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51

[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Test Generation for Timing-Critical Transition Faults

Lin, Xijiang, Kassab, Mark, Rajski, Janusz

Year:

2007

Language:

english

File:

PDF, 321 KB

english, 2007

52

Test compaction for small-delay defects using an effective path selection scheme

Xiang, Dong, Li, Jianbo, Chakrabarty, Krishnendu, Lin, Xijiang

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2013

Language:

english

File:

PDF, 378 KB

english, 2013

53

[IEEE 2017 IEEE International Test Conference (ITC) - Fort Worth, TX (2017.10.31-2017.11.2)] 2017 IEEE International Test Conference (ITC) - On applying scan based structural test for designs with dual-edge triggered flip-flops

Year:

2017

Language:

english

File:

PDF, 654 KB

english, 2017

54

[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Power Supply Droop and Its Impacts on Structural At-Speed Testing

Year:

2012

Language:

english

File:

PDF, 377 KB

english, 2012

55

[ACM Press the conference - Munich, Germany (1999..-..)] Proceedings of the conference on Design, automation and test in Europe - DATE '99 - Full scan fault coverage with partial scan

Lin, Xijiang, Pomeranz, Irith, Reddy, Sudhakar M.

Year:

1999

Language:

english

File:

PDF, 157 KB

english, 1999

56

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Clock control architecture and ATPG for reducing pattern count in SoC designs with multiple clock domains

Waayers, Tom, Morren, Richard, Lin, Xijiang, Kassab, Mark

Year:

2010

Language:

english

File:

PDF, 685 KB

english, 2010

57

[IEEE 2015 12th International Conference on Fuzzy Systems and Knowledge Discovery (FSKD) - Zhangjiajie, China (2015.8.15-2015.8.17)] 2015 12th International Conference on Fuzzy Systems and Knowledge Discovery (FSKD) - Speech enhancement based on the Wiener filter and wavelet entropy

Mingke Jiao,, Lin Lou,, Xiliang Geng,, Zhongming Wang,, Peng Zhang,, Xijiang Liao,, Wenyuan Zhang,

Year:

2015

Language:

english

File:

PDF, 592 KB

english, 2015

58

Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill

Xiang, Dong, Shen, Kele, Bhattacharya, Bhargab, Wen, Xiaoqing, Lin, Xijiang

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2015

Language:

english

File:

PDF, 171 KB

english, 2015

59

One-step synthesis of novel Fe3C@nitrogen-doped carbon nanotubes/graphene nanosheets for catalytic degradation of Bisphenol A in the presence of peroxymonosulfate

Ma, Wenjie, Wang, Na, Du, Yunchen, Tong, Tianze, Zhang, Leijiang, Andrew Lin, Kun-Yi, Han, Xijiang

Journal:

Chemical Engineering Journal

Year:

2018

Language:

english

File:

PDF, 1.90 MB

english, 2018

60

The accelerated de-dispersion and sedimentation behaviors of multi walled carbon nanotube suspensions using surfactants

Jin, Lin, Haiyan, Zhang, Ping, Li, Xijiang, Yin, Aikseng, Low

Journal:

Materials Chemistry and Physics

Year:

2013

Language:

english

File:

PDF, 1.29 MB

english, 2013

61

[IEEE 2013 22nd Asian Test Symposium (ATS) - Yilan County, Taiwan (2013.11.18-2013.11.21)] 2013 22nd Asian Test Symposium - Multicycle-aware At-speed Test Methodology

Tsai, Kun-Han, Lin, Xijiang

Year:

2013

Language:

english

File:

PDF, 431 KB

english, 2013

62

[ACM Press the 40th conference - Anaheim, CA, USA (2003.06.02-2003.06.06)] Proceedings of the 40th conference on Design automation - DAC '03 - Test generation for designs with multiple clocks

Lin, Xijiang, Thompson, Rob

Year:

2003

Language:

english

File:

PDF, 146 KB

english, 2003

63

Fast fabrication of homogeneous silver nanostructures on hydrazine treated polyaniline films for SERS applications

He, Jiaojiao, Han, Xijiang, Yan, Jun, Kang, Leilei, Zhang, Bin, Du, Yunchen, Dong, Cunku, Wang, Hsing-Lin, Xu, Ping

Journal:

Year:

2012

Language:

english

File:

PDF, 817 KB

english, 2012

64

[IEEE 2011 International Green Computing Conference (IGCC) - Orlando, FL, USA (2011.07.25-2011.07.28)] 2011 International Green Computing Conference and Workshops - Low power testing - What can commercial DFT tools provide?

