Kruit, M.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

51

Reply

Ann I. Scher, Gisela M. Terwindt, W. M. Monique Verschuren, Mark C. Kruit, Henk J. Blom, Hisanori Kowa, Rune R. Frants, Arn M. J. M. van den Maagdenberg, Mark van Buchem, Michel D. Ferrari, Lenore J.

Journal:

Annals of Neurology

Year:

2006

Language:

english

File:

PDF, 42 KB

english, 2006

52

Phase 1/2 study of subcutaneous and intradermal immunization with a recombinant MAGE-3 protein in patients with detectable metastatic melanoma

Wim H.J. Kruit, Heidi H. van Ojik, Vincent G. Brichard, Bernard Escudier, Thierry Dorval, Brigitte Dréno, Poulam Patel, Nicolas van Baren, Marie-Françoise Avril, Sophie Piperno, Amir Khammari, Marguer

Journal:

International Journal of Cancer

Year:

2005

Language:

english

File:

PDF, 845 KB

english, 2005

53

Position stabilization of EELS spectra

Pieter Kruit, Henry Shuman

Journal:

Microscopy Research and Technique

Year:

1985

Language:

english

File:

PDF, 215 KB

english, 1985

54

Highly resolved electron spectra for resonantly enhanced four-photon ionization of no

J. Kimman, P. Kruit, M.J. Van Der Wiel

Journal:

Chemical Physics Letters

Year:

1982

Language:

english

File:

PDF, 382 KB

english, 1982

55

Nanometer resolution analysis of surfaces

Journal:

Surface Science Letters

Year:

1993

Language:

english

File:

PDF, 124 KB

english, 1993

56

Applicability of focused ion beams for nanotechnology

P.W.H. de Jager, P. Kruit

Journal:

Microelectronic Engineering

Year:

1995

Language:

english

File:

PDF, 284 KB

english, 1995

57

Comparison between different imaging modes in focussed ion beam instruments

X.R. Jiang, P. Kruit

Journal:

Microelectronic Engineering

Year:

1996

Language:

english

File:

PDF, 371 KB

english, 1996

58

The influence of ion beam parameters on pattern resolution

P.W.H. de Jager, C.W. Hagen, P. Kruit

Journal:

Microelectronic Engineering

Year:

1996

Language:

english

File:

PDF, 399 KB

english, 1996

59

A combined objective lens for electrons and ions

P.W.H. de Jager, M.C.W. Kelder, P. Kruit

Journal:

Microelectronic Engineering

Year:

1996

Language:

english

File:

PDF, 361 KB

english, 1996

60

The magnetic parallelizer as an optical element for Auger electrons: further characterization

Arno J. Bleeker, Pieter Kruit

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

1990

Language:

english

File:

PDF, 747 KB

english, 1990

61

Inexpensive read-out for coincident electron spectroscopy with a transmission electron microscope at nanometer scale using micro channel plates and multistrip anodes

R.W. Hollander, V.R. Bom, C.W.E. van Eijk, J.S. Faber, H. Hoevers, P. Kruit

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

1994

Language:

english

File:

PDF, 258 KB

english, 1994

62

Computer assistance for the pre-design of optical instruments

M.A.J. van der Stam, P. Kruit

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

1995

Language:

english

File:

PDF, 660 KB

english, 1995

63

Coulomb interactions in microfocussed electron and ion beams

P. Kruit, L.J. Vijgen, Jiang Xinrong

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

1995

Language:

english

File:

PDF, 577 KB

english, 1995

64

Coupling optics for a combined electron positron scanning microscope

Léon J. Seijbel, R.F.J. Neelissen, P. Kruit, A. van Veen, H. Schut

Journal:

Applied Surface Science

Year:

1995

Language:

english

File:

PDF, 381 KB

english, 1995

65

Characterization of ultrasharp field emitters by projection microscopy

M.J. Fransen, E.P.N. Damen, C. Schiller, T.L. van Rooy, H.B. Groen, P. Kruit

Journal:

Applied Surface Science

Year:

