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51

Comment respecter totalement un protocole?

Perrillat, F., Buchet, V., Matte, C., Ciocan, I., Peribois, G., Slamani, L., Mer, L., Delerce, F.

Journal:

Journal Européen des Urgences

Year:

2007

Language:

french

File:

PDF, 86 KB

french, 2007

52

Les urgentistes, doivent-ils faire de l'échographie?

Perrillat, F., Matte, C., Ciocan, I., Slamani, L., Peribois, G., Mer, L., Delerce, F., Beghin, M.-A.

Journal:

Journal Européen des Urgences

Year:

2007

Language:

french

File:

PDF, 99 KB

french, 2007

53

[IEEE AFRICON 2013 - Pointe-Aux-Piments, Mauritius (2013.09.9-2013.09.12)] 2013 Africon - Energetic capability characterization for the tidal turbine farm implementation

Diallo, Mamadou Oury Fatoumata, Youssef, Slamani, Gualous, Hamid, Thiebot, Jerome, Camara, Mamadou Bailo, Dakyo, Brayima

Year:

2013

Language:

english

File:

PDF, 417 KB

english, 2013

54

[IEEE 6th International Conference on Image Processing (ICIP'99) - Kobe, Japan (24-28 Oct. 1999)] Proceedings 1999 International Conference on Image Processing (Cat. 99CH36348) - Image processing tools for the enhancement of concealed weapon detection

Slamani, M.-A., Varshney, P.K., Rao, R.M., Alford, M.G., Ferris, D.

Year:

1999

Language:

english

File:

PDF, 907 KB

english, 1999

55

Comparison of two models for predicting tool wear and cutting force components during high speed trimming of CFRP

Slamani, Mohamed, Chatelain, Jean-François, Hamedanianpour, Hossein

Journal:

International Journal of Material Forming

Year:

2015

Language:

english

File:

PDF, 1.50 MB

english, 2015

56

[IEEE Tenth International Conference on Microelectronics - Monastir, Tunisia (14-16 Dec. 1998)] Proceedings of the Tenth International Conference on Microelectronics (Cat. No.98EX186) - High performance integrated CMOS frequency-to-voltage converter

Djemouai, A., Sawan, M., Slamani, M.

Year:

1998

Language:

english

File:

PDF, 397 KB

english, 1998

57

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector

Nassery, Afsaneh, Byregowda, Srinath, Ozev, Sule, Verhelst, Marian, Slamani, Mustapha

Year:

2012

Language:

english

File:

PDF, 1.80 MB

english, 2012

58

Structural, elastic, electronic and thermodynamic properties of uranium filled skutterudites UFe4P12: First principle method

Ameri, Mohammed, Amel, Slamani, Abidri, Boualem, Ameri, Ibrahim, Al-Douri, Y., Bouhafs, Bachir, Varshney, Dinesh, Aze-Eddine, Adjadj, Nadia, Louahala

Journal:

Materials Science in Semiconductor Processing

Year:

2014

Language:

english

File:

PDF, 1.79 MB

english, 2014

59

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Built-in self-test and characterization of polar transmitter parameters in the loop-back mode

Jeong, Jae Woong, Ozev, Sule, Sen, Shreyas, Natarajan, Vishwanath, Slamani, Mustapha

Year:

2014

Language:

english

File:

PDF, 402 KB

english, 2014

60

[IEEE ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems - Jounieh, Lebanon (17-20 Dec. 2000)] ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.00EX445) - New CMOS integrated pulse width modulator for voltage conversion applications

Djemouai, A., Sawan, M., Slamani, M.

Year:

2000

Language:

english

File:

PDF, 365 KB

english, 2000

61

A study of the combined effects of machining parameters on cutting force components during high speed robotic trimming of CFRPs

Slamani, Mohamed, Gauthier, Sébastien, Chatelain, Jean-François

Journal:

Year:

2015

Language:

english

File:

PDF, 1.15 MB

english, 2015

62

IMPROVEMENT TO HIGH-SPEED END MILL BORING ACCURACY BY A SIMPLE COMPENSATION STRATEGY

Slamani, Mohamed, Mayer, Rene, Balazinski, Marek, Carrier, Benjamin, Engin, Serafettin

Journal:

Machining Science and Technology

Year:

2012

Language:

english

File:

PDF, 1.49 MB

english, 2012

63

[IEEE 1998 IEEE International Conference on Electronics, Circuits and Systems. Surfing the Waves of Science and Technology - Lisboa, Portugal (7-10 Sept. 1998)] 1998 IEEE International Conference on Electronics, Circuits and Systems. Surfing the Waves of Science and Technology (Cat. No.98EX196) - A DSP testing approach by modeling the circuit response as a Markov chain

Slamani, M., Zineb, M., Boukadoum, M.