Year:

2011

Language:

english

File:

PDF, 219 KB

english, 2011

65

Inside Back Cover: In Situ Raman Monitoring of Silver(I)-Aided Laser-Driven Cleavage Reaction of Cyclobutane (ChemPhysChem 1/2016)

Chen, Dengtai, Han, Xijiang, Du, Yunchen, Wang, Hsing-Lin, Xu, Ping

Journal:

Year:

2016

File:

PDF, 1.96 MB

2016

66

In Situ Raman Monitoring of Silver(I)-Aided Laser-Driven Cleavage Reaction of Cyclobutane

Chen, Dengtai, Han, Xijiang, Du, Yunchen, Wang, Hsing-Lin, Xu, Ping

Journal:

Year:

2016

Language:

english

File:

PDF, 2.92 MB

english, 2016

67

[IEEE 2019 IEEE 28th Asian Test Symposium (ATS) - Kolkata, India (2019.12.10-2019.12.13)] 2019 IEEE 28th Asian Test Symposium (ATS) - TEA: A Test Generation Algorithm for Designs with Timing Exceptions

Wang, Naixing, Wang, Chen, Tsai, Kun-Han, Cheng, Wu-Tung, Lin, Xijiang, Kassab, Mark, Pomeranz, Irith

Year:

2019

Language:

english

File:

PDF, 7.99 MB

english, 2019

68

The Electromagnetic Shielding Effectiveness of a Low-Cost and Transparent Stainless Steel Fiber/Silicone Resin Composite

Jin, Lin, Haiyan, Zhang, Ping, Li, Xijiang, Yin, Guoxun, Zeng

Journal:

IEEE Transactions on Electromagnetic Compatibility

Year:

2014

Language:

english

File:

PDF, 720 KB

english, 2014

69

[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Novel techniques for achieving high at-speed transition fault test coverage for Motorola's microprocessors based on PowerPC/spl trade/ instruction set architecture

Tendolkar, N., Raina, R., Woltenberg, R., Xijiang Lin,, Swanson, B., Aldrich, G.

Year:

2002

Language:

english

File:

PDF, 252 KB

english, 2002

70

In Situ Surface-Enhanced Raman Spectroscopy Study of Plasmon-Driven Catalytic Reactions of 4-Nitrothiophenol under a Controlled Atmosphere

Kang, Leilei, Han, Xijiang, Chu, Jiayu, Xiong, Jie, He, Xiong, Wang, Hsing-Lin, Xu, Ping

Journal:

Year:

2015

Language:

english

File:

PDF, 2.16 MB

english, 2015

71

Electromagnetic shielding of multiwalled, bamboo-like carbon nanotube/methyl vinyl silicone composite prepared by liquid blending

Lin, Jin, Zhang, Haiyan, Li, Ping, Yin, Xijiang, Chen, Yiming, Zeng, Guoxun

Journal:

Composite Interfaces

Year:

2014

Language:

english

File:

PDF, 907 KB

english, 2014

72

[IEEE 2002 IEEE/ACM International Conference on Computer Aided Design (ICCAD) - San Jose, CA, USA (10-14 Nov. 2002)] IEEE/ACM International Conference on Computer Aided Design, 2002. ICCAD 2002. - Conflict driven techniques for improving deterministic test pattern generation

Chen Wang,, Reddy, S.M., Pomeranz, I., Xijiang Lin,, Rajski, J.