1996

Language:

english

File:

PDF, 448 KB

english, 1996

66

Detection of X-rays and electron energy loss events in time coincidence

P. Kruit, H. Shuman, A.P. Somlyo

Journal:

Ultramicroscopy

Year:

1984

Language:

english

File:

PDF, 794 KB

english, 1984

67

The influence of objective lens aberrations in energy-loss spectrometry

P. Kruit, H. Shuman

Journal:

Ultramicroscopy

Year:

1985

Language:

english

File:

PDF, 330 KB

english, 1985

68

High-spatial-resolution surface-sensitive electron spectroscopy using a magnetic parallelizer

P. Kruit, J.A. Venables

Journal:

Ultramicroscopy

Year:

1988

Language:

english

File:

PDF, 1.02 MB

english, 1988

69

Development of Auger spectroscopy in stem, a progress report

A. Bleeker, P. Kruit

Journal:

Ultramicroscopy

Year:

1988

Language:

english

File:

PDF, 107 KB

english, 1988

70

Auger spectroscopy in a Philips EM400 stem

A. Bleeker, F.J. Pijper, P. Kruit

Journal:

Ultramicroscopy

Year:

1989

Language:

english

File:

PDF, 171 KB

english, 1989

71

An ultra-high-vacuum chamber for a Philips EM430 stem

A.J. Bleeker, F.J. Pijper, P. Kruit

Journal:

Ultramicroscopy

Year:

1989

Language:

english

File:

PDF, 200 KB

english, 1989

72

A voltage contrast detector for E-beam testing with two energy channels

L. Dubbeldam, A.C. de Jager, P. Kruit

Journal:

Ultramicroscopy

Year:

1989

Language:

english

File:

PDF, 103 KB

english, 1989

73

Coincidence detection of energy loss events and secondary electrons in (S) TEM

F.J. Pijper, J.S. Faber, A.J. Bleeker, P. Kruit

Journal:

Ultramicroscopy

Year:

1989

Language:

english

File:

PDF, 105 KB

english, 1989

74

Jan bart le poole (1917–1993)

Journal:

Ultramicroscopy

Year:

1993

Language:

english

File:

PDF, 455 KB

english, 1993

75

Editorial

Journal:

Ultramicroscopy

Year:

1993

Language:

english

File:

PDF, 165 KB

english, 1993

76

Editor's statement about co-authorship

Journal:

Ultramicroscopy

Year:

1994

Language:

english

File:

PDF, 35 KB

english, 1994

77

Editorial

Journal:

Ultramicroscopy

Year:

1995

Language:

english

File:

PDF, 63 KB

english, 1995

78

Hawkes and Kasper, volume 3

Journal:

Ultramicroscopy

Year:

1995

Language:

english

File:

PDF, 115 KB

english, 1995

79

One nanometer structure fabrication using electron beam induced deposition

W.F. van Dorp, C.W. Hagen, P.A. Crozier, B. van Someren, P. Kruit

Journal:

Microelectronic Engineering

Year:

2006

Language:

english

File:

PDF, 159 KB

english, 2006

80

Electrostatic rotator for alignment purposes in multi electron beam systems

A.C. Zonnevylle, C.Th.H. Heerkens, P. Kruit, M.L. Wieland, F.M. Postma, S.W.K.H. Steenbrink

Journal:

Microelectronic Engineering

Year:

2010

Language:

english

File:

PDF, 627 KB

english, 2010

81

Design of a high brightness multi-electron-beam source

Yanxia Zhang, P. Kruit

Journal:

Physics Procedia

Year:

2008

Language:

english

File:

PDF, 618 KB

english, 2008

82

Influence of surface roughness on space charge limited emission

M.D Nijkerk, P Kruit

Journal:

Applied Surface Science

Year:

2004

Language:

english

File:

PDF, 175 KB

english, 2004

83

Preface

Pieter Kruit, Emile van der Drift

Journal:

Microelectronic Engineering

Year:

2005

Language:

english

File:

PDF, 44 KB

english, 2005

84

10 nm lines and spaces written in HSQ, using electron beam lithography

A.E. Grigorescu, M.C. van der Krogt, C.W. Hagen, P. Kruit

Journal:

Microelectronic Engineering

Year:

2007

Language:

english

File:

PDF, 533 KB

english, 2007

85

Directed assembly of nano-particles with the help of charge patterns created with scanning electron microscope

A.C. Zonnevylle, C.W. Hagen, P. Kruit, A. Schmidt-Ott

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 234 KB

english, 2009

86

Electronic pathways in nanostructure fabrication

C.W. Hagen, W.F. van Dorp, P.A. Crozier, P. Kruit

Journal:

Surface Science

Year:

2008

Language:

english

File:

PDF, 646 KB

english, 2008

87

Improving the energy spread and brightness of thermal-field (Schottky) emitters with PHAST—PHoto Assisted Schottky Tip

Ben Cook, Merijn Bronsgeest, Kees Hagen, Pieter Kruit

Journal:

Ultramicroscopy

Year:

2009

Language:

english

File:

PDF, 859 KB

english, 2009

88

‘Collapsing rings’ on Schottky electron emitters

M.S. Bronsgeest, P. Kruit

Journal:

Ultramicroscopy

Year:

2010

Language:

english

File:

PDF, 1.04 MB

english, 2010

89

Design of an aberration corrected low-voltage SEM

R.H. van Aken, D.J. Maas, C.W. Hagen, J.E. Barth, P. Kruit

Journal:

Ultramicroscopy

Year:

2010

Language:

english

File:

PDF, 383 KB

english, 2010

90

An experimental setup to test the MAPPER electron lithography concept

B.J. Kampherbeek, M.J. Wieland, A. van Zuuk, P. Kruit

Journal:

Microelectronic Engineering

Year:

2000

Language:

english

File:

PDF, 752 KB

english, 2000

91

First experimental results of an E-beam tester with dispersive secondary electron energy analyzer

Luc Dubbeldam, Pieter Kruit

Journal:

Microelectronic Engineering

Year:

1987

Language:

english

File:

PDF, 191 KB

english, 1987

92

Theoretical and experimental investigations on Coulomb interactions in a two-lens focussed ion beam instrument

J. Bi, X.R. Jiang, P. Kruit

Journal:

Microelectronic Engineering

Year:

1997

Language:

english

File:

PDF, 306 KB

english, 1997

93

Optics and design of the fringe field monochromator for a Schottky field emission gun

H.W Mook, P Kruit

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

1999

Language:

english

File:

PDF, 407 KB

english, 1999

94

A general framework for numerical calculation of properties of charged-particle optical systems

M.A.J. van der Stam, P. Kruit

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

1999

Language:

english

File:

PDF, 144 KB

english, 1999

95

A testing set-up for a micro-analysis positron beam facility

L.V Jørgensen, A van Veen, H Schut, A Winkelman, P Kruit

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

1999

Language:

english

File:

PDF, 451 KB

english, 1999

96

A novel vacuum electron source based on ballistic electron emission

E.G. Borgonjen, G.P.E.M. van Bakel, C.W. Hagen, P. Kruit

Journal:

Applied Surface Science

Year:

1997

Language:

english

File:

PDF, 321 KB

english, 1997

97

Brightness measurements of a ZrO/W Schottky electron emitter in a transmission electron microscope

M.J. Fransen, M.H.F. Overwijk, P. Kruit

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 79 KB

english, 1999

98

Field emission energy distributions from individual multiwalled carbon nanotubes

M.J Fransen, Th.L van Rooy, P Kruit

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 937 KB

english, 1999

99

Low-energy foil aberration corrector

R.H van Aken, C.W Hagen, J.E Barth, P Kruit

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 355 KB

english, 2002

100

Differential phase contrast in TEM

M.R. McCartney, P. Kruit, A.H. Buist, M.R. Scheinfein

Journal:

Ultramicroscopy

Year:

1996

Language:

english

File:

PDF, 572 KB

english, 1996

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски