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51

Dissolution of Nonuniformly Distributed Immiscible Liquid: Intermediate-Scale Experiments and Mathematical Modeling

Brusseau, Mark L., Zhang, Zhihui, Nelson, Nicole T., Cain, R. Brent, Tick, Geoffrey R., Oostrom, Mart

Journal:

Environmental Science & Technology

Year:

2002

Language:

english

File:

PDF, 120 KB

english, 2002

52

[IEEE 1995 IEEE Ultrasonics Symposium. An International Symposium - Seattle, WA, USA (7-10 Nov. 1995)] 1995 IEEE Ultrasonics Symposium. Proceedings. An International Symposium - 2D large aperture ultrasound phased arrays for hyperthermia cancer therapy: design, fabrication and experimental results

VanBaren, P., Kluiwstra, J.-U., Seip, R., Zhang, Y., Ebbini, E.S., Cain, C.A.

Year:

1995

Language:

english

File:

PDF, 278 KB

english, 1995

53

[IEEE 1995 IEEE Ultrasonics Symposium. An International Symposium - Seattle, WA, USA (7-10 Nov. 1995)] 1995 IEEE Ultrasonics Symposium. Proceedings. An International Symposium - Ultrasound phased arrays for noninvasive myocardial ablation: initial studies

Kluiwstra, J.-U., Zhang, Y., VanBaren, P., Strickberg, S.A., Ebbini, E.S., Cain, C.A.

Year:

1995

Language:

english

File:

PDF, 250 KB

english, 1995

54

Adaptive Control via a Simple Switching Algorithm

Zhang, Ji Feng, Caines, Peter E.

Journal:

SIAM Journal on Control and Optimization

Year:

1996

Language:

english

File:

PDF, 1.79 MB

english, 1996

55

[IEEE 2013 IEEE International Ultrasonics Symposium (IUS) - Prague, Czech Republic (2013.07.21-2013.07.25)] 2013 IEEE International Ultrasonics Symposium (IUS) - Investigation of the mechanism of ARFI-based Color Doppler feedback of histotripsy tissue fractionation

Miller, Ryan M., Xi Zhang,, Maxwell, Adam D., Tzu-Yin Wang,, Brian Fowlkes, J., Cain, Charles A., Zhen Xu,

Year:

2013

Language:

english

File:

PDF, 890 KB

english, 2013

56

Multiwell micromechanical cantilever array reader for biotechnology

Zhang, R., Best, A., Berger, R., Cherian, S., Lorenzoni, S., Macis, E., Raiteri, R., Cain, R.

Journal:

Review of Scientific Instruments

Year:

2007

Language:

english

File:

PDF, 845 KB

english, 2007

57

[IEEE 1992 31st IEEE Conference on Decision and Control - Tucson, AZ, USA (16-18 Dec. 1992)] [1992] Proceedings of the 31st IEEE Conference on Decision and Control - Adaptive control for jump parameter systems via nonlinear filtering

Caines, P.E., Zhang, J.-F.

Year:

1992

Language:

english

File:

PDF, 428 KB

english, 1992

58

Real-Time Feedback of Histotripsy Thrombolysis Using Bubble-Induced Color Doppler

Zhang, Xi, Miller, Ryan M., Lin, Kuang-Wei, Levin, Albert M., Owens, Gabe E., Gurm, Hitinder S., Cain, Charles A., Xu, Zhen

Journal:

Ultrasound in Medicine & Biology

Year:

2015

Language:

english

File:

PDF, 3.26 MB

english, 2015

59

Lack of Self-Administration of Cocaine in Dopamine D1 Receptor Knock-Out Mice

Caine, S. B., Thomsen, M., Gabriel, K. I., Berkowitz, J. S., Gold, L. H., Koob, G. F., Tonegawa, S., Zhang, J., Xu, M.

Journal:

Journal of Neuroscience

Year:

2007

Language:

english

File:

PDF, 662 KB

english, 2007

60

Estrogen-related receptor regulates osteoblast differentiation via Wnt/ -catenin signaling

Auld, K. L., Berasi, S. P., Liu, Y., Cain, M., Zhang, Y., Huard, C., Fukayama, S., Zhang, J., Choe, S., Zhong, W., Bhat, B. M., Bhat, R. A., Brown, E. L., Martinez, R. V.

