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51

The use of metal/semiconductor structures to develop MULSAM analytical techniques

M. Prutton, I. R. Barkshire, M. M. El Gomati, J. C. Greenwood, P. G. Kenny, R. H. Roberts

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 1010 KB

english, 1992

52

Automatic removal of substrate backscattering effects in Auger imaging and spectroscopy

I. R. Barkshire, M. Prutton, J. C. Greenwood, M. M. El Gomati

Journal:

Surface and Interface Analysis

Year:

1993

Language:

english

File:

PDF, 1013 KB

english, 1993

53

The Multidimensional Integrated Intelligent Imaging project (MI-3)

Allinson, N., Anaxagoras, T., Aveyard, J., Arvanitis, C., Bates, R., Blue, A., Bohndiek, S., Cabello, J., Chen, L., Chen, S., Clark, A., Clayton, C., Cook, E., Cossins, A., Crooks, J., El-Gomati, M.,

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

2009

Language:

english

File:

PDF, 152 KB

english, 2009

54

Chemical bevelling of InP-based structures by HBrH3PO4K2Cr2O7 solution

R. Srnanek, M.El Gomati, I. Novotny, D. Pudis

Journal:

Journal of Crystal Growth

Year:

1997

Language:

english

File:

PDF, 563 KB

english, 1997

55

Systematic trends in the transport mean free path with electron energy and atomic number

J.A.D Matthew, A.R Jackson, M.M El-Gomati

Journal:

Journal of Electron Spectroscopy and Related Phenomena

Year:

1997

Language:

english

File:

PDF, 612 KB

english, 1997

56

Enhanced angular current intensity from Schottky emitters

S. FUJITA, T. R. C. WELLS, W. USHIO, H. SATO, M. M. EL-GOMATI

Journal:

Journal of Microscopy

Year:

2010

Language:

english

File:

PDF, 684 KB

english, 2010

57

Auger electron microscopy: An overview

L. Frank, M. M. El Gomati

Journal:

Czechoslovak Journal of Physics

Year:

1994

Language:

english

File:

PDF, 2.62 MB

english, 1994

58

Electron Backscattering from Real and In-Situ Treated Surfaces

Frank, Luděk, Steklý, Richard, Zadražil, Martin, El-Gomati, Mohamed M., Müllerová, Ilona

Journal:

Microchimica Acta

Year:

2000

Language:

english

File:

PDF, 235 KB

english, 2000

59

Why is it that differently doped regions in semiconductors are visible in low voltage SEM?

El-Gomati, M.M., Wells, T.C.R., Mullerova, I., Frank, L., Jayakody, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2004

Language:

english

File:

PDF, 235 KB

english, 2004

60

On the role of rare earth additives in the oxidation of superalloys

M.M. El Gomati, C. Walker, D.C. Peacock, M. Prutton

Journal:

Corrosion Science

Year:

1985

Language:

english

File:

PDF, 706 KB

english, 1985

61

Scanning Low Energy Electron Loss Microscopy (SLEELM): Au on Si

M.M. El Gomati, J.A.D. Matthew

Journal:

Applied Surface Science

Year:

1988

Language:

english

File:

PDF, 937 KB

english, 1988

62

A digital scanning Auger electron microscope

R Browning, M.M El Gomati, M Prutton

Journal:

Surface Science

Year:

1977

Language:

english

File:

PDF, 1.09 MB

english, 1977

63

Monte Carlo calculations of the spatial resolution in a scanning auger electron microscope

M.M. El Gomati, M. Prutton

Journal:

Surface Science

Year:

1978

Language:

english

File:

PDF, 598 KB

english, 1978

64

The interpretation of the spatial resolution of the scanning Auger electron microscope: A theory/experiment comparison

M.M. El Gomati, A.P. Janseen, M. Prutton, J.A. Venables

Journal:

Surface Science

Year:

1979

Language:

english

File:

PDF, 418 KB

english, 1979

65

Electronic excitations on clean and adsorbate covered Pd(111) by angle resolved electron energy loss spectroscopy

F.P. Netzer, M.M. El Gomati

Journal:

Surface Science

Year:

1983

Language:

english

File:

PDF, 743 KB

english, 1983

66

A novel SAM technique for the direct measurement of backscattering factors and the elucidation of background shapes in AES

Journal:

Surface Science

Year:

1985

Language:

english

File:

PDF, 382 KB

english, 1985

67

The surface segregation of Zr in a superalloy (NiCrAlZr)

M.M. El Gomati, C.G.H. Walker, D.C. Peacock, M. Prutton, H.E. Bishop, R.M.H. Hawes, J. Smialek

Journal:

Surface Science

Year:

1985

Language:

english

File:

PDF, 656 KB

english, 1985

68

Angular distribution of field emitted electrons from vertically aligned carbon nanotube arrays

Iacobucci, S., Fratini, M., Rizzo, A., Scarinci, F., Zhang, Y., Mann, M., Li, C., Milne, W. I., El Gomati, M. M., Lagomarsino, S.

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 707 KB

english, 2012

69

The Sensitivity of Backscattering Coefficients to Elastic Scattering Cross-Sections and Electron Stopping Powers

Walker, C. G. H., Matthew, J. A. D., El-Gomati, M. M.

Journal:

Year:

2013

Language:

english

File:

PDF, 99 KB

english, 2013

70

A Digital Scanning Auger Electron Microscope Incorporating a Concentric Hemispherical Analyser

R. Browning, P. J. Bassett, M. M. El Gomati and M. Prutton

Journal:

Proceedings of the Royal Society of London Series A Mathematical and Physical Sciences (1934-1990)

Year:

1977

Language:

english

File:

PDF, 2.63 MB

english, 1977

71

Auger Electron Spectroscopy in high vacuum: Nanocharacterisation in the Scanning Electron Microscope

Zha, Xiaoping, Walker, Christopher G H, El-Gomati, Mohamed

Journal:

Journal of Physics Conference Series

Year:

2014

Language:

english

File:

PDF, 948 KB

english, 2014

72

[IEEE Eleventh International Vacuum Microelectronics Conference. IVMC'98 - Asheville, NC, USA (19-24 July 1998)] Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382) - Dual mode micromachined electron energy analyser

Johnson, S., El Gomati, M.M.

Year:

1998

Language:

english

File:

PDF, 144 KB

english, 1998

73

[IEEE Eleventh International Vacuum Microelectronics Conference. IVMC'98 - Asheville, NC, USA (19-24 July 1998)] Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382) - Fabrication of tungsten coated silicon based gated emitters

Chen, L., El-Gomati, M.M.

Year:

1998

Language:

english

File:

PDF, 328 KB

english, 1998

74

[Advances in Imaging and Electron Physics] Volume 183 || Toward Quantitative Scanning Electron Microscopy

El-Gomati, Mohamed M.

Year:

2014

Language:

english

File:

PDF, 1.56 MB

english, 2014

75

[IEEE 14th International Vacuum Microelectronics Conference - Davis, CA, USA (12-16 Aug. 2001)] IVMC 2001. Proceedings of the 14th International Vacuum Microelectronics Conference (Cat. No.01TH8586) - Identification of artefacts in Auger electron spectroscopy due to surface topography

Gelsthorpe, A., El-Gomati, M.M.

Year:

2001

Language:

english

File:

PDF, 237 KB

english, 2001

76

The role of oxygen in secondary electron contrast in doped semiconductors using low voltage scanning electron microscopy

C. G. H. Walker, F. Zaggout, M. M. El-gomati

Year:

2008

Language:

english

File:

PDF, 385 KB

english, 2008

77

Direct Detection of Low-Energy Electrons With a Novel CMOS APS Sensor

Zha, Xiaoping, El-Gomati, Mohamed M., Chen, Li, Walker, Chris, Clark, Andy T., Turchetta, Renato

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 759 KB

english, 2012

78

Very-low-energy electron microscopy of doped semiconductors

El-Gomati, M. M., Wells, T. C. R.

Journal:

Applied Physics Letters

Year:

2001

Language:

english

File:

PDF, 440 KB

english, 2001

79

A fast, parallel acquisition, electron energy analyzer: The hyperbolic field analyzer

Jacka, M., Kirk, M., El Gomati, M. M., Prutton, M.

Journal:

Review of Scientific Instruments

Year:

1999

Language:

english

File:

PDF, 472 KB

english, 1999

80

[IEEE 14th International Vacuum Microelectronics Conference - Davis, CA, USA (12-16 Aug. 2001)] IVMC 2001. Proceedings of the 14th International Vacuum Microelectronics Conference (Cat. No.01TH8586) - High resolution retarding field analyser

Johnson, S.D., El-Gomati, M.M., Mahadevan, J., Enloe, L.

Year:

2001

Language:

english

File:

PDF, 166 KB

english, 2001

81

Publisher’s Note: “Angular distribution of field emitted electrons from vertically aligned carbon nanotube arrays” [Appl. Phys. Lett. 100, 053116 (2012)]

Iacobucci, S., Fratini, M., Rizzo, A., Scarinci, F., Zhang, Y., Mann, M., Li, C., Milne, W. I., El Gomati, M. M., Lagomarsino, S., Stefani, G.

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 219 KB

english, 2012

82

[IEEE 9th International Vacuum Microelectronics Conference - St. Petersburg, Russia (7-12 July 1996)] 9th International Vacuum Microelectronics Conference - Low temperature reactive ion etching of silicon with SF/sub 6//O/sub 2/ plasmas

Wells, T., El-Gomati, M.M., Wood, J., Johnson, S.

Year:

1996

Language:

english

File:

PDF, 518 KB

english, 1996

83

A new high performance electron source for electron microscopes

El-Gomati, M.M.

Journal:

Microscopy and Microanalysis

Year:

2012

File:

PDF, 965 KB

2012

84

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Charged Particle Optics IV - Fast parallel acquisition electron energy analyzer

Walker, Christopher G. H., Walker, Andrew, Badheka, Ranjan, Kumashiro, Sumio, Jacka, Marcus, El Gomati, Mohamed, Prutton, Martin, Read, Frank H., Munro, Eric

Year:

1999

Language:

english

File:

PDF, 452 KB

english, 1999

85

Morphological transformations of the primary surfactant structures in brine-rich mixtures of ternary systems (surfactant/alcohol/brine)

Porte, G., Gomati, R., El Haitamy, O., Appell, J., Marignan, J.

Journal:

Journal of Physical Chemistry

Year:

1986

Language:

english

File:

PDF, 720 KB

english, 1986

86

High-resolution retarding field analyzer

Johnson, S. D., El-Gomati, M. M., Enloe, L.

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

2003

Language:

english

File:

PDF, 428 KB

english, 2003

87

Stabilization of carbon nanotube field emitters

Mann, M, Teo, K B K, Milne, W I, El Gomati, M M, Wells, T, Tessner, T, Ovsyanko, M

Journal:

Proceedings of the Institution of Mechanical Engineers Part N Journal of Nanoengineering and Nanosystems

Year:

2008

Language:

english

File:

PDF, 179 KB

english, 2008

88

Direct band-gap measurement on epitaxial Co2FeAl0.5Si0.5 Heusler-alloy films

Alhuwaymel, Tariq F., Carpenter, Robert, Yu, Chris Nga Tung, Kuerbanjiang, Balati, Abdullah, Ranjdar M., Lazarov, Vlado K., El-Gomati, Mohamed, Hirohata, Atsufumi

Journal:

Journal of Applied Physics

Year:

2015

Language:

english

File:

PDF, 1.43 MB

english, 2015

89

An all-electrostatic small beam diameter, high probe current field emission electron probe

Gomati, M M El, Prutton, M, Browning, R

Journal:

Journal of Physics E Scientific Instruments

Year:

1985

Language:

english

File:

PDF, 722 KB

english, 1985

90

Fabrication of tungsten-coated silicon-based gated emitters

L. Chen, M. M. El-gomati

Year:

1999

Language:

english

File:

PDF, 773 KB

english, 1999

91

Identification of artifacts in Auger electron spectroscopy due to surface topography

A. Gelsthorpe, M. M. El-gomati

Year:

2003

Language:

english

File:

PDF, 694 KB

english, 2003

92

The chemisorption of oxygen and its effect on the secondary electron emission from doped semiconductors

Zaggout, F N, Walker, C G H, Gomati, M M El

Journal:

Journal of Physics Conference Series

Year:

2010

Language:

english

File:

PDF, 555 KB

english, 2010

93

SPIE Proceedings [SPIE SPIE Scanning Microscopy - Monterey, CA (Monday 4 May 2009)] Scanning Microscopy 2009 - The role of oxygen in secondary electron contrast of doped semiconductors in LVSEM

El Gomati, M. M., Postek, Michael T., Newbury, Dale E., Zaggout, F. N., Walker, C. G. H., Platek, S. Frank, Joy, David C., Zha, X.

Year:

2009

Language:

english

File:

PDF, 735 KB

english, 2009

94

SPIE Proceedings [SPIE SPIE Scanning Microscopy - Monterey, CA (Monday 4 May 2009)] Scanning Microscopy 2009 - Recent developments in the understanding and application of backscattered and secondary electrons in the SEM

El Gomati, M. M., Postek, Michael T., Walker, C. G. H., Newbury, Dale E., Platek, S. Frank, Matthew, J. A. D., Joy, David C.

Year:

2009

Language:

english

File:

PDF, 670 KB

english, 2009

95

Use of Monte Carlo Modeling to Aid Interpretation and Quantification of the Low Energy-Loss Electron Yield at Low Primary Energies

Bonet, Christopher, Pratt, Andrew, El-Gomati, Mohamed M., Matthew, Jim A.D., Tear, Steven P.

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 375 KB

english, 2008

96

Secondary, Backscattered and Low Energy Loss electrons in the SEM: Quantification for nano analysis

El-Gomati, MM, Walker, CGH, Bonet, C, Tear, SP, Matthew, JAD

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 173 KB

english, 2008

97

Monte Carlo Modeling of the Low-loss Electron Signal in Scanning Electron Microscopy and Comparison with the BSE Signal

Bonet, C, Pratt, A, El-Gomati, M, Matthew, JAD, Tear, SP

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 547 KB

english, 2008

98

An Experimental and Monte Carlo Study of Secondary Electron Emission from Elemental Solids

Walker, CGH, El-Gomati, MM, Assa'd, AMD, Zadražil, M

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 157 KB

english, 2008

99

SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 10 August 2008)] Carbon Nanotubes and Associated Devices - The application of carbon nanotube electron sources to the electron microscope

Mann, Mark, Razeghi, Manijeh, Pribat, Didier, El Gomati, Mohamed, Wells, Torquil, Lee, Young Hee, Milne, William I., Teo, Ken B. K.

Year:

2008

Language:

english

File:

PDF, 1023 KB

english, 2008

100

Bamboo and Herringbone Shaped Carbon Nanotubes and Carbon Nanofibres Synthesized in Direct Current-Plasma Enhanced Chemical Vapour Deposition

Zhang, Lu, Chen, Li, Wells, Torquil, El-Gomati, Mohamed

Journal:

Journal of Nanoscience and Nanotechnology

Year:

2009

Language:

english

File:

PDF, 4.06 MB

english, 2009