Year:

1998

Language:

english

File:

PDF, 582 KB

english, 1998

64

[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Test hardware design challenges in RF testing

Slamani, M., Ding, H.

Year:

2002

Language:

english

File:

PDF, 197 KB

english, 2002

65

Multifrequency analysis of faults in analog circuits

Slamani, M., Kaminska, B.

Journal:

IEEE Design & Test of Computers

Year:

1995

Language:

english

File:

PDF, 922 KB

english, 1995

66

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Impedance mismatch and lumped capacitance effects in high frequency testing

Sylla, I.T., Slamani, M., Kaminska, B., Hossein, F.M., Vincent, P.

Year:

1998

Language:

english

File:

PDF, 170 KB

english, 1998

67

[IEEE 2008 58th Electronic Components and Technology Conference (ECTC 2008) - Lake Buena Vista, FL, USA (2008.05.27-2008.05.30)] 2008 58th Electronic Components and Technology Conference - Cost-competitive RF wafer test methodology for high volume production of complex RF ICs

Paganini, Andrea, Slamani, Mustapha, Hanyi Ding,, Ferrario, John, Nanju Na,

Year:

2008

Language:

english

File:

PDF, 958 KB

english, 2008

68

[IEEE The Record of the 1993 IEEE National Radar Conference - Lynnfield, MA, USA (20-22 April 1993)] The Record of the 1993 IEEE National Radar Conference - Performance of the locally optimum detector in a correlated K-distributed disturbance

Chakravarthi, P.R., Weiner, D.D., Slamani, M.

Year:

1993

Language:

english

File:

PDF, 555 KB

english, 1993

69

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Analog/RF test ordering in the early stages of production testing

Akkouche, Nourredine, Mir, Salvador, Simeu, Emmanuel, Slamani, Mustapha

Year:

2012

Language:

english

File:

PDF, 1.81 MB

english, 2012

70

[IEEE 1998 IEEE Information Technology Conference, Information Environment for the Future (Cat. No.98EX228) - Syracuse, NY, USA (1-3 Sept. 1998)] 1998 IEEE Information Technology Conference, Information Environment for the Future (Cat. No.98EX228) - On the modeling of the sensor fusion process for concealed weapons detection

Varshney, P.K., Slamani, M.-A., Alford, M.G., Ferris, D.

Year:

1998

Language:

english

File:

PDF, 121 KB

english, 1998

71

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Continuous wave radar circuitry testing using OFDM technique

Metwally, Mohamed, L'Esperance, Nicholai, Xia, Tian, Slamani, Mustapha

Year:

2014

Language:

english

File:

PDF, 387 KB

english, 2014

72

[IEEE 1994 37th Midwest Symposium on Circuits and Systems - Lafayette, LA, USA (3-5 Aug. 1994)] Proceedings of 1994 37th Midwest Symposium on Circuits and Systems - A new approach to scene analysis for IR images

Slamani, M.A., Weiner, D.D., Ozturk, A.

Year:

1994

Language:

english

File:

PDF, 415 KB

english, 1994

73

Analog circuit fault diagnosis based on sensitivity computation and functional testing

Slamani, M., Kaminska, B.

Journal:

IEEE Design & Test of Computers

Year:

1992

Language:

english

File:

PDF, 785 KB

english, 1992

74

[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Non-RF to RF Test Correlation Using Learning Machines: A Case Study

Stratigopoulos, Haralampos-G.D., Drineas, Petros, Slamani, Mustapha, Makris, Yiorgos

Year:

2007

Language:

english

File:

PDF, 4.35 MB

english, 2007

75

[IEEE [1992] IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis - Victoria, BC, Canada (4-6 Oct. 1992)] [1992] Proceedings of the IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis - Continuous-time continuous-frequency and discrete-time discrete-frequency ambiguity functions

Slamani, M., Weiner, D., Tsao, T., Varshney, P., Schwarzlander, H., Borek, S.

Year:

1992

Language:

english

File:

PDF, 250 KB

english, 1992

76

[Int. Test Conference International Test Conference - Washington, DC, USA (2-6 Oct. 1994)] Proceedings., International Test Conference - An integrated approach for analog circuit testing with a minimum number of detected parameters

Slamani, M., Kaminska, B., Quesnel, G.