Journal:

Journal of Molecular Endocrinology

Year:

2012

Language:

english

File:

PDF, 317 KB

english, 2012

61

CSF tau and tau/Aβ42 predict cognitive decline in Parkinson's disease

Liu, Changqin, Cholerton, Brenna, Shi, Min, Ginghina, Carmen, Cain, Kevin C., Auinger, Peggy, Zhang, Jing

Journal:

Parkinsonism & Related Disorders

Year:

2015

Language:

english

File:

PDF, 546 KB

english, 2015

62

Cellular Uptake of Exogenous Human PDCD5 Protein

Wang, Ying, Li, Dan, Fan, Hui, Tian, Linjie, Zhong, Yingcheng, Zhang, Yingmei, Yuan, Lan, Jin, Caining, Yin, Caihua, Ma, Dalong

Journal:

Journal of Biological Chemistry

Year:

2006

Language:

english

File:

PDF, 1.51 MB

english, 2006

63

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - Solving next generation (1x node) metrology challenges using advanced CDSEM capabilities: tilt, high energy and backscatter imaging

Cain, Jason P., Sanchez, Martha I., Zhang, Xiaoxiao, Snow, Patrick W., Vaid, Alok, Solecky, Eric, Zhou, Hua, Ge, Zhenhua, Yasharzade, Shay, Shoval, Ori, Adan, Ofer, Schwarzband, Ishai, Bar-Zvi, Maayan

Year:

2015

Language:

english

File:

PDF, 1.29 MB

english, 2015

64

Evaluation of a nutrition education intervention for women residents of Washington, DC, public housing communities

Shankar, S., Klassen, A. C., Garrett-Mayer, E., Houts, P. S., Wang, T., McCarthy, M., Cain, R., Zhang, L.

Journal:

Health Education Research

Year:

2006

Language:

english

File:

PDF, 111 KB

english, 2006

65

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - Grazing-incidence small angle x-ray scattering studies of nanoscale polymer gratings

Cain, Jason P., Sanchez, Martha I., Doxastakis, Manolis, Suh, Hyo Seon, Chen, Xuanxuan, Rincon Delgadillo, Paulina A., Wan, Lingshu, Williamson, Lance, Jiang, Zhang, Strzalka, Joseph, Wang, Jin, Chen,

Year:

2015

Language:

english

File:

PDF, 1.66 MB

english, 2015

66

[IEEE 42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475) - Maui, Hawaii, USA (Dec. 9-12, 2003)] 42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475) - A stochastic approximation approach to the robust power control problem

Huanshui Zhang,, Weiyan Ge,, Wing Shing Wong,, Caines, P.E.

Year:

2003

Language:

english

File:

PDF, 308 KB

english, 2003

67

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - Data refinement for robust solution to the inverse problem in optical scatterometry

Cain, Jason P., Sanchez, Martha I., Zhu, Jinlong, Jiang, Hao, Zhang, Chuanwei, Chen, Xiuguo, Liu, Shiyuan

Year:

2015

Language:

english

File:

PDF, 398 KB

english, 2015

68

Human carboxypeptidase A4: Characterization of the substrate specificity and implications for a role in extracellular peptide processing

Tanco, Sebastian, Zhang, Xin, Morano, Cain, Aviles, Francesc Xavier, Lorenzo, Julia, Fricker, Lloyd D.

Journal:

Journal of Biological Chemistry

Year:

2010

Language:

english

File:

PDF, 2.27 MB

english, 2010

69

Spatiotemporal dynamics of doxorubicin elution from embolic beads within a microfluidic network

Carugo, Dario, Capretto, Lorenzo, Roy, Bibhas, Carboni, Michele, Caine, Marcus, Lewis, Andrew L., Hill, Martyn, Chakraborty, Suman, Zhang, Xunli

Journal:

Journal of Controlled Release

Year:

2015

Language:

english

File:

PDF, 2.38 MB

english, 2015

70

SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] High-Power Lasers and Applications II - Performance evaluation of 10GBASE optical transceivers for Cisco 10-gigabit Ethernet switching architecture

Zhang, Xiaojing, Cain, Jeff C., Fan, Dianyuan, Truesdell, Keith A., Yasui, Koji

Year:

2002

Language:

english

File:

PDF, 760 KB

english, 2002

71

Targeting Notch Signaling with a Notch2/Notch3 Antagonist (Tarextumab) Inhibits Tumor Growth and Decreases Tumor-Initiating Cell Frequency

