M. Wachnik: search on Z-Library

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51

Aspects of Chemical Technology Teaching at University

Wilczura-Wachnik, Hanna, Semeniuk, Bazyli, Kaim, Andrzej, Myslinski, Adam

Journal:

Procedia - Social and Behavioral Sciences

Year:

2015

Language:

english

File:

PDF, 661 KB

english, 2015

52

(Invited) Parastic Elements in Gate Stacks and Contacts of Planar and Fin Transistors

Wachnik, R., Lu, N., Lee, S., Johnson, J. B., Li, H., Solomon, P., Kwon, U., Krishnan, S.

Journal:

ECS Transactions

Year:

2014

Language:

english

File:

PDF, 227 KB

english, 2014

53

Modeling of Resistance in FinFET Local Interconnect

Lu, Ning, Wachnik, Richard A.

Journal:

IEEE Transactions on Circuits and Systems I: Regular Papers

Year:

2015

Language:

english

File:

PDF, 1.78 MB

english, 2015

54

Silicon germanium based millimetre-wave ICs for Gbps wireless communications and radar systems

Gaucher, B, Floyd, B, Reynolds, S, Pfeiffer, U, Grzyb, J, Joseph, A, Mina, E, Orner, B, Ding, H, Wachnik, R, Walter, K

Journal:

Semiconductor Science and Technology

Year:

2007

Language:

english

File:

PDF, 1.61 MB

english, 2007

55

An Analytical Metal Resistance Model and Its Application for Sub-22-nm Metal-Gate CMOS

Miao, Xin, Bao, Ruqiang, Kwon, Unoh, Wong, Keith, Rausch, Werner, Weng, Weihao, Wachnik, Richard, Grunow, Stephan, Narayanan, Vijay, Li, Xiuling, Krishnan, Siddarth

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 447 KB

english, 2015

56

[IEEE 2006 International SiGe Technology and Device Meeting - Princeton, NJ, USA (15-17 May 2006)] 2006 International SiGe Technology and Device Meeting - Progress in SiGe Technology Toward Fully Integrated mmWave ICs

Gaucher, B., Reynolds, S., Floyd, B., Pfeiffer, U., Beukema, T., Joseph, A., Mina, E., Orner, B., Wachnik, R., Walter, K.

Year:

2006

Language:

english

File:

PDF, 1.74 MB

english, 2006

57

[IEEE 2006 International SiGe Technology and Device Meeting - Princeton, NJ, USA (15-17 May 2006)] 2006 International SiGe Technology and Device Meeting - Progress in SiGe Technology Toward Fully Integrated mmWave ICs

Gaucher, B., Reynolds, S., Floyd, B., Pfeiffer, U., Beukema, T., Joseph, A., Mina, E., Orner, B., Wachnik, R., Walter, K.

Year:

2006

Language:

english

File:

PDF, 1.74 MB

english, 2006

58

[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - Experiment and model for deviation from Pelgrom scaling relation in device width

Ning Lu,, Brown, Jeffrey S., Thoma, Rainer, Kotecha, Pooja M., Wachnik, Richard A.

Year:

2014

Language:

english

File:

PDF, 681 KB

english, 2014

59

Aplication of Rams and FMEA Methods in Safety Management System of Railway Transport / ZASTOSOWANIE METOD RAMS I FMEA W SYSTEMACH ZARZĄDZANIA BEZPIECZEŃSTWEM W TRANSPORCIE KOLEJOWYM

Sitarz, Marek, Chruzik, Katarzyna, Wachnik, Rafał

Journal:

Journal of Konbin

Year:

2012

File:

PDF, 865 KB

2012

60

Technical Risk Analysis of Railway Vehicle

Mańka, Adam, Wachnik, Rafał

Journal:

Journal of Konbin

Year:

2010

Language:

english

File:

PDF, 487 KB

english, 2010

61

α-Tocopherol/AOT/alkane/water system

Karpiuk, Izabela, Wilczura-Wachnik, Hanna, Myśliński, Adam

Journal:

Journal of Thermal Analysis and Calorimetry

Year:

2018

Language:

english

File:

PDF, 767 KB

english, 2018

62

The Solvent Influence on Thymidine-SDS-Alcohol Micelle System: Studies With UV-Vis Technique

A, Bhattarai, HW, Wachnik, M, Grzegorek

Journal:

American Journal of Pharmacology and Pharmacotherapeutics

Year:

2018

Language:

english

File:

PDF, 774 KB

english, 2018

63

[AIP Third international stress workshop on stress-induced phenomena in metallization - Palo Alto, California (USA) (21-23 Jun 1995)] AIP Conference Proceedings - Line length effects on lifetime measurements and resistance saturation during electromigration testing

Filippi, R. G., Biery, G. A., Wachnik, R. A.

Year:

1996

Language:

english

File:

PDF, 1.15 MB

english, 1996