Year:

1994

Language:

english

File:

PDF, 1.12 MB

english, 1994

77

[IEEE Annual International Conference of the IEEE Engineering in Medicine and Biology Society Volume 13: 1991 - Orlando, FL, USA (31 Oct.-3 Nov. 1991)] Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society Volume 13: 1991 - Biolink: A New Myoelectric Pointing Device For interactive Computer Systems: Evaluation Of The Human Performance And Integrated Realization

Aubin, F., Slamani, M., Karninska, B., Robert, J.M.

Year:

1991

Language:

english

File:

PDF, 207 KB

english, 1991

78

[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion

Nassery, Afsaneh, Ozev, Sule, Slamani, Mustapha

Year:

2013

Language:

english

File:

PDF, 303 KB

english, 2013

79

[IEEE Comput. Soc. Press IEEE VLSI Test Symposium - Cherry Hill, NJ, USA (25-28 April 1994)] Proceedings of IEEE VLSI Test Symposium - Multifrequency testability analysis for analog circuits

Slamani, M., Kaminska, B.

Year:

1994

Language:

english

File:

PDF, 576 KB

english, 1994

80

[IEEE 2000 Canadian Conference on Electrical and Computer Engineering Conference Proceedings. Navigating to a New Era - Halifax, NS, Canada (7-10 March 2000)] 2000 Canadian Conference on Electrical and Computer Engineering. Conference Proceedings. Navigating to a New Era (Cat. No.00TH8492) - Power penalty improvement for burst-mode fibre optic receivers

Boyogueno, A., Slamani, M.

Year:

2000

Language:

english

File:

PDF, 430 KB

english, 2000

81

[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Testing highly integrated wireless circuits and systems with low cost tester: how to overcome the challenge?

Year:

2002

Language:

english

File:

PDF, 50 KB

english, 2002

82

[IEEE 2008 13th IEEE European Test Symposium (ETS) - Verbania, italy (2008.05.25-2008.05.29)] 2008 13th European Test Symposium - Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction

Kupp, Nathan, Drineas, Petros, Slamani, Mustapha, Makris, Yiorgos

Year:

2008

Language:

english

File:

PDF, 7.27 MB

english, 2008

83

Fault observability analysis of analog circuits in frequency domain

Slamani, M., Kaminska, B.

Journal:

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing

Year:

1996

Language:

english

File:

PDF, 720 KB

english, 1996

84

[IEEE [1992] 35th Midwest Symposium on Circuits and Systems - Washington, DC, USA (9-12 Aug. 1992)] [1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems - Comparative study of the transversal filter with conventional DFT processing in a nonlinear radar receiver

Slamani, M.A., Weiner, D.D.

Year:

1992

Language:

english

File:

PDF, 497 KB

english, 1992

85

[IEEE 2011 Design, Automation & Test in Europe - Grenoble (2011.03.14-2011.03.18)] 2011 Design, Automation & Test in Europe - Correlating inline data with final test outcomes in analog/RF devices

Kupp, N, Slamani, M, Makris, Y

Year:

2011

Language:

english

File:

PDF, 469 KB

english, 2011

86

[IEEE IEEE Nuclear Science Symposium Conference Record, 2005 - Wyndham El Conquistador Resort, Puerto Rico (October 23 - 29, 2005)] IEEE Nuclear Science Symposium Conference Record, 2005 - Ultra High Resolution 3D Model of the Murine Heart from Micro-CT and Serial Confocal Laser Scanning Microscopy Images

Poddar, A.H., Krol, A., Beaumont, J., Price, R.L., Slamani, M.A., Fawcett, J., Subramanian, A., Coman, I.L., Lipson, E.D., Feiglin, D.H.

Year:

2005

Language:

english

File:

PDF, 604 KB

english, 2005

87

[IEEE 2006 American Control Conference - Minneapolis, MN, USA (2006.06.14-2006.06.16)] 2006 American Control Conference - Study of invariance properties in robotic systems: a Lagrangian formulation approach

Lakhdari, Z., Makany, P., Rouff, M., Slamani, Y.

Year:

2006

Language:

english

File:

PDF, 526 KB

english, 2006

88

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Reducing high-speed/rf test cost-guaranteed by design or guaranteed to fail?

Year:

2005

Language:

english

File:

PDF, 172 KB

english, 2005

89

[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - T-BIST: A built-in self-test for analog circuits based on parameter translation

Slamani, M., Kaminska, B.