Yen, W.-C., Fischer, M. M., Axelrod, F., Bond, C., Cain, J., Cancilla, B., Henner, W. R., Meisner, R., Sato, A., Shah, J., Tang, T., Wallace, B., Wang, M., Zhang, C., Kapoun, A. M., Lewicki, J., Gurne

Journal:

Clinical Cancer Research

Year:

2015

Language:

english

File:

PDF, 1.65 MB

english, 2015

72

Bubble-induced Color Doppler Feedback for Histotripsy Tissue Fractionation

Miller, Ryan, Zhang, Xi, Maxwell, Adam, Cain, Charles, Xu, Zhen

Journal:

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control

Year:

2016

Language:

english

File:

PDF, 1.22 MB

english, 2016

73

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - Optimizing hybrid metrology: rigorous implementation of Bayesian and combined regression

Cain, Jason P., Sanchez, Martha I., Henn, Mark-Alexander, Silver, Richard M., Villarrubia, John S., Zhang, Nien Fan, Zhou, Hui, Barnes, Bryan M., Ming, Bin, Vladár, András E.

Year:

2015

Language:

english

File:

PDF, 1.63 MB

english, 2015

74

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - Machine learning and predictive data analytics enabling metrology and process control in IC fabrication

Cain, Jason P., Sanchez, Martha I., Rana, Narender, Zhang, Yunlin, Wall, Donald, Dirahoui, Bachir, Bailey, Todd C.

Year:

2015

Language:

english

File:

PDF, 1.81 MB

english, 2015

75

[IEEE IEEE Systems Man and Cybernetics Conference - SMC - Le Touquet, France (17-20 Oct. 1993)] Proceedings of IEEE Systems Man and Cybernetics Conference - SMC - An adaptive filter using Darwinian algorithm for system identification and control

Patiakin, O.V., Zhang, B.S., Cain, G.D., Leigh, J.R.

Year:

1993

Language:

english

File:

PDF, 381 KB

english, 1993

76

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - Study on ADI CD bias correlating ABC function

Cain, Jason P., Sanchez, Martha I., Deng, Guogui, Hao, Jingan, Xing, Bin, Jiang, Yuntao, Li, Gaorong, Zhang, Qiang, Yue, Liwan, Zu, Yanlei, Hu, Huayong, Liu, Chang, Shen, Manhua, Zhang, Shijian, He, W

Year:

2015

Language:

english

File:

PDF, 557 KB

english, 2015

77

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Design-Process-Technology Co-optimization for Manufacturability X - Rapid recipe formulation for plasma etching of new materials

Capodieci, Luigi, Cain, Jason P., Chopra, Meghali, Zhang, Zizhuo, Ekerdt, John, Bonnecaze, Roger T.

Year:

2016

Language:

english

File:

PDF, 617 KB

english, 2016

78

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Design-Process-Technology Co-optimization for Manufacturability X - Characterization of shallow trench isolation CMP process and its application

Capodieci, Luigi, Cain, Jason P., Li, Helen, Zhang, ChunLei, Liu, JinBing, Liu, ZhengFang, Chen, Kuang Han, Gbondo-Tugbawa, Tamba, Ding, Hua, Li, Flora, Lee, Brian, Gower-Hall, Aaron, Chiu, Yang-Chih

Year:

2016

Language:

english

File:

PDF, 2.36 MB

english, 2016

79

THE ANGIOTENSIN CONVERTING ENZYME D/D GENOTYPE IS ASSOCIATED WITH MECHANICAL VENTILATION IN WHITE CHILDREN WITH COMMUNITY ACQUIRED PNEUMONIA

O??Cain, Peggy, Dahmer, Mary, Prasad, Pallavi, Zhang, Qing, Smith, Melita, Krushkal, Julia, Quasney, Michael

Journal:

Pediatric Critical Care Medicine

Year:

2006

Language:

english

File:

PDF, 532 KB

english, 2006

80

Does endoscopy of difficult to catheterize channels spare some patients from formal open revision?

Casey, Jessica T., Zhang, Mimi, Hubert, Katherine C., Szymanski, Konrad M., Judge, Benjamin, Whittam, Benjamin, Kaefer, Martin, Misseri, Rosalia, Rink, Richard C., Cain, Mark P.

