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1

A holographic method for document protection against counterfeit

Jacek Janucki, Jan Owsik

Journal:

Optics Communications

Year:

2003

Language:

english

File:

PDF, 255 KB

english, 2003

2

A Wiener filter based correlation method intended to evaluate effectiveness of holographic security devices

Jacek Janucki, Jan Owsik

Journal:

Optics Communications

Year:

2003

Language:

english

File:

PDF, 434 KB

english, 2003

3

SPIE Proceedings [SPIE Biomedical Optics 2003 - San Jose, CA (Saturday 25 January 2003)] Manipulation and Analysis of Biomolecules, Cells, and Tissues - Laser-induced breakdown spectrometer for nondestructive diagnostics

Owsik, Jan, Janucki, Jacek, Nicolau, Dan V., Enderlein, Joerg, Leif, Robert C., Farkas, Daniel L.

Year:

2003

File:

PDF, 226 KB

2003

4

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Fiber-optic temperature sensor

Lebid, Solomija Y., Fitio, Volodymyr M., Bobitski, Yaroslav V., Wiecek, Tomasz, Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 187 KB

english, 1999

5

SPIE Proceedings [SPIE Lasers and Applications in Science and Engineering - San Jose, CA (Saturday 22 January 2005)] Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications IV - LIBS system for elemental analysis of soil samples

Owsik, Jan, Janucki, Jacek, Jach, Karol, Swierczynski, Robert, Ivanov, Viacheslaw S., Kotyuk, Andrei F., Ulanovski, Michael V., Powers, Peter E.

Year:

2005

Language:

english

File:

PDF, 337 KB

english, 2005

6

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Fluorometric measuring systems for tumor diagnosis

Kwasny, Miroslaw, Mierczyk, Zygmunt, Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 651 KB

english, 1999

7

SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, USA (Saturday 21 January 2012)] Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVII - Reproduction of a unit of power of the laser radiation in compliance with the redefinition of the optical watt

Owsik, Jan, Liberman, Anatoly A., Kovalev, Anatoly A., Moskalyuk, Sergey A., Rembielinska, Anna, Hennig, Guido, Xu, Xianfan, Gu, Bo, Nakata, Yoshiki

Year:

2012

Language:

english

File:

PDF, 719 KB

english, 2012

8

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Interferometric fiber sensors: technology and application

Szustakowski, Mieczyslaw, Ciurapinski, Wieslaw M., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 728 KB

english, 1999

9

SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, United States (Saturday 1 February 2014)] Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XIX - Laser radiation attenuator on the basis of four Dove's prisms

Nakata, Yoshiki, Xu, Xianfan, Roth, Stephan, Neuenschwander, Beat, Owsik, Jan, Liberman, Anatoly A., Kovalev, Alexander A., Mikryukov, Alexey S., Moskalyuk, Sergey A., Ulanovsky, Michail V., Noga, Jan

Year:

2014

Language:

english

File:

PDF, 324 KB

english, 2014

10

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Spectral measurement error significance in heat and quasi-monochromatic radiation photometry

Lovinsky, L. S., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 521 KB

english, 1999

11

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Detailed study of plane-plane cavity fundamental mode far-field structure

Anokhov, Sergey P., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 382 KB

english, 1999

12

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Primary standard of length unit-meter based on the group of He-Ne/I2 lasers

Machekhin, Yu. P., Smulakovsky, V. M., Solovyov, A. V., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 168 KB

english, 1999

13

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Characteristics of the interaction of concentrated radiation fluxes with previously excited gas

Owsik, Jan, Pogorelov, Alexei V., Zvorykin, L., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 256 KB

english, 1999

14

SPIE Proceedings [SPIE Laser Technology: Fourth Symposium - Szczecin-Swinoujscie, Poland (Sunday 26 September 1993)] Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing - Use of chiral liquid crystals in laser engineering

Owsik, Jan, Szwajczak, Elzbieta, Szymanski, Aleksander B., Wolinski, Wieslaw L., Jankiewicz, Zdzislaw, Gajda, Jerzy K., Wolczak, Bohdan K.

Year:

1995

Language:

english

File:

PDF, 165 KB

english, 1995

15

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Interference profilometry flutes with abrupt slopes in metal

Gourari, Mark L., Liberman, Anatolyi A., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 245 KB

english, 1999

16

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Standard of watt for high power levels of laser radiation

Liberman, Anatolyi A., Kotyuk, Andrei F., Owsik, Jan, Skrzeczanowski, Wojciech, Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 362 KB

english, 1999

17

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Torsion balance as a heart of standard

Karagioz, O. V., Kotyuk, Andrei F., Izmailov, V. P., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 325 KB

english, 1999

18

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Single-frequency diode-pumped laser as a standard for frequency, power, and energy of laser radiation

Peshko, Igor I., Dlugaszek, Andrzej, Skrzeczanowski, Wojciech, Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 254 KB

english, 1999

19

SPIE Proceedings [SPIE Laser Technology V - Szczecin-Swinoujscie, Poland (Monday 23 September 1996)] Laser Technology V: Physics and Research and Development Trends - Laser and optoelectronic photoradiometry as a branch of nonelectrical quantity measurement by electrical methods

Owsik, Jan, Kotyuk, Andrei F., Wolinski, Wieslaw L., Malinowski, Michal

Year:

1997

Language:

english

File:

PDF, 1.04 MB

english, 1997

20

SPIE Proceedings [SPIE European Symposium on Optics and Photonics for Defence and Security - London, United Kingdom (Monday 25 October 2004)] Technologies for Optical Countermeasures - The method for testing effectiveness of holographic security devices

Janucki, Jacek, Owsik, Jan, Titterton, David H.

Year:

2004

Language:

english

File:

PDF, 318 KB

english, 2004

21

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Creation of calibration services for fiber optic power meters and optical time-domain reflectometers in the Ukraine

Machekhin, Yu. P., Odinets, V., Shalayev, Y., Zub, S., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 295 KB

english, 1999

22

SPIE Proceedings [SPIE Laser Technology V - Szczecin-Swinoujscie, Poland (Monday 23 September 1996)] Laser Technology V: Physics and Research and Development Trends - Standards of energetic units for laser techniques

Dlugaszek, Andrzej, Jankiewicz, Zdzislaw, Owsik, Jan, Wolinski, Wieslaw L., Malinowski, Michal

Year:

1997

Language:

english

File:

PDF, 1.44 MB

english, 1997

23

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Realization of the Ukrainian standard in the measurement of illuminance by noncoherent radiation

Nazarenko, Leonid A., Polevoi, V. I., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 346 KB

english, 1999

24

SPIE Proceedings [SPIE Boulder Damage Symposium XXXVI - Boulder, CO (Monday 20 September 2004)] Laser-Induced Damage in Optical Materials: 2004 - Computer modelling of a phenomenon of laser pulse interaction with solid body

Exarhos, Gregory J., Janucki, Jacek, Owsik, Jan A., Guenther, Arthur H., Kaiser, Norbert, Jach, Karol, Lewis, Keith L., Soileau, M. J., Stolz, Christopher J.

Year:

2004

Language:

english

File:

PDF, 185 KB

english, 2004

25

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Polish metrological basis for the study of lasers

Owsik, Jan, Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 208 KB

english, 1999

26

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Calibration of radiant laser power with a cryogenic radiometer at visible wavelengths and at 10.6 um

Werner, Goesta, Liedquist, Lief E., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 351 KB

english, 1999

27

SPIE Proceedings [SPIE Boulder Damage Symposium XXXVI - Boulder, CO (Monday 20 September 2004)] Laser-Induced Damage in Optical Materials: 2004 - Influence of temporal and energetic laser-pulse characteristics on the parameters of shock waves generated in materials

Owsik, Jan A., Exarhos, Gregory J., Guenther, Arthur H., Janucki, Jacek, Jach, Karol, Kaiser, Norbert, Lewis, Keith L., Swierczynski, Robert, Soileau, M. J., Stolz, Christopher J.

Year:

2004

Language:

english

File:

PDF, 994 KB

english, 2004

28

SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, USA (Saturday 22 January 2011)] Solid State Lasers XX: Technology and Devices - Precision Fresnel attenuator of the beam power of laser radiation

Owsik, Jan, Clarkson, W. Andrew, Hodgson, Norman, Kovalev, Anatoly A., Moskalyuk, Sergey A., Shori, Ramesh, Yankevich, Eugeny B., Rembielińska, Anna

Year:

2011

Language:

english

File:

PDF, 565 KB

english, 2011

29

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Reproduction of emissive power (self-calibration) using an emissive diode

Lovinsky, L. S., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 212 KB

english, 1999

30

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Remote transfer system of physical magnitude units

Ivanov, Vladimir S., Kotyuk, Andrei F., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 245 KB

english, 1999

31

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - National system of metrological assurance of laser radiation energy parameter measurements in Ukraine

Grishchenko, L. V., Solovyov, Valentin S., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 636 KB

english, 1999

32

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Metrological problems of high-power laser beams

Peshko, Igor I., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 1.29 MB

english, 1999

33

SPIE Proceedings [SPIE Laser Technology: Fourth Symposium - Szczecin-Swinoujscie, Poland (Sunday 26 September 1993)] Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing - Tasks and organization problems of the optoelectronic metrology laboratory

Owsik, Jan, Wolinski, Wieslaw L., Jankiewicz, Zdzislaw, Gajda, Jerzy K., Wolczak, Bohdan K.

Year:

1995

Language:

english

File:

PDF, 341 KB

english, 1995

34

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Reproduction of the units of power and energy in various areas of physics

Ivanov, Vladimir S., Kotyuk, Andrei F., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 388 KB

english, 1999

35

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Transmitting-receiving system operating with the range of eye-safe radiation

Bielecki, Zbigniew, Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 366 KB

english, 1999

36

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California (Saturday 22 January 2011)] Physics and Simulation of Optoelectronic Devices XIX - Influence of pressure on optical absorption of triglycine selenium single crystals

Ozga, Katarzyna, Witzigmann, Bernd, Henneberger, Fritz, Kityk, Iwan V., Owsik, Jan, Arakawa, Yasuhiko, Freundlich, Alexandre, Berdowski, Janusz, Tylczynski, Zbigniew, Wojciechowski, Artur, Ślęzak, And

Year:

2011

Language:

english

File:

PDF, 1.88 MB

english, 2011

37

SPIE Proceedings [SPIE European Symposium on Optics and Photonics for Defence and Security - London, United Kingdom (Monday 25 October 2004)] Technologies for Optical Countermeasures - An optical method for document protection against counterfeit

Janucki, Jacek, Titterton, David H., Owsik, Jan

Year:

2004

Language:

english

File:

PDF, 112 KB

english, 2004

38

SPIE Proceedings [SPIE Laser Technology: Fourth Symposium - Szczecin-Swinoujscie, Poland (Sunday 26 September 1993)] Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing - Essential aspects of metrological protection of laser technology

Owsik, Jan, Wolinski, Wieslaw L., Jankiewicz, Zdzislaw, Gajda, Jerzy K., Wolczak, Bohdan K.

Year:

1995

Language:

english

File:

PDF, 123 KB

english, 1995

39

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Ukrainian radiometric realization of the candela

Kupko, Alexander D., Nazarenko, Leonid A., Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 258 KB

english, 1999

40

SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, USA (Saturday 2 February 2013)] Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVIII - Fresnel attenuator of laser radiation power

Owsik, Jan, Avdeev, Yury, Liberman, Anatoly A., Kovalev, Alexander A., Mikryukov, Alexey S., Moskalyuk, Sergey A., Noga, Janusz, Rembielińska, Anna, Walczuk, Joanna, Xu, Xianfan, Hennig, Guido, Nakata

Year:

2013

Language:

english

File:

PDF, 662 KB

english, 2013

41

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Accredited testing laboratory at the Institute of Optoelectroncis

Dlugaszek, Andrzej, Janucki, Jacek, Nowakowski, Miroslaw, Skrzeczanowski, Wojciech, Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 236 KB

english, 1999

42

SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Measurements of cavity losses in diode-pumped lasers

Jabczynski, Jan K., Kopczynski, Krzysztof, Marciniak, Piotr, Owsik, Jan, Wiecek, Tomasz

Year:

1999

Language:

english

File:

PDF, 365 KB

english, 1999