Prasad, Krishnamachar

Year:

2018

Language:

english

File:

PDF, 1.12 MB

english, 2018

4

A common metallization scheme for ohmic contacts to n-type and p-type GaAs: the AlNiSn system

Krishnamachar Prasad

Journal:

Materials Science and Engineering: B

Year:

1994

Language:

english

File:

PDF, 250 KB

english, 1994

5

Development of dual-etch via tapering process for through-silicon interconnection

Ranganathan Nagarajan, Krishnamachar Prasad, Liao Ebin, Balasubramanian Narayanan

Journal:

Sensors and Actuators A: Physical

Year:

2007

Language:

english

File:

PDF, 1.06 MB

english, 2007

6

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Statistical outlook into the physics of failure for copper low-k intra-metal dielectric breakdown

Raghavan, Nagarajan, Prasad, Krishnamachar

Year:

2009

Language:

english

File:

PDF, 345 KB

english, 2009

7

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Effect of annealing after metal etch on analog device and its impact on yield performance

Mukhopadhyay, Madhusudan, Meng, Teo Y., Ye, Lim S., Rajgopal, Rajan, Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 133 KB

english, 2000

8

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Measurement of thermal deformation of IC packages using the AFM scanning moire technique

Zhong, Zhaowei, Lu, Yunguang, Xie, Huimin, Ngoi, Bryan K. A., Yu, Jin, Chai, Gin B., Asundi, Anand K., Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 901 KB

english, 2000

9

The Influence of Different Carbohydrate Sources on Blood Glucose Levels and Satiety: Effect of Physical Activity on Blood Glucose Response

Krishnamachar, S., Mickelsen, O .

Journal:

Human Nutrition. Food Sciences and Nutrition

Year:

1987

Language:

english

File:

PDF, 3.66 MB

english, 1987

10

Stability of electrical parameters of Ti Schottky contacts on GaAs fabricated surfaces using different surface cleaning techniques

Krishnamachar Prasad

Journal:

Year:

1995

Language:

english

File:

PDF, 397 KB

english, 1995

11

Spin-on metal-n-GaAs contacts: an interface state density analysis

Krishnamachar Prasad

Journal:

Materials Science and Engineering: B

Year:

1994

Language:

english

File:

PDF, 205 KB

english, 1994

12

Microbiological oxidation of the branched C5-dicarboxylic acids

V. S. Krishnamachar, S. S. Subramanian, M. R. Raghavendra Rao

Journal:

Archives of Microbiology

Year:

1964

Language:

english

File:

PDF, 333 KB

english, 1964

13

[IEEE 2011 International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD) - Sydney, Australia (2011.12.14-2011.12.16)] 2011 International Conference on Applied Superconductivity and Electromagnetic Devices - Performance analysis of HTS transformer with fault current limiting properties on short circuit current

Abdul Rahman, Muhammad A., Lie, Tek T., Prasad, Krishnamachar

Year:

2011

Language:

english

File:

PDF, 190 KB

english, 2011

14

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Estimation of the area of voids in deep-submicron aluminium interconnects using resistance-noise measurements

Chu, Lip W., Pey, Kin L., Chim, Wai K., Loh, S. K., Er, E., Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 651 KB

english, 2000

15

Protein and energy utilization in female BHE rats

Krishnamachar, Susheela, Berdanter, Carolyn D., Canolty, Nancy L.

Journal:

Nutrition Research

Year:

1986

Language:

english

File:

PDF, 443 KB

english, 1986

16

Effects of energy or protein restriction on weight and composition of diabetic and control rats

Krishnamachar, Susheela, Canolty, Nancy L.

Journal:

Nutrition Research

Year:

1985

Language:

english

File:

PDF, 395 KB

english, 1985

17

[IEEE IEEE International Solid-State Circuits Conference - San Francisco, CA, USA (9-13 Feb. 2003)] 2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC. - A 1.8 V 128 Mb 125 MHz multi-level cell flash memory with flexible read while write

Elmhurst, D., Bains, R., Bressie, T., Bueb, C., Carrieri, E., Chauhan, B., Chrisman, N., Dayley, M., De Luna, R., Fan, K., Goldman, M., Govindu, P., Huq, A., Khandaker, M., Kreifels, J., Krishnamachar

Year:

2003

Language:

english

File:

PDF, 379 KB

english, 2003

18

[IEEE 6th International Conference on Solid-State and IC Technology - Shanghai, China (22-25 Oct. 2001)] 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) - Uncover the diffusion mechanism of atoms during electromigration test using non-stationary noise analysis