Journal:

Journal of Pediatric Urology

Year:

2016

Language:

english

File:

PDF, 282 KB

english, 2016

81

Histotripsy Thrombolysis on Retracted Clots

Zhang, Xi, Owens, Gabe E., Cain, Charles A., Gurm, Hitinder S., Macoskey, Jonathan, Xu, Zhen

Journal:

Ultrasound in Medicine & Biology

Year:

2016

Language:

english

File:

PDF, 2.89 MB

english, 2016

82

Effects of Temperature on the Histotripsy Intrinsic Threshold for Cavitation

Vlaisavljevich, Eli, Xu, Zhen, Maxwell, Adam, Mancia, Lauren, Zhang, Xi, Lin, Kuang-Wei, Duryea, Alexander, Sukovich, Jonathan, Hall, Tim, Johnsen, Eric, Cain, Charles

Journal:

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control

Year:

2016

Language:

english

File:

PDF, 1.14 MB

english, 2016

83

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Metrology, Inspection, and Process Control for Microlithography XXVIII - Metrology of white light interferometer for TSV processing

Cain, Jason P., Sanchez, Martha I., Timoney, Padraig, Ko, Yeong-Uk, Fisher, Daniel, Lu, Cheng Kuan, Ramnath, Yudesh, Vaid, Alok, Thangaraju, Sarasvathi, Smith, Daniel, Kamineni, Himani, Zhang, Dingyou

Year:

2014

Language:

english

File:

PDF, 546 KB

english, 2014

84

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - Characterization of photochemical filtration membranes in organic solvents by using sub-10nm fluorescent Cd-based QDs

Liu, Suwen, Zhang, Haizheng, Starikov, Alexander, Cain, Jason P.

Year:

2013

Language:

english

File:

PDF, 408 KB

english, 2013

85

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Across-wafer CD uniformity control through lithography and etch process: experimental verification

Zhang, Qiaolin, Archie, Chas N., Tang, Cherry, Cain, Jason, Hui, Angela, Hsieh, Tony, Maccrae, Nick, Singh, Bhanwar, Poolla, Kameshwar, Spanos, Costas J.

Year:

2007

Language:

english

File:

PDF, 8.08 MB

english, 2007

86

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Metrology, Inspection, and Process Control for Microlithography XXVIII - Optimizing hybrid metrology through a consistent multi-tool parameter set and uncertainty model

Cain, Jason P., Sanchez, Martha I., Silver, R. M., Barnes, B. M., Zhang, N. F., Zhou, H., Vladár, A., Villarrubia, J., Kline, J., Sunday, D., Vaid, A.

Year:

2014

Language:

english

File:

PDF, 888 KB

english, 2014

87

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Design-Process-Technology Co-optimization for Manufacturability X - Design technology co-optimization for 14/10nm metal1 double patterning layer

Capodieci, Luigi, Cain, Jason P., Duan, Yingli, Su, Xiaojing, Chen, Ying, Su, Yajuan, Shao, Feng, Zhang, Recco, Lei, Junjiang, Wei, Yayi

Year:

2016

Language:

english

File:

PDF, 984 KB

english, 2016

88

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - Measurement configuration optimization for grating reconstruction by Mueller matrix polarimetry

Chen, Xiuguo, Liu, Shiyuan, Zhang, Chuanwei, Jiang, Hao, Starikov, Alexander, Cain, Jason P.

Year:

2013

Language:

english

File:

PDF, 358 KB

english, 2013

89

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Design-Process-Technology Co-optimization for Manufacturability X - Using pattern analysis methods to do fast detection of manufacturing pattern failures

Capodieci, Luigi, Cain, Jason P., Zhao, Evan, Wang, Jessie, Sun, Mason, Wang, Jeff, Zhang, Yifan, Sweis, Jason, Lai, Ya-Chieh, Ding, Hua

Year:

2016

Language:

english

File:

PDF, 377 KB

english, 2016

90

SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Metrology, Inspection, and Process Control for Microlithography XVI - Optimum sampling for characterization of systematic variation in photolithography

Cain, Jason P., Zhang, Haolin, Spanos, Costas J., Herr, Daniel J. C.

Year:

2002

Language:

english

File:

PDF, 189 KB

english, 2002

91

ChemInform Abstract: Synthesis and Base-Induced Methylation Reactions of cis-7a-Hydroxy-3a- (phenylsulfenyl)-3a,4,5,6,7,7a-hexahydro-4-indanone.