Year:

1993

Language:

english

File:

PDF, 845 KB

english, 1993

90

[IEEE Comput. Soc IEEE Conference on Advanced Video and Signal Based Surveillance. AVSS 2003 - Miami, FL, USA (21-22 July 2003)] Proceedings of the IEEE Conference on Advanced Video and Signal Based Surveillance, 2003. - On registration of regions of interest (ROI) in video sequences

Hua-mei Chen,, Varshney, P.K., Slamani, M.-A.

Year:

2003

Language:

english

File:

PDF, 432 KB

english, 2003

91

[IEEE Comput. Soc. Press [1992] The European Conference on Design Automation - Brussels, Belgium (16-19 March 1992)] [1992] Proceedings The European Conference on Design Automation - Testing analog circuits by sensitivity computation

Slamani, M., Kaminska, B.

Year:

1992

Language:

english

File:

PDF, 573 KB

english, 1992

92

[IEEE 36th Midwest Symposium on Circuits and Systems - Detroit, MI, USA (16-18 Aug. 1993)] Proceedings of 36th Midwest Symposium on Circuits and Systems - Probabilistic insight into the application of image processing to the mapping of clutter and noise regions in a radar surveillance volume

Slamani, M.A., Weiner, D.D.

Year:

1993

Language:

english

File:

PDF, 556 KB

english, 1993

93

A BiCMOS 120 mW 11 GHz TRANSIMPEDANCE AMPLIFIER DEDICATED FOR HIGH-SPEED PHOTORECEIVERS

BOYOGUÉNO, ANDRÉ, SAWAN, MOHAMAD, SLAMANI, MUSTAPHA

Journal:

Journal of Circuits System and Computers

Year:

2006

Language:

english

File:

PDF, 1.14 MB

english, 2006

94

<i>Ab Initio</i> Study of Structural and Electronic Properties of Barium Chalcogenide Alloys

Ameri, Mohammed, Touia, Amina, Khachai, Houari, Mahdjoub, Zoubir, Chekroun, Mohamed Zoheir, Slamani, Amel

Journal:

Materials Sciences and Applications

Year:

2012

Language:

english

File:

PDF, 750 KB

english, 2012

95

SPIE Proceedings [SPIE AeroSense 2002 - Orlando, FL (Monday 1 April 2002)] Infrared and Passive Millimeter-wave Imaging Systems: Design, Analysis, Modeling, and Testing - Survey of image processing techniques applied to the enhancement and detection of weapons in MMW data

Slamani, Mohamed-Adel, Varshney, Pramod K., Ferris, Jr., David D., Appleby, Roger, Holst, Gerald C., Wikner, David A.

Year:

2002

Language:

english

File:

PDF, 1.46 MB

english, 2002

96

[IEEE ISCAS'99. 1999 IEEE International Symposium on Circuits and Systems. VLSI - Orlando, FL, USA (30 May-2 June 1999)] ISCAS'99. Proceedings of the 1999 IEEE International Symposium on Circuits and Systems VLSI (Cat. No.99CH36349) - An efficient RF power transfer and bidirectional data transmission to implantable electronic devices

Djemouai, A., Sawan, M., Slamani, M.

Year:

1999

Language:

english

File:

PDF, 433 KB

english, 1999

97

[IEEE ICIP 2002 International Conference on Image Processing - Rochester, NY, USA (22-25 Sept. 2002)] Proceedings. International Conference on Image Processing - Noise reduction and object enhancement in passive millimeter wave concealed weapon detection

Seungsin Lee,, Rao, R., Slamani, M.-A.

Year:

2002

Language:

english

File:

PDF, 276 KB

english, 2002

98

Online Supercapacitor Diagnosis for Electric Vehicle Applications

A. El Mejdoubi, A. Oukaour, H. Chaoui, Y. Slamani, J. Sabor, H. Gualous

Year:

2015

Language:

english

File:

PDF, 1004 KB

english, 2015

99

SPIE Proceedings [SPIE Medical Imaging 2004 - San Diego, CA (Saturday 14 February 2004)] Medical Imaging 2004: Image Processing - Three-dimensional reconstruction of large tissue volumes from scanning laser confocal microscopy

Slamani, Mohamed-Adel, Krol, Andrzej, Beaumont, Jacques, Price, Robert L., Coman, Ioana L., Lipson, Edward D., Fitzpatrick, J. Michael, Sonka, Milan

Year:

2004

Language:

english

File:

PDF, 198 KB

english, 2004

100

Influence of Salt Stress on Growth and Frost Resistance of Three Winter Cereals

Matuszak-Slamani, Renata, Brzóstowicz, Aleksander

Journal:

International Agrophysics

Year:

2015

Language:

english

File:

PDF, 713 KB

english, 2015

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