Nafria, M.: search on Z-Library

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51

[IEEE 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Prague, Czech Republic (2018.7.2-2018.7.5)] 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models

Saraza-Canflanca, P., Malagon, D., Passos, F., Toro, A., Nunez, J., Diaz-Fortuny, J., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodrizucz, R., Nafria, M., Fernandez, F.V.

Year:

2018

Language:

english

File:

PDF, 2.69 MB

english, 2018

52

Worn-out oxide MOSFET characteristics: Role of gate current and device parameters on a current mirror

J. Martín-Martínez, R. Rodríguez, M. Nafría, X. Aymerich, J.H. Stathis

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 160 KB

english, 2007

53

Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses

A. Crespo-Yepes, J. Martin-Martinez, R. Rodriguez, M. Nafria, X. Aymerich

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 369 KB

english, 2009

54

Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors

Polspoel, W., Vandervorst, W., Aguilera, L., Porti, M., Nafria, M., Aymerich, X.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 627 KB

english, 2008

55

Electrical and mechanical performance of graphene sheets exposed to oxidative environments

Lanza, Mario, Wang, Yan, Gao, Teng, Bayerl, Albin, Porti, Marc, Nafria, Montserrat, Zhou, Yangbo, Jing, Guangyin, Zhang, Yanfeng, Liu, Zhongfan, Yu, Dapeng, Duan, Huiling

Journal:

Year:

2013

Language:

english

File:

PDF, 1008 KB

english, 2013

56

Colopha hispanica sp.n. (Homoptera: Aphidoidea: Pemphigidae): an unusual endophytic aphid living inside the stems of Scirpus holoschoenus (Cyperaceae)

NAFRIA, J. M. NIETO, DURANTE, M. P. MIER

Journal:

Systematic Entomology

Year:

1987

Language:

english

File:

PDF, 613 KB

english, 1987

57

Aphis species (Hemiptera, Aphididae) living on Mulinum (Apiaceae) in South America, with a description of a new species

RODRÍGUEZ, SANDRA GONZÁLEZ, BROWN, PAUL A., ORTEGO, JAIME, CIRUELOS, SARA I. LÓPEZ, NAFRÍA, JUAN M. NIETO

Journal:

Year:

2017

Language:

english

File:

PDF, 1.09 MB

english, 2017

58

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Grain boundary-driven leakage path formation in HfO2 dielectrics

Bersuker, G., Yum, J., Iglesias, V., Porti, M., Nafria, M., McKenna, K., Shluger, A., Kirsch, P., Jammy, R.

Year:

2010

Language:

english

File:

PDF, 560 KB

english, 2010

59

Grain boundary-driven leakage path formation in HfO2 dielectrics

G. Bersuker, J. Yum, L. Vandelli, A. Padovani, L. Larcher, V. Iglesias, M. Porti, M. Nafría, K. McKenna, A. Shluger, P. Kirsch, R. Jammy

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 1.16 MB

english, 2011

60

DC Characterization and Fast Small-Signal Parameter Extraction of Organic Thin Film Transistors With Different Geometries

Arnal, August, Crespo-Yepes, Albert, Ramon, Eloi, Teres, Lluis, Rodriguez, Rosana, Nafria, Montserrat

Journal:

IEEE Electron Device Letters

Year:

2020

File:

PDF, 1.07 MB

2020

61

Circuit Design-Oriented Stochastic Piecewise Modeling of the Postbreakdown Gate Current in MOSFETs: Application to Ring Oscillators

Martin-Martinez, Javier, Kaczer, Ben, Degraeve, Robin, Roussel, Philippe J., Rodriguez, Rosana, Nafria, Montserrat, Aymerich, Xavier, Dierickx, B., Groeseneken, Guido

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2012

Language:

english

File:

PDF, 749 KB

english, 2012

62

Injected Charge to Recovery as a Parameter to Characterize the Breakdown Reversibility of Ultrathin HfSiON Gate Dielectric

Crespo-Yepes, Albert, Martin-Martinez, Javier, Rothschild, Aude, Rodriguez, Rosana, Nafria, Montserrat, Aymerich, Xavier

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2011

Language:

english

File:

PDF, 429 KB

english, 2011

63

Combined Nanoscale and Device-Level Degradation Analysis of $\hbox{SiO}_{2}$ Layers of MOS Nonvolatile Memory Devices

Lanza, M., Porti, M., Nafria, M., Aymerich, X., Sebastiani, A., Ghidini, G., Vedda, A., Fasoli, M.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2009

Language:

english

File:

PDF, 726 KB

english, 2009

64

Resistive switching-like behavior of the dielectric breakdown in ultra-thin Hf based gate stacks in MOSFETs

A. Crespo-Yepes, J. Martin-Martinez, A. Rothschild, R. Rodriguez, M. Nafria, X. Aymerich

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 581 KB

english, 2011

65

A shapeshifting evolvable hardware mechanism based on reconfigurable memFETs crossbar architecture

Martin-Martinez, J., Almudever, C.G., Crespo-Yepes, A., Rodriguez, R., Nafria, M., Rubio, A.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.20 MB

english, 2014

66

Cryo-EM structure of the adenosine A2A receptor coupled to an engineered heterotrimeric G protein

García-Nafría, Javier, Lee, Yang, Bai, Xiaochen, Carpenter, Byron, Tate, Christopher G

Journal:

Year:

2018

Language:

english

File:

PDF, 6.28 MB

english, 2018

67

Nanoscale and Device Level Gate Conduction Variability of High-k Dielectrics-Based Metal-Oxide-Semiconductor Structures

Bayerl, Albin, Lanza, Mario, Porti, Marc, Nafria, Montserrat, Aymerich, Xavier, Campabadal, F., Benstetter, Günther

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2011

Language:

english

File:

PDF, 738 KB

english, 2011

68

[IEEE 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hsinchu (2015.6.29-2015.7.2)] 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits - New insights on the origin of Resistive switching in HfO2 thin films: The role of local mechanical strength

Yuanyuan Shi,, Yanfeng Ji,, Fei Hui,, Nafria, Montserrat, Porti, Marc, Bersuker, Gennadi, Lanza, Mario

Year:

2015

Language:

english

File:

PDF, 813 KB

english, 2015

69

Polymer-Enhanced Stability of Inorganic Perovskite Nanocrystals and Their Application in Color Conversion LEDs

Meyns, Michaela, Perálvarez, Mariano, Heuer-Jungemann, Amelie, Hertog, Wim, Ibáñez, Maria, Nafria, Raquel, Genç, Aziz, Arbiol, Jordi, Kovalenko, Maksym V., Carreras, Josep, Cabot, Andreu, Kanaras, Ant

Journal:

ACS Applied Materials & Interfaces

Year:

2016

Language:

english

File:

PDF, 3.33 MB

english, 2016

70

Development of robust Co-based catalysts for the selective H2-production by ethanol steam-reforming. The Fe-promoter effect

Víctor A. de la Peña O’Shea, Raquel Nafria, Pilar Ramírez de la Piscina, Narcís Homs

Journal:

International Journal of Hydrogen Energy

Year:

2008

Language:

english

File:

PDF, 548 KB

english, 2008

71

Crystallization and silicon diffusion nanoscale effects on the electrical properties of Al2O3 based devices

M. Lanza, M. Porti, M. Nafria, X. Aymerich, G. Benstetter, E. Lodermeier, H. Ranzinger, G. Jaschke, S. Teichert, L. Wilde, P. Michalowski

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 646 KB

english, 2009

72

Current limited stresses of SiO2 gate oxides with conductive atomic force microscope

Porti, M., Nafria, M., Aymerich, X.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.46 MB

english, 2003

73

[IEEE ESSDERC 2008 - 38th European Solid-State Device Research Conference - Edinburgh, UK (2008.09.15-2008.09.19)] ESSDERC 2008 - 38th European Solid-State Device Research Conference - An equivalent circuit model for the recovery component of BTI

Martin-Martinez, J., Rodriguez, R., Nafria, M., Aymerich, X., Kaczer, B., Groeseneken, G.

Year:

2008

Language:

english

File:

PDF, 252 KB

english, 2008

74

[IEEE 2007 Spanish Conference on Electron Devices - Madrid, Spain (2007.01.31-2007.02.2)] 2007 Spanish Conference on Electron Devices - Effects of dielectric degradation and breakdown in MOSFETs characteristics. Impact on digital and analog circuits.

Fernandez, R., Martin-Martinez, J., Rodriguez, R., Nafria, M., Aymerich, X.

Year:

2007

Language:

english

File:

PDF, 1.86 MB

english, 2007

75

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Probabilistic defect occupancy model for NBTI

Martin-Martinez, J., Kaczer, B., Toledano-Luque, M., Rodriguez, R., Nafria, M., Aymerich, X., Groeseneken, G.

Year:

2011

Language:

english

File:

PDF, 1.33 MB

english, 2011

76

Trois nouvelles espèces du genre Aphis de l'Espagne

Prieto, Francisca García, Nafría, Juan M. Nieto

Journal:

The Canadian Entomologist

Year:

2005

Language:

french

File:

PDF, 260 KB

french, 2005

77

Comparison of standard macroscopic and conductive atomic force microscopy leakage measurements on gate removed high-k capacitors

W. Polspoel, W. Vandervorst, L. Aguilera, M. Porti, M. Nafria, X. Aymerich

Year:

2009

Language:

english

File:

PDF, 997 KB

english, 2009

78

An unsupervised and probabilistic approach to Pavlov's dog experiment with OxRAM devices

Pedro, M., Martin-Martinez, J., Rodriguez, R., Gonzalez, M.B., Campabadal, F., Nafria, M.

Journal:

Microelectronic Engineering

Year:

2019

File:

PDF, 1.49 MB

2019

79

A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level

Saraza-Canflanca, P., Diaz-Fortuny, J., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M., Fernandez, F.V.

Journal:

Integration, the VLSI Journal

Year:

2020

File:

PDF, 2.20 MB

2020

80

Reliability and gate conduction variability of HfO2-based MOS devices: A combined nanoscale and device level study

A. Bayerl, M. Lanza, M. Porti, F. Campabadal, M. Nafría, X. Aymerich, G. Benstetter

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 483 KB

english, 2011

81

Trapped charge distributions in thin (10 nm) SiO2 films subjected to static and dynamic stresses

Rodriguez, R., Nafria, M., Sune, J., Aymerich, X.

Journal:

IEEE Transactions on Electron Devices

Year:

1998

Language:

english

File:

PDF, 116 KB

english, 1998

82

Enhanced electrical performance for conductive atomic force microscopy

Blasco, Xavier, Nafria, Montserrat, Aymerich, Xavier

Journal:

Review of Scientific Instruments

Year:

2005

Language:

english

File:

PDF, 84 KB

english, 2005

83

THREE APHID SPECIES (HEMIPTERA: APHIDIDAE) RECORDED FOR THE FIRST TIME FROM SOUTH AMERICA

M. Pilar Mier Durante, Jaime Ortego, Nicolás Pérez Hidalgo and Juan M. Nieto Nafría

Journal:

Florida Entomologist

Year:

2011

Language:

english

File:

PDF, 702 KB

english, 2011

84

[ACM Press the 53rd Annual Design Automation Conference - Austin, Texas (2016.06.05-2016.06.09)] Proceedings of the 53rd Annual Design Automation Conference on - DAC '16 - Designing guardbands for instantaneous aging effects

van Santen, Victor M., Amrouch, Hussam, Martin-Martinez, Javier, Nafria, Montserrat, Henkel, Jörg

Year:

2016

Language:

english

File:

PDF, 381 KB

english, 2016

85

SPIE Proceedings [SPIE Microtechnologies for the New Millennium 2005 - Sevilla, Spain (Monday 9 May 2005)] Nanotechnology II - Charge storage in Si nanocrystals embedded in SiO 2 with enhanced C-AFM

Porti, M., Lugli, Paolo, Kish, Laszlo B., Avidano, M., Nafria, M., Mateos, Javier, Aymerich, X., Carreras, J., Garrido, B.

Year:

2005

Language:

english

File:

PDF, 321 KB

english, 2005

86

Light Is Right—Various Techniques to Fabricate Hollow Obturators

Nanda, Aditi, Jain, Veena, Nafria, Anil

Journal:

The Cleft Palate-Craniofacial Journal

Year:

2013

Language:

english

File:

PDF, 1.18 MB

english, 2013

87

Aphis (Hemiptera, Aphididae) species living on Baccharis (Asteraceae) in southern South America, with description of three new species

NAFRÍA, JUAN MANUEL NIETO, ORTEGO, JAIME, BROWN, PAUL A., CIRUELOS, SARA I. LÓPEZ, DURANTE, M. PILAR MIER

Journal:

Year:

2019

File:

PDF, 2.78 MB

2019

88

Nanoscale investigation of AlGaN/GaN-on-Si high electron mobility transistors

Fontserè, A, Pérez-Tomás, A, Placidi, M, Llobet, J, Baron, N, Chenot, S, Cordier, Y, Moreno, J C, Jennings, M R, Gammon, P M, Fisher, C A, Iglesias, V, Porti, M, Bayerl, A, Lanza, M, Nafría, M

Journal:

Year:

2012

Language:

english

File:

PDF, 2.12 MB

english, 2012

89

Investigating silent strokes in hypertensives: a magnetic resonance imaging study (ISSYS): rationale and protocol design

Riba-Llena, Iolanda, Jarca, Carmen, Mundet, Xavier, Tovar, Jose L, Orfila, Francesc, López-Rueda, Antonio, Nafría, Cristina, Fernández, Jose L, Castañé, Xavier, Domingo, Mar, Álvarez-Sabín, José, Fern

Journal:

Year:

2013

Language:

english

File:

PDF, 302 KB

english, 2013

90

P244 – 1755 Results of a families-researchers collaborative project in Lowe syndrome: ten patients with a wide neurological phenotype

Serrano, M, Perez-Dueñas, B, Camino-León, R, Maldonado, E, Armayones, M, Pousada, M, Gomez-Zuñiga, B, de la Fuente, J, Nafría, B

Journal:

European Journal of Paediatric Neurology

Year:

2013

Language:

english

File:

PDF, 65 KB

english, 2013

91

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Resistive switching-like behaviour of the dielectric breakdown in ultra-thin Hf based gate stacks in mosfets

Crespo-Yepes, A., Martin-Martinez, J., Rodriguez, R., Nafria, M., Aymerich, X., Rothschild, A.

Year:

2010

Language:

english

File:

PDF, 462 KB

english, 2010

92

The statistical distribution of breakdown from multiple breakdown events in one sample

Farres, E, Nafria, M, Sune, J, Aymerich, X

Journal:

Journal of Physics D Applied Physics

Year:

1991

Language:

english

File:

PDF, 562 KB

english, 1991

93

Local Defect Density in Polycrystalline High-k Dielectrics: CAFM-Based Evaluation Methodology and Impact on MOSFET Variability

Couso, C., Porti, M., Martin-Martinez, J., Garcia-Loureiro, A. J., Seoane, N., Nafria, M.

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 805 KB

english, 2017

94

[IEEE 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Giardini Naxos, Italy (2017.6.12-2017.6.15)] 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - TARS: A toolbox for statistical reliability modeling of CMOS devices

Diaz-Fortuny, J., Martin-Martinez, J., Rodriguez, R., Nafria, M., Castro-Lopez, R., Roca, E., Fernandez, F.V.

Year:

2017

Language:

english

File:

PDF, 802 KB

english, 2017

95

Is the Internet-of-Things a Burden or a Leverage for the Human Condition?

Díaz-Nafría, José María, Guarda, Teresa

Journal:

Proceedings (American Bar Association. Section of International and Comparative Law)

Year:

2017

Language:

english

File:

PDF, 2.09 MB

english, 2017

96

A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI

Diaz-Fortuny, Javier, Martin-Martinez, Javier, Rodriguez, Rosana, Castro-Lopez, Rafael, Roca, Elisenda, Aragones, Xavier, Barajas, Enrique, Mateo, Diego, Fernandez, Francisco V., Nafria, Montserrat

Journal:

IEEE Journal of Solid-State Circuits

Year:

2018

Language:

english

File:

PDF, 5.56 MB

english, 2018

97

Aphis (Hemiptera, Aphididae) species living on Baccharis (Asteraceae) in southern South America, with description of three new species

NAFRÍA, JUAN MANUEL NIETO, ORTEGO, JAIME, BROWN, PAUL A., CIRUELOS, SARA I. LÓPEZ, DURANTE, M. PILAR MIER

Journal:

Year:

2019

File:

PDF, 2.78 MB

2019

98

Contributions of the gate current and channel current variation to the post-breakdown MOSFET performance

R. Fernández, R. Rodríguez, M. Nafría, X. Aymerich

Journal:

Microelectronic Engineering

Year:

2008

Language:

english

File:

PDF, 133 KB

english, 2008

99

Peculiar characteristics of nanocrystal memory cells programming window

A. Gasperin, E. Amat, J. Martin, M. Porti, M. Nafria, A. Paccagnella

Year:

2009

Language:

english

File:

PDF, 881 KB

english, 2009

100

[IEEE 2015 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Istanbul, Turkey (2015.9.7-2015.9.9)] 2015 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - A fast and accurate reliability simulation method for analog circuits

Toro-Frias, A., Castro-Lopez, R., Roca, E., Fernandez, F.V., Martin-Martinez, J., Rodriguez, R., Nafria, M.

Year:

2015

Language:

english

File:

PDF, 1008 KB

english, 2015

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