CAINE, D., MCCLOSKEY, C. J., ATWOOD, J. L., BOTT, S. G., ZHANG, H.-M., VANDERVEER, D.

Journal:

Year:

1987

File:

PDF, 141 KB

1987

92

SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Metrology, Inspection, and Process Control for Microlithography XVI - Compact formulation of mask error factor for critical dimension control in optical lithography

Zhang, Haolin, Cain, Jason P., Spanos, Costas J., Herr, Daniel J. C.

Year:

2002

Language:

english

File:

PDF, 613 KB

english, 2002

93

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - Metrology solutions for high performance germanium multi-gate field-effect transistors using optical scatterometry

Chin, Hock-Chun, Ling, Moh-Lung, Liu, Bin, Zhang, Xingui, Li, Jie, Liu, Yongdong, Hu, Jiangtao, Yeo, Yee-Chia, Starikov, Alexander, Cain, Jason P.

Year:

2013

Language:

english

File:

PDF, 1.03 MB

english, 2013

94

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - Coherent diffractive imaging microscope with a tabletop high harmonic EUV source

Zhang, Bosheng, Seaberg, Matthew D., Adams, Daniel E., Gardner, Dennis F., Murnane, Margaret M., Kapteyn, Henry C., Starikov, Alexander, Cain, Jason P.

Year:

2013

Language:

english

File:

PDF, 586 KB

english, 2013

95

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Data Analysis and Modeling for Process Control III - Combined use of X-ray reflectometry and spectroscopic ellipsometry for characterization of thin film optical properties

Cain, Jason P., Emami, Iraj, Tobin, Jr., Kenneth W., Robie, Stephen, Zhang, Qiaolin, Singh, Bhanwar, Emami, Iraj

Year:

2006

Language:

english

File:

PDF, 487 KB

english, 2006

96

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Design-Process-Technology Co-optimization for Manufacturability X - Migrating from older to newer technology nodes and discovering the process weak-points

Capodieci, Luigi, Cain, Jason P., Zhuang, Linda, Pang, Jenny, Xu, Jessy, Tsai, MengFeng, Shi, Xue Long, Liu, Qing Wei, Yang, Ellyn, Zhang, Yifan, Sweis, Jason, Lai, Ya-Chieh, Ding, Hua

Year:

2016

Language:

english

File:

PDF, 2.40 MB

english, 2016

97

Balancing Efficacy and Safety of an Anti-DLL4 Antibody through Pharmacokinetic Modulation

Couch, J. A., Zhang, G., Beyer, J. C., de Zafra, C. L. Z., Gupta, P., Kamath, A. V., Lewin-Koh, N., Tarrant, J., Allamneni, K. P., Cain, G., Yee, S., Ross, S., Cook, R., Tsai, S. P., Ruppel, J., Ridgw

Journal:

Clinical Cancer Research

Year:

2016

Language:

english

File:

PDF, 1.95 MB

english, 2016

98

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Design-Process-Technology Co-optimization for Manufacturability X - Using pattern enumeration to accelerate process development and ramp yield

Capodieci, Luigi, Cain, Jason P., Zhuang, Linda, Pang, Jenny, Xu, Jessy, Tsai, Mengfeng, Wang, Amy, Zhang, Yifan, Sweis, Jason, Lai, Ya-Chieh, Ding, Hua

Year:

2016

Language:

english

File:

PDF, 542 KB

english, 2016

99

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Metrology, Inspection, and Process Control for Microlithography XXVIII - Novel in-line metrology methods for Fin pitch walking monitoring in 14nm node and beyond

Cain, Jason P., Sanchez, Martha I., Chao, Robin, Kohli, Kriti, Zhang, Yunlin, Madan, Anita, Muthinti, G. Raja, Hong, Augustin J., Conklin, David, Holt, Judson, Bailey, Todd C.

Year:

2014

Language:

english

File:

PDF, 617 KB

english, 2014

100

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Metrology, Inspection, and Process Control for Microlithography XXVIII - Quantitative tabletop coherent diffraction imaging microscope for EUV lithography mask inspection

Cain, Jason P., Sanchez, Martha I., Zhang, Bosheng, Adams, Daniel E., Seaberg, Matthew D., Gardner, Dennis F., Shanblatt, Elisabeth R., Kapteyn, Henry, Murnane, Margaret

Year:

2014

Language:

english

File:

PDF, 1.43 MB

english, 2014