Shin Yeh Lim,, Cher Ming Tan,, Krishnamachar, P., Dao Hua Zhang,

Year:

2001

Language:

english

File:

PDF, 253 KB

english, 2001

19

Multiple chest wall swellings in adult Burkitt's lymphoma

Maka, Vinayak, Harish, Krishnamachar

Journal:

Year:

2014

Language:

english

File:

PDF, 1.14 MB

english, 2014

20

[IEEE 2008 58th Electronic Components and Technology Conference (ECTC 2008) - Lake Buena Vista, FL, USA (2008.05.27-2008.05.30)] 2008 58th Electronic Components and Technology Conference - High RF performance TSV silicon carrier for high frequency application

Soon Wee Ho,, Seung Wook Yoon,, Qiaoer Zhou,, Pasad, Krishnamachar, Kripesh, Vaidyanathan, Lau, John H.

Year:

2008

Language:

english

File:

PDF, 710 KB

english, 2008

21

[IEEE 2013 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE) - Bali, Indonesia (2013.08.26-2013.08.29)] Proceedings of 2013 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE) - Biotronic Engineering curriculum design: Integrating electronic engineering and applied/health sciences

GholamHosseini, Hamid, Prasad, Krishnamachar

Year:

2013

Language:

english

File:

PDF, 171 KB

english, 2013

22

Design Curves for Regular and Random Wave

Krishnamachar, P.

Journal:

Journal of Hydraulic Research

Year:

1972

Language:

english

File:

PDF, 5.49 MB

english, 1972

23

Standardization of Refractories for Steel Plants

Srivastava, R. K., Krishnamachar, B. S.

Journal:

Transactions of the Indian Ceramic Society

Year:

1964

Language:

english

File:

PDF, 648 KB

english, 1964

24

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Fast yield learning using e-beam wafer inspection

Garvin, Jr., James F., Guldi, Richard L., Sridhar, Nagarajan, Tinker, Mark, Cappel, Robert, Cass, Thomas, Roberts, Jake, Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 1.50 MB

english, 2000

25

[IEEE 2012 IEEE EMBS Conference on Biomedical Engineering and Sciences (IECBES 2012) - Langkawi, Malaysia (2012.12.17-2012.12.19)] 2012 IEEE-EMBS Conference on Biomedical Engineering and Sciences - Data acquisition framework for surface electromyography signals using wireless technology

Kilby, Jeff, Prasad, Krishnamachar

Year:

2012

Language:

english

File:

PDF, 1.31 MB

english, 2012

26

Expression of thyroid-stimulating hormone receptor, octamer-binding transcription factor 4, and intracisternal A particle-promoted polypeptide in human breast cancer tissues

Govindaraj, Vijayakumar, Yaduvanshi, Nirmala Singh, Krishnamachar, Harish, Rao, A. Jagannadha

Journal:

Hormone Molecular Biology and Clinical Investigation

Year:

2012

Language:

english

File:

PDF, 402 KB

english, 2012

27

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Thermal characterization of tape BGA package by modeling

Han, Jiang-Bo, Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 1.24 MB

english, 2000

28

The Effect of Photochemical Surface Passivation on Reverse Current in Ti-GaAs Schottky Diodes

Meglicki, Zdzislaw, Nener, Brett D., Prasad, Krishnamachar, Sharda, Hemlata, Faraone, Lorenzo, Nassibian, Armenag G.

Journal:

Japanese Journal of Applied Physics

Year:

1988

Language:

english

File:

PDF, 203 KB

english, 1988

29

Nondestructive determination of sheet carrier density in pseudomorphic AlGaAs/InGaAs/GaAs high electron mobility transistor structures by room-temperature photoluminescence spectra

Lu, Wu, Lee, Jin-Hee, Prasad, Krishnamachar, Ng, Geok-Ing, Lindström, Per

Journal:

Journal of Physics D Applied Physics

Year:

1998

Language:

english

File:

PDF, 123 KB

english, 1998

30

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Finite element analysis and experiments of ultrafine-pitch wire bonding

Zhong, Zhaowei, Goh, Kay S., Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 871 KB

english, 2000

31

Nodules in the Pouch of Douglas

Harish, Krishnamachar, Govindaiah, Girish

Journal:

Year:

2016

Language:

english

File:

PDF, 176 KB

english, 2016

32

[IEEE 1995 International Geoscience and Remote Sensing Symposium, IGARSS '95. Quantitative Remote Sensing for Science and Applications - Firenze, Italy (10-14 July 1995)] 1995 International Geoscience and Remote Sensing Symposium, IGARSS '95. Quantitative Remote Sensing for Science and Applications - Land cover dynamics investigation using parallel computers

Liang, S., Davis, L., Townshend, J., Chellappa, R., DeFries, R., Dubayah, R., Goward, S., JaJa, J., Krishnamachar, S., Roussopoulos, N., Saltz, J., Samet, H., Shock, T., Srinivasan, M.