Year:

2002

Language:

english

File:

PDF, 717 KB

english, 2002

73

Heterogeneous Interface Induced the Formation of Hierarchically Hollow Carbon Microcubes against Electromagnetic Pollution

Zhao, Honghong, Xu, Xianzhu, Wang, Yahui, Fan, Dingge, Liu, Dawei, Lin, Kaifeng, Xu, Ping, Han, Xijiang, Du, Yunchen

Journal:

Year:

2020

File:

PDF, 2.08 MB

2020

74

Synthesis of homogeneous silver nanosheet assemblies for surface enhanced Raman scattering applications

Xu, Ping, Zhang, Bin, Mack, Nathan H., Doorn, Stephen K., Han, Xijiang, Wang, Hsing-Lin

Journal:

Journal of Materials Chemistry

Year:

2010

Language:

english

File:

PDF, 316 KB

english, 2010

75

[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - Test Generation for Designs with On-Chip Clock Generators

Lin, Xijiang, Kassab, Mark

Year:

2009

Language:

english

File:

PDF, 428 KB

english, 2009

76

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - On removing redundant faults in synchronous sequential circuits

Xijiang Lin,, Pomeranz, I., Reddy, S.M.

Year:

1998

Language:

english

File:

PDF, 217 KB

english, 1998

77

[IEEE 2015 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2015.10.6-2015.10.8)] 2015 IEEE International Test Conference (ITC) - On generating high quality tests based on cell functions

Lin, Xijiang, Reddy, Sudhakar M.

Year:

2015

Language:

english

File:

PDF, 211 KB

english, 2015

78

ChemInform Abstract: Multifunctional Polymer-Metal Nanocomposites via Direct Chemical Reduction by Conjugated Polymers

Xu, Ping, Han, Xijiang, Zhang, Bin, Du, Yunchen, Wang, Hsing-Lin

Journal:

Year:

2014

File:

PDF, 18 KB

2014

79

Scan-Based Tests with Low Switching Activity

Remersaro, S., Xijiang Lin, Reddy, S.M., Pomeranz, I., Rajski, J.

Journal:

IEEE Design & Test of Computers

Year:

2007

Language:

english

File:

PDF, 270 KB

english, 2007

80

[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - EMI shielding effectiveness of carbon nanotubes based composites

Li, Ping, Shan, Yueyan, Yin, Xijiang, Jin, Lin, Deng, Junhong

Year:

2012

Language:

english

File:

PDF, 683 KB

english, 2012

81

[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - Test Power Reduction by Blocking Scan Cell Outputs

Lin, Xijiang, Rajski, Janusz

Year:

2008

Language:

english

File:

PDF, 258 KB

english, 2008

82

[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - The Impacts of Untestable Defects on Transition Fault Testing

Xijiang Lin,, Rajski, J.

Year:

2006

Language:

english

File:

PDF, 300 KB

english, 2006

83

[IEEE 2015 28th International Conference on VLSI Design (VLSID) - Bangalore, India (2015.1.3-2015.1.7)] 2015 28th International Conference on VLSI Design - Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits

Lin, Xijiang, Reddy, Sudhakar M., Rajski, Janusz

Year:

2015

Language:

english

File:

PDF, 280 KB

english, 2015

84

[IEEE Comput. Soc International Conference on Computer Design. VLSI in Computers and Processors - Austin, TX, USA (5-7 Oct. 1998)] Proceedings International Conference on Computer Design. VLSI in Computers and Processors (Cat. No.98CB36273) - On finding undetectable and redundant faults in synchronous sequential circuits

Xijiang Lin,, Pomeranz, I., Reddy, S.M.

Year:

1998

Language:

english

File:

PDF, 172 KB

english, 1998

85

[IEEE 2015 IEEE 24th Asian Test Symposium (ATS) - Mumbai, India (2015.11.22-2015.11.25)] 2015 IEEE 24th Asian Test Symposium (ATS) - On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults

Lin, Xijiang, Cheng, Wu-Tung, Rajski, Janusz

Year:

2015

Language:

english

File:

PDF, 232 KB

english, 2015

86

[IEEE 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Bochum, Germany (2017.7.3-2017.7.5)] 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Functional Broadside Test Generation Using a Commercial ATPG Tool

Wang, Naixing, Yao, Bo, Lin, Xijiang, Pomeranz, Irith

Year:

2017

Language:

english

File:

PDF, 633 KB

english, 2017

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