Year:

1995

Language:

english

File:

PDF, 323 KB

english, 1995

33

[IEEE 2015 IEEE Eindhoven PowerTech - Eindhoven, Netherlands (2015.6.29-2015.7.2)] 2015 IEEE Eindhoven PowerTech - Flux pump for HTS rotating machinery applications

Kulkarni, Ravichandra, Prasad, Krishnamachar, Lie, Tek Tjing

Year:

2015

Language:

english

File:

PDF, 369 KB

english, 2015

34

Multi-channel Surface Electromyography Electrodes: A Review

Kilby, Jeff, Prasad, Krishnamachar, Mawston, Grant

Journal:

IEEE Sensors Journal

Year:

2016

Language:

english

File:

PDF, 1.25 MB

english, 2016

35

[IEEE 2012 2nd National Conference on Computational Intelligence and Signal Processing (CISP) - Guwahati, India (2012.03.2-2012.03.3)] 2012 2nd National Conference on Computational Intelligence and Signal Processing (CISP) - On a framework for analyzing cloud system performance

Sreenivasan, Krishnamachar

Year:

2012

File:

PDF, 35 KB

2012

36

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Crosstalk in packaging array-based optical interconnects and processors

Ghosh, Anjan K., Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 287 KB

english, 2000

37

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - New quality control parameter in wafer fabrication for wire-bonding integrity

Tan, Cher Ming, Guan, Zhang, Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 347 KB

english, 2000

38

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Burn-in strategy based on Weibull failures

Chien, Wei-Ting K., Huang, Charles H. J., Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 514 KB

english, 2000

39

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Comprehensive methodology for integrated circuit in-line defect classification

Guldi, Richard L., Paradis, Douglas E., Sridhar, Nagarajan, Hightower, Jesse B., Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 1.27 MB

english, 2000

40

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Test and reliability analysis of PBGA assemblies under random vibration

Yang, Qingjin, Wang, Zhiping, Lim, Geok H., Pang, Hock Lye J., Yap, Fook F., Lin, Rongming, Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 1.13 MB

english, 2000

41

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Reliability data analysis software development

Guan, Zhang, Tan, Cher Ming, Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 2.80 MB

english, 2000

42

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - FEA evaluation on solder joint reliability of CCGA

Lam, Tim F., Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 1.46 MB

english, 2000

43

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Comprehensive study of indium-implantation-induced damages in 0.25-um MOSFETs

Liao, Hong, Lim, Louis, Lowrie, Anthony, Gan, Chock H., Redford, Mark, Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 769 KB

english, 2000

44

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Chemical imaging of microvias in flip chip pin grid array packages using time-of-flight secondary ion mass spectroscopy

Khong, Yoon L., Lee, Hooi L., Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 990 KB

english, 2000

45

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - CVD Cu/IMP Cu/TaN/SiO2/Si structures

Loh, Seow W., Zhang, Dao Hua, Li, Chao Yong, Liu, Rong, Wee, Andrew T. S., Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 952 KB

english, 2000

46

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Projecting wafer probe yields for products fabricated in new technologies

Ross, Ron, Atchison, Nick, Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 333 KB

english, 2000

47

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Novel resource optimization approach for yield learning

Akella, Ramakrishna, Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 435 KB

english, 2000

48

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - System-level I/O power modeling

Pinello, William P., Patel, P. R., Li, Yuang-Liang, Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 455 KB

english, 2000

49

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Novel algorithm for hot-carrier lifetime projection on thick gate PMOSFETs fabricated by 0.18-um CMOS technology

Jie, Bin B., Manna, Indrajit, Zeng, Xu, Guo, Qiang, Lo, Keng F., Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 319 KB

english, 2000

50

SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Microelectronic Yield, Reliability, and Advanced Packaging - Yield implications of wafer edge engineering

Harris, Kenneth R., Ang, Boon Y., Tan, Cher Ming, Peng, Yeng-Kaung, Mahalingam, Mali, Prasad, Krishnamachar

Year:

2000

Language:

english

File:

PDF, 1.68 MB

english, 2000